Shanghai
China
59
2026-03-26
41
2025-11-18
These are the the leading inventors for applications assigned to Zing Semiconductor Corporation:
Zing Semiconductor Corporation based in Shanghai, CN has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
CRYSTAL GROWING APPARATUS AND RF-SOI SUBSTRATE
#2 | 2025-04-03METHOD AND APPARATUS FOR DIAMETER MEASUREMENT OF CZOCHRALSKI MONOCRYSTALLINE SILICON, AND DEVICE FOR GROWING CZOCHRALSKI MONOCRYSTALLINE SILICON
#3 | 2024-11-21STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CHARGE CAPTURE LAYER AND MANUFACTURE THEREOF
#4 | 2024-11-21STRUCTURE OF HIGH-RESISTIVITY SILICON-ON-INSULATOR EMBEDDED WITH CHARGE CAPTURE LAYER AND MANUFACTURE THEREOF
#5 | 2024-07-04CRYSTAL GROWING METHOD, APPARATUS AND RF-SOI SUBSTRATE
#6 | 2024-07-04METHOD, APPARATUS, SYSTEM AND COMPUTER STORAGE MEDIUM OF CONTROLLING CRYSTAL GROWTH
#7 | 2024-06-13EPITAXY SUSCEPTOR, EPITAXY GROWTH APPARATUS AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
#8 | 2024-06-06 ✅ Patent 12,474,277 granted on 2025-11-18METHOD FOR DETERMINING TYPES OF DEFECTS IN MONOCRYSTALLINE SILICON WAFER
#9 | 2024-03-21SOI WAFER
#10 | 2024-02-29 ✅ Patent 12,046,520 granted on 2024-07-23Method for detecting temperature of thermal chamber
#11 | 2023-10-12STANDARD WAFERS, METHOD OF MAKING THE SAME AND CALIBRATION METHOD
#12 | 2023-10-12METHOD OF GROWING A SINGLE-CRYSTAL SILICON
#13 | 2023-06-08SEMICONDUCTOR SUBSTRATE AND MANUFACTURE THEREOF
#14 | 2023-05-04SURFACE TREATMENT OF SOI WAFER
#15 | 2023-05-04SOI WAFER AND METHOD OF FINAL PROCESSING THE SAME
#16 | 2023-05-04PROCESS OF SURFACE TREATMENT OF SOI WAFER
#17 | 2023-05-04SOI STRUCTURED SEMICONDUCTOR SILICON WAFER AND METHOD OF MAKING THE SAME
#18 | 2023-02-09 ✅ Patent 12,334,403 granted on 2025-06-17MEASURING METHOD OF RESISTIVITY OF A WAFER
#19 | 2023-02-09 ✅ Patent 12,400,917 granted on 2025-08-26METHOD FOR VERIFICATION OF CONDUCTIVITY TYPE OF SILICON WAFER
#20 | 2022-10-20 ✅ Patent 12,398,485 granted on 2025-08-26METHOD OF DETECTING CRYSTALLOGRAPHIC DEFECTS AND METHOD OF GROWING AN INGOT
#21 | 2022-09-15 ✅ Patent 12,092,588 granted on 2024-09-17Method for characterizing defects in silicon crystal
#22 | 2022-07-07 ✅ Patent 12,000,060 granted on 2024-06-04Semiconductor crystal growth method and device
#23 | 2022-06-30 ✅ Patent 12,107,016 granted on 2024-10-01Detection method of metal impurity in wafer
#24 | 2022-06-30CRYSTAL GROWTH METHOD AND CRYSTAL GROWTH APPARATUS
#25 | 2022-06-09 ✅ Patent 11,393,712 granted on 2022-07-19Silicon on insulator structure and method of making the same
#26 | 2022-06-09 ✅ Patent 11,443,941 granted on 2022-09-13Silicon on insulator structure and method of making the same
#27 | 2022-05-26 ✅ Patent 11,662,326 granted on 2023-05-30Method for calculating liquid-solid interface morphology during growth of ingot
#28 | 2022-05-05 ✅ Patent 11,401,626 granted on 2022-08-02Seeding method for crystal growth
#29 | 2022-05-05 ✅ Patent 11,624,123 granted on 2023-04-11Method and apparatus of monocrystal growth
#30 | 2022-04-14 ✅ Patent 11,923,254 granted on 2024-03-05Method for detecting temperature of thermal chamber
#31 | 2022-03-31METHOD AND DEVICE OF CHEMICAL MECHANICAL POLISHING
#32 | 2022-01-27PROCESS FOR PREPARING EPITAXY WAFER AND EPITAXY WAFER THEREFROM
#33 | 2022-01-13 ✅ Patent 11,427,925 granted on 2022-08-30Apparatus and method for ingot growth
#34 | 2022-01-13 ✅ Patent 11,471,997 granted on 2022-10-18Polishing pad, polishing apparatus and a method for polishing silicon wafer
#35 | 2022-01-06 ✅ Patent 11,352,713 granted on 2022-06-07Heat shield structure for single crystal production furnace and single crystal production furnace
#36 | 2021-10-28 ✅ Patent 11,562,917 granted on 2023-01-24Wafer positioning method and a semiconductor manufacturing apparatus
#37 | 2021-01-14 ✅ Patent 11,479,874 granted on 2022-10-25Semiconductor crystal growth apparatus
#38 | 2018-04-26 ✅ Patent 10,553,496 granted on 2020-02-04Complementary metal-oxide-semiconductor field-effect transistor and method thereof
#39 | 2018-02-22 ✅ Patent 9,972,637 granted on 2018-05-15Metal-ono-vacuum tube charge trap flash (VTCTF) nonvolatile memory and the method for making the same
#40 | 2017-09-07 ✅ Patent 9,773,891 granted on 2017-09-26FinFET and fabrication method thereof
#41 | 2017-09-07 ✅ Patent 10,014,210 granted on 2018-07-03SOI substrate and manufacturing method thereof
#42 | 2017-09-07 ✅ Patent 9,793,285 granted on 2017-10-17Metal-ono-vacuum tube charge trap flash (VTCTF) nonvolatile memory and the method for making the same
#43 | 2017-09-07 ✅ Patent 9,972,543 granted on 2018-05-15Complementary nanowire semiconductor device and fabrication method thereof
#44 | 2017-09-07 ✅ Patent 9,779,999 granted on 2017-10-03Complementary nanowire semiconductor device and fabrication method thereof
#45 | 2017-09-07 ✅ Patent 10,170,356 granted on 2019-01-01SOI substrate and manufacturing method thereof
#46 | 2017-09-07 ✅ Patent 9,793,138 granted on 2017-10-17Thermal processing method for wafer
#47 | 2017-09-07 ✅ Patent 9,779,964 granted on 2017-10-03Thermal processing method for wafer
#48 | 2017-09-07 ✅ Patent 9,834,861 granted on 2017-12-05Method for growing monocrystalline silicon and monocrystalline silicon ingot prepared thereof
#49 | 2017-09-07 ✅ Patent 10,100,431 granted on 2018-10-16Method for growing monocrystalline silicon and monocrystalline silicon ingot prepared thereof
#50 | 2017-08-01 ✅ Patent 9,721,846 granted on 2017-08-01Hybrid integration fabrication of nanowire gate-all-around GE PFET and polygonal III-V PFET CMOS device
#51 | 2017-06-22 ✅ Patent 9,837,517 granted on 2017-12-05Method for making III-V nanowire quantum well transistor
#52 | 2017-05-11 ✅ Patent 9,634,151 granted on 2017-04-25High voltage junctionless field effect device and its method of fabrication
#53 | 2017-05-11 ✅ Patent 9,818,844 granted on 2017-11-14High-voltage junctionless device with drift region and the method for making the same
#54 | 2017-05-09 ✅ Patent 9,647,067 granted on 2017-05-09FinFET and fabrication method thereof
#55 | 2017-04-27 ✅ Patent 9,647,107 granted on 2017-05-09Fabrication method for forming vertical transistor on hemispherical or polygonal patterned semiconductor substrate
#56 | 2017-04-27 ✅ Patent 9,634,133 granted on 2017-04-25Method of forming fin structure on patterned substrate that includes depositing quantum well layer over fin structure
#57 | 2017-04-27 ✅ Patent 9,773,670 granted on 2017-09-26Method of preparation of III-V compound layer on large area Si insulating substrate
#58 | 2017-04-20 ✅ Patent 9,640,615 granted on 2017-05-02Method for making III-V nanowire quantum well transistor
#59 | 2017-04-20 ✅ Patent 9,875,943 granted on 2018-01-23Complementary metal-oxide-semiconductor field-effect transistor and method thereof
Also check out Zing Semiconductor Corporation's (Shanghai, China) applicant profile with 49 patent applications submitted.
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