Patents-Review.com
🔗 Permalink
Assignee profile:

SNU PRECISION CO., LTD

City:

Seoul

Country:

South Korea

Published Applications:

19

Last publication date:

2015-05-14

Patent Grants:

10

Last grant date:

2015-09-29

Top Inventors for applications by SNU PRECISION CO., LTD

These are the the leading inventors for applications assigned to SNU PRECISION CO., LTD:

Recent patent applications by SNU PRECISION CO., LTD

SNU PRECISION CO., LTD based in Seoul, KR has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2015-05-14
US20150129420A1
Electricity

Substrate Processing System with a Damage Preventing Function

 #2 | 2014-05-29
US20140144383A1
Chemistry; metallurgy

VACUUM DEPOSITION APPARATUS

 #3 | 2014-03-27 ✅ Patent 9,148,549 granted on 2015-09-29
US20140085454A1
Electricity

Image processing method and image processing apparatus using time axis low band pass filter

 #4 | 2014-02-06 ✅ Patent 8,873,067 granted on 2014-10-28
US20140036273A1
Physics

Interferometer for TSV measurement and measurement method using same

 #5 | 2013-06-27
US20130161416A1
Chemistry; metallurgy

Source Material Supplying Unit For Thin Film Depositing Apparatus

 #6 | 2013-01-10
US20130011804A1
Chemistry; metallurgy

Vaporization Apparatus and Method for Controlling the Same

 #7 | 2012-04-19
US20120090546A1
Electricity

SOURCE SUPPLYING UNIT, METHOD FOR SUPPLYING SOURCE, AND THIN FILM DEPOSITING APPARATUS

 #8 | 2011-11-17
US20110279670A1
Physics

Apparatus for Measuring Three-Dimensional Profile Using LCD

 #9 | 2011-08-04 ✅ Patent 8,947,673 granted on 2015-02-03
US20110188048A1
Physics

Estimating thickness based on number of peaks between two peaks in scanning white light interferometry

 #10 | 2011-02-24 ✅ Patent 8,223,326 granted on 2012-07-17
US20110043794A1
Physics

Dark-field examination device

 #11 | 2011-01-20
US20110013015A1
Physics

VISION INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME

 #12 | 2011-01-06 ✅ Patent 8,199,332 granted on 2012-06-12
US20110001988A1
Physics

Apparatus for measuring thickness

 #13 | 2010-11-04 ✅ Patent 8,279,447 granted on 2012-10-02
US20100277745A1
Physics

Method for measuring thickness

 #14 | 2010-06-17 ✅ Patent 8,416,293 granted on 2013-04-09
US20100149326A1
Electricity

Plasma monitoring device and method

 #15 | 2010-02-04
US20100029019A1
Physics

DETECTING MATERIALS ON WAFER AND REPAIR SYSTEM AND METHOD THEREOF

 #16 | 2010-01-14
US20100006549A1
Performing operations; transporting

DEVICE FOR PROCESSING MATERIALS BY LASER BEAM

 #17 | 2009-12-24 ✅ Patent 9,046,716 granted on 2015-06-02
US20090318051A1
Physics

Device for supporting substrate and examiner for seal pattern of LCD cell using the same

 #18 | 2009-04-02 ✅ Patent 8,116,555 granted on 2012-02-14
US20090087080A1
Physics

Vision inspection system and method for inspecting workpiece using the same

 #19 | 2005-01-06 ✅ Patent 7,308,130 granted on 2007-12-11
US20050000051A1
Physics

Method for inspecting input shaft of power steering system

Also check out SNU Precision Co., Ltd.'s (Seoul, South Korea) applicant profile with 1 patent applications submitted.

AssigneeID:

3478 ⎘