John E. Stephan

City:

Rochester, New York

Country:

United States

Published Applications:

Last publication date:

2006-08-17

Top Assignees for applications by John E. Stephan

The entities that hold a legal rights for patent applications filed by inventor Stephan John E.:

John E. Stephan from Rochester, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Method and apparatus for measuring wafer thickness

InventorID:

4683998 ⎘