Tera Probe, Inc.

City:

Kanagawa

Country:

Japan

Published Applications:

Last publication date:

2014-08-28

Patent Grants:

Last grant date:

2015-02-03

Top Inventors for applications by Tera Probe, Inc.

These are the the leading inventors for applications assigned to Tera Probe, Inc.:

Takeshi Wakabayashi 4 Sayama, Japan
Takeshi Wakabayashi 4 Sayama-shi, Japan
Shinji Wakisaka 2 Ome-shi, Japan
Ichiro Mihara 2 Tachikawa, Japan

Shinji Wakisaka 2 Ome, Japan
Ichiro Mihara 2 Tachikawa-shi, Japan
Osamu Okada 1 Hamura-shi, Japan
Aiko Mizusawa 1 Kunitachi-shi, Japan

Ichiro Kouno 1 Hamura-shi, Japan
Osamu Okada 1 Hamura, Japan
Aiko Mizusawa 1 Kunitachi, Japan
Ichiro Kouno 1 Hamura, Japan

Recent patent applications by Tera Probe, Inc.

Tera Probe, Inc. based in Kanagawa, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2014-08-28 ✅ Patent 8,946,079 granted on 2015-02-03

US20140239511A1

Electricity

Semiconductor construct and manufacturing method thereof as well as semiconductor device and manufacturing method thereof

#2 | 2014-03-13 ✅ Patent 8,871,627 granted on 2014-10-28

US20140073090A1

Electricity

Semiconductor device having low dielectric insulating film and manufacturing method of the same

#3 | 2013-12-05 ✅ Patent 8,754,525 granted on 2014-06-17

US20130320526A1

Electricity

Semiconductor construct and manufacturing method thereof as well as semiconductor device and manufacturing method thereof

#4 | 2008-08-14 ✅ Patent 8,749,065 granted on 2014-06-10

US20080191357A1

Electricity

Semiconductor device comprising electromigration prevention film and manufacturing method thereof

AssigneeID:

480039 ⎘