Nes-zionna
Israel
16
2013-08-01
15
2014-10-28
These are the the leading inventors for applications assigned to OptimalTest, Ltd.:
OptimalTest, Ltd. based in Nes-zionna, IL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Systems and methods for test time outlier detection and correction in integrated circuit testing
#2 | 2012-05-17 ✅ Patent 8,838,408 granted on 2014-09-16Misalignment indication decision system and method
#3 | 2012-05-03METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENARIO LANGUAGE
#4 | 2011-10-13 ✅ Patent 8,781,773 granted on 2014-07-15System and methods for parametric testing
#5 | 2011-09-15 ✅ Patent 8,421,494 granted on 2013-04-16Systems and methods for test time outlier detection and correction in integrated circuit testing
#6 | 2011-01-06 ✅ Patent 10,118,200 granted on 2018-11-06System and method for binning at final test
#7 | 2010-06-24 ✅ Patent 8,112,249 granted on 2012-02-07System and methods for parametric test time reduction
#8 | 2009-10-22 ✅ Patent 8,069,130 granted on 2011-11-29Methods and systems for semiconductor testing using a testing scenario language
#9 | 2009-07-30 ✅ Patent 7,969,174 granted on 2011-06-28Systems and methods for test time outlier detection and correction in integrated circuit testing
#10 | 2009-05-07 ✅ Patent 7,737,716 granted on 2010-06-15Methods and systems for semiconductor testing using reference dice
#11 | 2009-05-07 ✅ Patent 7,777,515 granted on 2010-08-17Methods and systems for semiconductor testing using reference dice
#12 | 2009-04-30 ✅ Patent 7,679,392 granted on 2010-03-16Methods and systems for semiconductor testing using reference dice
#13 | 2008-01-10 ✅ Patent 7,532,024 granted on 2009-05-12Methods and systems for semiconductor testing using reference dice
#14 | 2007-10-04 ✅ Patent 7,567,947 granted on 2009-07-28Methods and systems for semiconductor testing using a testing scenario language
#15 | 2007-01-11 ✅ Patent 7,208,969 granted on 2007-04-24Optimize parallel testing
#16 | 2006-11-30 ✅ Patent 7,340,359 granted on 2008-03-04Augmenting semiconductor's devices quality and reliability
Also check out OptimalTest, Ltd.'s (Nes-zionna, Israel) applicant profile with 1 patent applications submitted.
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