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Inventor profile of:

Souk KIM

City:

Seoul

Country:

South Korea

Published Applications:

17

Last publication date:

2026-06-11

Top Assignees for applications by Souk KIM

The entities that hold a legal rights for patent applications filed by inventor KIM Souk:

SAMSUNG ELECTRONICS CO., LTD. 9 Suwon-si, South Korea
SAMSUNG ELECTRONICS CO., LTD. 4 Gyeonggi-Do, South Korea
Korea Advanced Institute of Science and Technology 3 Daejeon, South Korea
Samsung Electronics Co., Ltd 2 , South Korea
Samsung Electronics Co.,Ltd. 1 Suwon-si, South Korea
UMECHA CO., LTD. 1 Siheung-si, South Korea
Samsung Electronics Co., Ltd. 1 Yeongtong-Gu, Suwon-si, Gyeonggi-Do, South Korea
Samsung Electronics Co., Ltd. 1 Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea
UMECHA CO., Ltd. 1 Gyeonggi-do, South Korea
SNU PRECISION CO., LTD. 1 Chungcheongnam-do, South Korea
SNU PRECISION CO., LTD 1 Seoul, South Korea

Recent patent applications by KIM Souk

Souk KIM from Seoul, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-06-11

US20260162931A1

METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME

#2 | 2025-11-06

US20250341540A1

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#3 | 2024-11-21

US20240385220A1

TEST APPARATUS AND TEST METHOD THEREOF

#4 | 2023-06-22

US20230194567A1

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#5 | 2023-05-18

US20230154804A1

SPECTROSCOPIC DEVICE, SPECTROSCOPIC METHOD USING THE SAME, AND METHOD OF FABRICATING SEMICONDUCTOR MEMORY DEVICE USING THE SAME

#6 | 2023-05-11

US20230140892A1

METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME

#7 | 2023-03-16

US20230079008A1

Mechanical engineering

Vibration isolation table for semiconductor equipment and vibration isolation table system including the same

#8 | 2022-12-22

US20220404395A1

Test apparatus and test method thereof

#9 | 2020-06-18

US20200194317A1

Methods of manufacturing semiconductor device

#10 | 2020-06-11

US20200184618A1

Semiconductor pattern detecting apparatus

#11 | 2020-06-11

US20200182783A1

MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME

#12 | 2020-06-04

US20200176292A1

Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same

#13 | 2019-06-13

US20190181062A1

Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement

#14 | 2016-10-06

US20160293379A1

Method of inspecting wafer using electron beam

#15 | 2016-03-03

US20160061583A1

Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film

#16 | 2016-01-28

US20160027707A1

Method of manufacturing a semiconductor device using semiconductor measurement system

#17 | 2014-03-27

US20140085454A1

Image processing method and image processing apparatus using time axis low band pass filter

InventorID:

701592 ⎘