Haifa
Israel
18
2025-11-20
The entities that hold a legal rights for patent applications filed by inventor Krokhmal Alexander:
Alexander Krokhmal from Haifa, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
Analysis of Low-energy X-ray Fluorescence Emitted from Sample in Atmospheric Environment
#2 | 2025-05-15Navigation accuracy using imaging assembly coupled with detector assemblies
#3 | 2024-11-14Small-Angle X-Ray Scatterometry
#4 | 2024-03-07Monitoring properties of X-ray beam during X-ray analysis
#5 | 2024-03-07Small-angle X-ray scatterometry
#6 | 2023-10-05Navigation accuracy using camera coupled with detector assembly
#7 | 2023-03-09Spot-size control in reflection-based and scatterometry-based X-ray metrology systems
#8 | 2022-02-10Small-angle x-ray scatterometry
#9 | 2021-09-16Small-angle x-ray scatterometry
#10 | 2020-05-28X-ray tube
#11 | 2019-10-24Wafer alignment for small-angle x-ray scatterometry
#12 | 2019-10-24X-ray source optics for small-angle X-ray scatterometry
#13 | 2019-10-24X-ray detection optics for small-angle X-ray scatterometry
#14 | 2012-06-07Fast measurement of X-ray diffraction from tilted layers
#15 | 2009-03-12X-ray measurement of properties of nano-particles
#16 | 2007-12-13Target alignment for X-ray scattering measurements
#17 | 2007-03-15Multi-detector EDXRD
#18 | 2006-03-23Multifunction X-ray analysis system
2746536 ⎘