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Inventor profile of:

Pierre Langlois

City:

Quebec

Country:

Canada

Published Applications:

8

Last publication date:

2018-04-26

Top Assignees for applications by Pierre Langlois

The entities that hold a legal rights for patent applications filed by inventor Langlois Pierre:

OLYMPUS NDT 3 Waltham, MA United States
OLYMPUS NDT INC. 2 Waltham, MA United States
OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS, INC 2 Waltham, MA United States

Recent patent applications by Langlois Pierre

Pierre Langlois from Quebec, CA has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2018-04-26

US20180113100A1

PHASED ARRAY WELD INSPECTION SYSTEM WITH ASSISTED ANALYSIS TOOLS

#2 | 2015-02-05

US20150039245A1

System and method of non-destructive inspection with a visual scanning guide

#3 | 2014-04-24

US20140109675A1

Ultrasonic testing instrument with dithery pulsing

#4 | 2009-04-09

US20090091318A1

PHASED SCAN EDDY CURRENT ARRAY PROBE AND A PHASED SCANNING METHOD WHICH PROVIDE COMPLETE AND CONTINUOUS COVERAGE OF A TEST SURFACE WITHOUT MECHANICAL SCANNING

#5 | 2009-02-19

US20090045994A1

Multiple mode digitization system for a non-destructive inspection instrument

#6 | 2008-12-25

US20080314153A1

Hand-held flaw detector imaging apparatus

#7 | 2007-02-15

US20070034010A1

Detection of channel saturation in phase-array ultrasonic non-destructive testing

#8 | 2006-11-16

US20060254359A1

Hand-held flaw detector imaging apparatus

InventorID:

1060411 ⎘