🔗 Permalink

Assignee profile:

OHT INC.

City:

HIROSHIMA

Country:

Japan

Published Applications:

Last publication date:

2022-01-13

Patent Grants:

Last grant date:

2023-05-30

Top Inventors for applications by OHT INC.

These are the the leading inventors for applications assigned to OHT INC.:

Shuji Yamaoka 12 Hiroshima, Japan
Shogo Ishioka 7 Hiroshima, Japan
Shuji Yamaoka 6 Fukuyama, Japan
Shogo Ishioka 4 Fukayasu-gun, Japan

Yuji Odan 3 Hiroshima, Japan
Toshiro Yasuda 2 Fukuyama, Japan
Shigetoshi Sugawa 2 Sendai-shi, Japan
Mishio Hayashi 2 Saitama, Japan

Tetsuya Goto 2 Sendai, Japan
Shigetoshi Sugawa 2 Sendai, Japan
Akira Nurioka 2 Fukuyama, Japan
Rihito Kuroda 2 Sendai, Japan

Akira Nurioka 2 Hiroshima, Japan
Rihito Kuroda 2 Sendai-shi, Japan
Tetsuya Goto 2 Sendai-shi, Japan
Toshiro YASUDA 2 Fukuyama-shi, Japan

Yoshikazu Taniguchi 1 Yokkaichi, Japan
Hiroshi Hamori 1 Hiroshima, Japan
Shinichi Murakami 1 Fukuyama, Japan
Mikiya Kasai 1 Hiroshima, Japan

Masataka Nakamura 1 Hiroshima, Japan
Tatuhisa Fujii 1 Fukuyama, Japan
Tatsuhisa Fujii 1 Hiroshima, Japan
Hideo Onishi 1 Mie, Japan

Shinichi MURAKAMI 1 Fukuyama-shi, Japan
Shuji Yamaoka 1 Fukuyama-shi, Japan
Kazutoshi KAMIBAYASHI 1 Fukuyama-shi, Japan
Hideo Onishi 1 Yokkaichi, Japan

Yuichiro Aomori 1 Hiroshima, Japan
Takayuki Genba 1 Hiroshima, Japan
Kazuhiro Monden 1 Hiroshima, Japan
Hiroshi HAMORI 1 Fukuyama-shi, Japan

Hiroshi Hamori 1 Fukuyama, Japan
Yoshikazu Taniguchi 1 Mie, Japan
Kazutoshi Kamibayashi 1 Fukuyama, Japan

Recent patent applications by OHT INC.

OHT INC. based in HIROSHIMA, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2022-01-13 ✅ Patent 11,662,328 granted on 2023-05-30

US20220011255A1

Physics

Capacitive sensor and manufacturing method of capacitive sensor

#2 | 2021-09-23 ✅ Patent 11,567,114 granted on 2023-01-31

US20210293866A1

Physics

Capacitance detection area sensor and conductive pattern sensing apparatus having capacitance detection area sensor

#3 | 2007-08-09 ✅ Patent 7,495,452 granted on 2009-02-24

US20070184686A1

Physics

Wire harness checker and wire harness checking method

#4 | 2007-07-03 ✅ Patent 7,239,127 granted on 2007-07-03

US10636617

Apparatus and method for inspecting electronic circuits

#5 | 2007-02-06 ✅ Patent 7,173,445 granted on 2007-02-06

US10487828

Sensor for inspection instrument and inspection instrument

#6 | 2006-11-21 ✅ Patent 7,138,805 granted on 2006-11-21

US10069523

Device and method for inspection

#7 | 2006-10-12 ✅ Patent 7,332,914 granted on 2008-02-19

US20060226851A1

Physics

Conductor inspection apparatus and conductor inspection method

#8 | 2006-04-11 ✅ Patent 7,026,870 granted on 2006-04-11

US10482125

Low-noise active RC signal processing circuit

#9 | 2006-03-16 ✅ Patent 7,088,107 granted on 2006-08-08

US20060055413A1

Physics

Circuit pattern inspection instrument and pattern inspection method

#10 | 2006-02-07 ✅ Patent 6,995,566 granted on 2006-02-07

US10478351

Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium

#11 | 2006-01-31 ✅ Patent 6,992,493 granted on 2006-01-31

US10478496

Device and method for substrate displacement detection

#12 | 2005-12-06 ✅ Patent 6,972,573 granted on 2005-12-06

US10069522

Device and method for inspecting circuit board

#13 | 2005-11-22 ✅ Patent 6,967,498 granted on 2005-11-22

US10636751

Apparatus and method for inspecting electronic circuits

#14 | 2005-10-25 ✅ Patent 6,958,619 granted on 2005-10-25

US10169749

Inspecting apparatus and inspecting method for circuit board

#15 | 2005-10-04 ✅ Patent 6,952,104 granted on 2005-10-04

US10461875

Inspection method and apparatus for testing fine pitch traces

#16 | 2005-09-13 ✅ Patent 6,943,559 granted on 2005-09-13

US10480106

Circuit pattern inspection device, circuit pattern inspection method, and recording medium

#17 | 2005-08-23 ✅ Patent 6,933,740 granted on 2005-08-23

US10632821

Electronic circuit inspection sensor and inspection system using same

#18 | 2005-02-22 ✅ Patent 6,859,062 granted on 2005-02-22

US10069520

Apparatus and method for inspecting a board used in a liquid crystal panel

#19 | 2005-02-17 ✅ Patent 6,947,853 granted on 2005-09-20

US20050038613A1

Physics

Apparatus and method for inspecting electrical continuity of circuit board, jig for use therein, and recording medium thereon

Also check out OHT inc.'s (Hiroshima, Japan) applicant profile with 1 patent applications submitted.

AssigneeID:

283292 ⎘