Chapman Instruments, Inc.

City:

Rochester, New York

Country:

United States

Published Applications:

Last publication date:

2006-08-17

Patent Grants:

Last grant date:

2007-10-16

Top Inventors for applications by Chapman Instruments, Inc.

These are the the leading inventors for applications assigned to Chapman Instruments, Inc.:

Shu W. Wang 2 Rochester, NY United States
John E. Stephan 1 Rochester, NY United States
Thomas C. Bristow 1 Rochester, NY United States
Thomas Bristow 1 Rochester, NY United States

Recent patent applications by Chapman Instruments, Inc.

Chapman Instruments, Inc. based in Rochester, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2006-08-17 ✅ Patent 7,283,256 granted on 2007-10-16

US20060181715A1

Physics

Method and apparatus for measuring wafer thickness

#2 | 2006-03-23 ✅ Patent 7,280,232 granted on 2007-10-09

US20060061775A1

Physics

Method and apparatus for measuring wafer thickness

AssigneeID:

399771 ⎘