Migdal HaEmek
Israel
17
2024-10-31
17
2025-06-24
These are the the leading inventors for applications assigned to BRUKER TECHNOLOGIES LTD.:
BRUKER TECHNOLOGIES LTD. based in Migdal HaEmek, IL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
X-Ray diffraction imaging detector having multiple angled input faces
#2 | 2024-03-07 ✅ Patent 12,078,604 granted on 2024-09-03Monitoring properties of X-ray beam during X-ray analysis
#3 | 2024-03-07 ✅ Patent 12,085,521 granted on 2024-09-10Small-angle X-ray scatterometry
#4 | 2024-01-25 ✅ Patent 12,535,438 granted on 2026-01-27Analysis of X-ray Scatterometry Data using Deep Learning
#5 | 2023-10-05 ✅ Patent 12,249,059 granted on 2025-03-11Navigation accuracy using camera coupled with detector assembly
#6 | 2023-03-09 ✅ Patent 11,781,999 granted on 2023-10-10Spot-size control in reflection-based and scatterometry-based X-ray metrology systems
#7 | 2022-02-10 ✅ Patent 11,703,464 granted on 2023-07-18Small-angle x-ray scatterometry
#8 | 2021-11-04 ✅ Patent 11,761,913 granted on 2023-09-19Transmission X-ray critical dimension (T-XCD) characterization of shift and tilt of stacks of high-aspect-ratio (HAR) structures
#9 | 2021-09-16 ✅ Patent 11,181,490 granted on 2021-11-23Small-angle x-ray scatterometry
#10 | 2020-05-28 ✅ Patent 11,302,508 granted on 2022-04-12X-ray tube
#11 | 2019-11-07 ✅ Patent 11,169,099 granted on 2021-11-09Method and apparatus for X-ray scatterometry
#12 | 2019-10-24 ✅ Patent 10,976,269 granted on 2021-04-13Wafer alignment for small-angle x-ray scatterometry
#13 | 2019-10-24 ✅ Patent 10,976,268 granted on 2021-04-13X-ray source optics for small-angle X-ray scatterometry
#14 | 2019-10-24 ✅ Patent 10,976,270 granted on 2021-04-13X-ray detection optics for small-angle X-ray scatterometry
#15 | 2019-10-17 ✅ Patent 10,816,487 granted on 2020-10-27Image contrast in X-ray topography imaging for defect inspection
#16 | 2018-12-06 ✅ Patent 10,634,628 granted on 2020-04-28X-ray fluorescence apparatus for contamination monitoring
#17 | 2017-07-13 ✅ Patent 10,684,238 granted on 2020-06-16Method and apparatus for X-ray scatterometry
Also check out BRUKER TECHNOLOGIES LTD.'s (Migdal Haemek, Israel) applicant profile with 13 patent applications submitted.
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