JPK Instruments AG

City:

Country:

Germany

Published Applications:

Last publication date:

2014-01-16

Patent Grants:

Last grant date:

2015-07-14

Top Inventors for applications by JPK Instruments AG

These are the the leading inventors for applications assigned to JPK Instruments AG:

Torsten Jähnke 2 Berlin, Germany
Torsten Jahnke 1 Lychen, Germany
Michael Richard Haggerty 1 Berlin, Germany
TORSTEN JÄHNKE 1 BERLIN, Germany

Gunnar Sommer 1 Berlin, Germany
GERD BEHME 1 BERLIN, Germany
Jorn Kamps 1 Berlin, Germany
TILO JANKOWSKI 1 BERLIN, Germany

Recent patent applications by JPK Instruments AG

JPK Instruments AG based in , DE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2014-01-16 ✅ Patent 9,080,937 granted on 2015-07-14

US20140016119A1

Physics

Apparatus and a method for investigating a sample by means of several investigation methods

#2 | 2010-09-09 ✅ Patent 9,063,335 granted on 2015-06-23

US20100229262A1

Physics

Apparatus and method for examining a specimen by means of probe microscopy

#3 | 2010-08-26 ✅ Patent 8,381,311 granted on 2013-02-19

US20100218284A1

Physics

Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system

#4 | 2008-12-18 ✅ Patent 8,368,017 granted on 2013-02-05

US20080308726A1

Physics

Method for the operation of a measurement system with a scanning probe microscope and a measurement system

AssigneeID:

461599 ⎘