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Inventor profile of:

Mehdi Balooch

City:

Berkeley, California

Country:

United States

Published Applications:

Last publication date:

2025-03-20

Top Assignees for applications by Mehdi Balooch

The entities that hold a legal rights for patent applications filed by inventor Balooch Mehdi:

RAVE N.P., INC. 4 Delray Beach, FL United States
N&K Technology, Inc. 1 Santa Clara, CA United States
Asia Union Electronic Chemical Corporation 1 Kaohsiung County, Taiwan
Bruker Nano, Inc. 1 Delray Beach, FL United States
n&k Technology, Inc. 1 San Jose, CA United States
The Regents of the University of California 1 Oakland, CA United States

Recent patent applications by Balooch Mehdi

Mehdi Balooch from Berkeley, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-03-20

US20250098541A1

Electricity

ACOUSTIC RESONANCE SENSOR DEVICES FOR RADICAL SPECIES DETECTION WITH ENHANCED FILTERS

#2 | 2025-03-20

US20250093299A1

Physics

CORROSION-RESISTANT ACOUSTIC RESONANCE SENSOR DEVICES FOR RADICAL SPECIES DETECTION

#3 | 2023-11-23

US20230375506A1

Physics

SENSOR FOR MEASUREMENT OF RADICALS

#4 | 2017-08-17

US20170232483A1

Performing operations; transporting

Contamination removal apparatus and method

#5 | 2013-11-21

US20130306101A1

Performing operations; transporting

Contamination removal apparatus and method

#6 | 2013-09-19

US20130244550A1

Electricity

COnozzles

#7 | 2012-11-08

US20120279519A1

Performing operations; transporting

Integrated Substrate Cleaning System and Method

#8 | 2011-07-28

US20110180132A1

Electricity

TEXTURING AND DAMAGE ETCH OF SILICON SINGLE CRYSTAL (100) SUBSTRATES

#9 | 2011-03-10

US20110059681A1

Electricity

COnozzles

#10 | 2010-08-05

US20100197144A1

Electricity

Methods for damage etch and texturing of silicon single crystal substrates

#11 | 2008-07-08

US11445749

Integrated local and global optical metrology for samples having miniature features

#12 | 2008-03-25

US11264733

System and method for high intensity small spot optical metrology

#13 | 2006-10-10

US9636134

Apparatus for depositing a low work function material

InventorID:

445004 ⎘