Waltham, Massachusetts
United States
36
2014-12-04
36
2016-03-08
These are the the leading inventors for applications assigned to OLYMPUS NDT:
OLYMPUS NDT based in Waltham, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Monitoring temperature variation in wedge of phased-array probe for weld inspection
#2 | 2014-11-20 ✅ Patent 9,453,823 granted on 2016-09-27Apparatus for and a method of improved timing control for non-destructive testing and inspection
#3 | 2014-01-30 ✅ Patent 8,698,778 granted on 2014-04-15Method of manipulating impedance plane with a multi-point touch on touch screen
#4 | 2013-12-05 ✅ Patent 9,244,027 granted on 2016-01-26Method and instrument for identifying jewelry with plated element using x-ray florescence
#5 | 2013-10-03 ✅ Patent 8,829,763 granted on 2014-09-09Apparatus for and a method of improved timing control for non-destructive testing and inspection
#6 | 2013-02-28 ✅ Patent 9,279,786 granted on 2016-03-08Method of and an apparatus conducting calibration for phased-array shear wave channels inspecting square bars
#7 | 2011-12-15 ✅ Patent 8,448,518 granted on 2013-05-28Removable wear-plate assembly for acoustic probes
#8 | 2011-06-02 ✅ Patent 8,408,061 granted on 2013-04-02Sequentially fired high dynamic range NDT/NDI inspection device
#9 | 2011-05-19 ✅ Patent 8,286,491 granted on 2012-10-16Ultrasonic internal rotating inspection probe that self-eliminates air bubbles
#10 | 2011-05-05 ✅ Patent 8,904,872 granted on 2014-12-09Detection of channel saturation in phase-array ultrasonic non-destructive testing
#11 | 2011-04-28 ✅ Patent 8,371,151 granted on 2013-02-12Detection of channel saturation in phase-array ultrasonic non-destructive testing
#12 | 2011-02-03 ✅ Patent 8,264,221 granted on 2012-09-11Eddy current probe assembly adjustable for inspecting test objects of different sizes
#13 | 2010-12-09 ✅ Patent 8,050,039 granted on 2011-11-01Portable environmentally robust enclosure optimized for size, weight, and power dissipation
#14 | 2010-09-30 ✅ Patent 8,150,652 granted on 2012-04-03Method and system for automatic wedge identification for an ultrasonic inspection system
#15 | 2010-09-30 ✅ Patent 8,577,629 granted on 2013-11-05Method and system for transducer element fault detection for phased array ultrasonic instruments
#16 | 2010-06-17 ✅ Patent 8,490,491 granted on 2013-07-23Extended overflow indication for high dynamic range ultrasonic fault detection systems
#17 | 2010-04-29 ✅ Patent 7,911,368 granted on 2011-03-22Sample error minimization for high dynamic range digitization systems
#18 | 2010-04-22 ✅ Patent 8,521,457 granted on 2013-08-27User designated measurement display system and method for NDT/NDI with high rate input data
#19 | 2010-02-25 ✅ Patent 7,817,420 granted on 2010-10-19Portable environmentally robust enclosure optimized for size, weight, and power dissipation
#20 | 2010-01-14 ✅ Patent 8,018,228 granted on 2011-09-13High resolution and flexible eddy current array probe
#21 | 2009-11-05 ✅ Patent 8,138,755 granted on 2012-03-20Enhanced wireless eddy current probe for a non-destructive inspection system
#22 | 2009-10-01 ✅ Patent 8,310,229 granted on 2012-11-13Intelligent eddy current array probe with embedded firing sequence memory
#23 | 2009-09-24 ✅ Patent 8,302,477 granted on 2012-11-06Balanced mechanical resonator for powder handling device
#24 | 2009-09-10 ✅ Patent 8,421,802 granted on 2013-04-16Peak visualization enhancement display system for use with a compressed waveform display on a non-destructive inspection instrument
#25 | 2009-09-10 ✅ Patent 7,963,166 granted on 2011-06-21Ultrasonic fault detection system using a high dynamic range analog to digital conversion system
#26 | 2009-08-20 ✅ Patent 7,832,275 granted on 2010-11-16Ultrasonic detection measurement system using a tunable digital filter with 4X interpolator
#27 | 2009-07-16 ✅ Patent 8,001,842 granted on 2011-08-23Ultrasonic fault detection system using a high dynamic range analog to digital conversion system
#28 | 2009-02-19 ✅ Patent 7,817,076 granted on 2010-10-19Multiple mode digitization system for a non-destructive inspection instrument
#29 | 2008-12-25 ✅ Patent 8,049,494 granted on 2011-11-01Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
#30 | 2008-12-25 ✅ Patent 8,033,172 granted on 2011-10-11Hand-held flaw detector imaging apparatus
#31 | 2008-10-09 ✅ Patent 7,505,859 granted on 2009-03-17Method and algorithms for inspection of longitudinal defects in an eddy current inspection system
#32 | 2008-06-05 ✅ Patent 7,569,975 granted on 2009-08-04Cable direct interconnection (CDI) method for phased array transducers
#33 | 2007-04-19 ✅ Patent 7,461,554 granted on 2008-12-09Digital time variable gain circuit for non-destructive test instrument
#34 | 2007-04-19 ✅ Patent 7,757,557 granted on 2010-07-20Ultrasonic detection measurement system using a tunable digital filter with 4x interpolator
#35 | 2007-04-19 ✅ Patent 8,001,841 granted on 2011-08-23Ultrasonic fault detection system using a high dynamic range analog to digital conversion system
#36 | 2007-02-15 ✅ Patent 7,958,769 granted on 2011-06-14Detection of channel saturation in phase-array ultrasonic non-destructive testing
Also check out Olympus NDT's (Waltham, United States) applicant profile with 1 patent applications submitted.
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