Assignee profile:

TECHNOPROBE S.P.A.

City:

Cernusco Lombardone (LC)

Country:

Italy

Published Applications:

15

Last publication date:

2025-10-30

Patent Grants:

6

Last grant date:

2025-10-28

Top Inventors for applications by TECHNOPROBE S.P.A.

These are the the leading inventors for applications assigned to TECHNOPROBE S.P.A.:

Recent patent applications by TECHNOPROBE S.P.A.

TECHNOPROBE S.P.A. based in Cernusco Lombardone (LC), IT has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2025-10-30
US20250334610A1
Physics

PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES AND CORRESPONDING SPACE TRANSFORMER

#2 | 2025-02-13
US20250052783A1
Physics

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDING PROBE HEAD

#3 | 2024-02-08
US20240044940A1
Physics

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

#4 | 2024-01-25
US20240027495A1
Physics

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDING PROBE HEAD

#5 | 2024-01-11
US20240012028A1
Physics

LARGE PROBE CARD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFACTURING METHOD

#6 | 2024-01-11
US20240012027A1
Physics

PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND METALLIZED GUIDE HOLES

#7 | 2024-01-11 ✅ Patent 12,455,299 granted on 2025-10-28
US20240012025A1
Physics

IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENCY ELECTRONIC DEVICES AND RELATING PROBE HEAD

#8 | 2023-12-28
US20230417798A1
Physics

LARGE PROBE HEAD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFACTURING METHOD

#9 | 2023-12-21 ✅ Patent 12,292,457 granted on 2025-05-06
US20230408548A1
Physics

Flexible membrane adapted to carry high-frequency (RF) power signals and corresponding probe card for the high-frequency (RF) power test of electronic devices

#10 | 2023-10-05 ✅ Patent 12,259,407 granted on 2025-03-25
US20230314476A1
Physics

Contact probe for probe heads of electronic devices

#11 | 2023-09-28
US20230305054A1
Physics

PROBE HEAD FOR TESTING ELECTRONIC DEVICES COMPRISING INTEGRATED OPTICAL ELEMENTS

#12 | 2023-09-14
US20230288447A1
Physics

CONTACT PROBE FOR A PROBE HEAD

#13 | 2023-01-26 ✅ Patent 12,105,118 granted on 2024-10-01
US20230029150A1
Physics

Testing head with an improved contact between contact probes and guide holes

#14 | 2023-01-26 ✅ Patent 12,044,703 granted on 2024-07-23
US20230028352A1
Physics

Contact probe for high-frequency applications with improved current capacity

#15 | 2023-01-19 ✅ Patent 11,953,522 granted on 2024-04-09
US20230021227A1
Physics

Probe head for reduced-pitch applications

Also check out TECHNOPROBE S.P.A.'s (Cernusco Lombardone (LC), Italy) applicant profile with 2 patent applications submitted.

AssigneeID:

333128 ⎘