San Jose, California
United States
14
2016-12-06
14
2016-12-06
These are the the leading inventors for applications assigned to n&k Technology, Inc.:
n&k Technology, Inc. based in San Jose, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Three dimensional characterization of silicon wafer Vias from combined on-top microscopic and bottom-through laser fringes measurement
#2 | 2011-08-16 ✅ Patent 7,999,936 granted on 2011-08-16Combined transmittance and angle selective scattering measurement of fluid suspended particles for simultaneous determination of refractive index, extinction coefficient, particle size and particle density
#3 | 2011-06-14 ✅ Patent 7,962,242 granted on 2011-06-14Automated spatial flipping apparatus and system for photomasks and photomasks with pellicles
#4 | 2010-09-30 ✅ Patent 8,125,641 granted on 2012-02-28Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES)
#5 | 2010-07-13 ✅ Patent 7,756,677 granted on 2010-07-13Implementation of rigorous coupled wave analysis having improved efficiency for characterization
#6 | 2010-07-13 ✅ Patent 7,755,775 granted on 2010-07-13Broadband optical metrology with reduced wave front distortion, chromatic dispersion compensation and monitoring
#7 | 2010-05-18 ✅ Patent 7,717,661 granted on 2010-05-18Compact multiple diameters wafer handling system with on-chuck wafer calibration and integrated cassette-chuck transfer
#8 | 2010-03-16 ✅ Patent 7,679,736 granted on 2010-03-16System and method for optical photomask inspection through pellicle
#9 | 2009-04-28 ✅ Patent 7,525,672 granted on 2009-04-28Efficient characterization of symmetrically illuminated symmetric 2-D gratings
#10 | 2009-03-17 ✅ Patent 7,505,147 granted on 2009-03-17Efficient calculation of grating matrix elements for 2-D diffraction
#11 | 2008-07-08 ✅ Patent 7,397,030 granted on 2008-07-08Integrated local and global optical metrology for samples having miniature features
#12 | 2008-07-08 ✅ Patent 7,397,554 granted on 2008-07-08Apparatus and method for examining a disk-shaped sample on an X-Y-theta stage
#13 | 2008-06-24 ✅ Patent 7,391,524 granted on 2008-06-24System and method for efficient characterization of diffracting structures with incident plane parallel to grating lines
#14 | 2006-01-26 ✅ Patent 7,616,301 granted on 2009-11-10Disc clamping device for multiple standard discs
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