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Assignee profile:

HITACHI SCIENCE SYSTEMS, LTD.

City:

Ibaraki

Country:

Japan

Published Applications:

Last publication date:

2010-08-31

Patent Grants:

Last grant date:

2010-08-31

Top Inventors for applications by HITACHI SCIENCE SYSTEMS, LTD.

These are the the leading inventors for applications assigned to HITACHI SCIENCE SYSTEMS, LTD.:

Isao Nagaoki 3 Hitachinaka, Japan
Shunsuke Koshihara 3 Hitachinaka, Japan
Yayoi Hosoya 3 Mito, Japan
Ryuichirou Tamochi 3 Hitachinaka, Japan

Eiko NAKAZAWA 3 Mito, Japan
Hidetoshi Morokuma 3 Hitachinaka, Japan
Yoshinori Nakada 3 Hitachinaka, Japan
Hiroshi Miyai 2 Hitachi, Japan

Takehiko Konno 2 Mito, Japan
Katsuaki Takahashi 2 Hitachinaka, Japan
Masaharu Nishida 2 Hitachinaka, Japan
Hisayuki Takasu 2 Higashiibaraki, Japan

Hiroshi Ohga 2 Ohmiya, Japan
Kouichi Miyazawa 2 Mito, Japan
Toru Iwaya 2 Hitachiota, Japan
Mitsuo Hattori 1 Hitachinaka, Japan

Akimitsu Okura 1 Hitachinaka, Japan
Yoshifumi Taniguchi 1 Hitachinaka, Japan
Tetsuya Isobe 1 Hitachinaka, Japan
Toshie Yaguchi 1 Higashiibaraki, Japan

Junichi KATANE 1 Naka, Japan
Tsuyoshi Morimoto 1 Hitachinaka, Japan
Isao Yamazaki 1 Ryugasaki, Japan
Sukehiro ITO 1 Hitachinaka, Japan

Takeshi SATO 1 Hitachinaka, Japan
Katsuhiro Sasada 1 Hitachinaka, Japan
Yuuki Ojima 1 Hitachinaka, Japan
Takahiro Kikuchi 1 Ohmiya, Japan

Masashi Kimura 1 Tokai-mura, Japan
Yoshihiko Nakayama 1 Hitachinaka, Japan
Kenichi Hirane 1 Hitachi, Japan
Masami Hayashi 1 Naka, Japan

Kazuhiro Ueda 1 Hitachinaka, Japan
Tomonori MIMURA 1 Tomobe, Japan
Takeo Kamino 1 Hitachinaka, Japan

Recent patent applications by HITACHI SCIENCE SYSTEMS, LTD.

HITACHI SCIENCE SYSTEMS, LTD. based in Ibaraki, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2010-08-31 ✅ Patent 7,788,108 granted on 2010-08-31

US10716474

Cross-contamination prevention system and automatic analyzer which equip for it

#2 | 2010-06-01 ✅ Patent 7,727,469 granted on 2010-06-01

US10822663

Automatic analyzer

#3 | 2009-12-01 ✅ Patent 7,625,524 granted on 2009-12-01

US10676020

Automatic analyzer

#4 | 2008-02-21 ✅ Patent 7,995,833 granted on 2011-08-09

US20080042061A1

Electricity

Method of alignment for efficient defect review

#5 | 2007-11-13 ✅ Patent 7,294,833 granted on 2007-11-13

US10847885

Method of alignment for efficient defect review

#6 | 2006-06-29 ✅ Patent 7,179,000 granted on 2007-02-20

US20060140624A1

Physics

Method of developing a resist film and a resist development processor

#7 | 2006-05-30 ✅ Patent 7,053,371 granted on 2006-05-30

US10779848

Scanning electron microscope with measurement function

#8 | 2006-05-18 ✅ Patent 7,217,925 granted on 2007-05-15

US20060102840A1

Electricity

Scanning electron microscope

#9 | 2006-04-25 ✅ Patent 7,033,089 granted on 2006-04-25

US10705845

Method of developing a resist film and a resist development processor

#10 | 2006-01-31 ✅ Patent 6,992,286 granted on 2006-01-31

US10792781

Material characterization system

#11 | 2006-01-19 ✅ Patent 7,214,938 granted on 2007-05-08

US20060011838A1

Physics

Sample observation method and transmission electron microscope

#12 | 2006-01-03 ✅ Patent 6,982,420 granted on 2006-01-03

US10720251

Sample observation method and transmission electron microscope

#13 | 2005-09-27 ✅ Patent 6,949,752 granted on 2005-09-27

US10295951

Electron beam apparatus and high-voltage discharge prevention method

#14 | 2005-08-18 ✅ Patent 7,009,178 granted on 2006-03-07

US20050178965A1

Electricity

Scanning electron microscope

#15 | 2005-06-16 ✅ Patent 7,154,089 granted on 2006-12-26

US20050127294A1

Electricity

Scanning electron microscope

#16 | 2005-05-24 ✅ Patent 6,897,445 granted on 2005-05-24

US10704821

Scanning electron microscope

#17 | 2005-04-05 ✅ Patent 6,875,983 granted on 2005-04-05

US10098774

Electron microscope and means to set observation conditions

#18 | 2005-03-03 ✅ Patent 7,547,414 granted on 2009-06-16

US20050047964A1

Physics

Automatic analyzer

AssigneeID:

260895 ⎘