Tokyo
Japan
572
2025-12-25
551
2025-09-23
These are the the leading inventors for applications assigned to JEOL, LTD.:
JEOL, LTD. based in Tokyo, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Lithography System
#2 | 2025-09-23 ✅ Patent 12,422,508 granted on 2025-09-23Sliding band capacitor inductive coupling in a low temperature nuclear magnetic resonance probe and methods of use
#3 | 2025-09-11 ✅ Patent 12,584,981 granted on 2026-03-24INDUCTIVE TUNING WITH A SLIDING BAND CAPACITOR IN A LOW TEMPERATURE NUCLEAR MAGNETIC RESONANCE PROBE AND METHODS OF USE
#4 | 2024-08-15 ✅ Patent 12,640,339 granted on 2026-05-26Electron Microscope, Aberration Correction Method, And Imaging Method
#5 | 2024-05-09 ✅ Patent 12,487,298 granted on 2025-12-02MAS Apparatus
#6 | 2024-05-02 ✅ Patent 12,633,491 granted on 2026-05-19Method of Adjusting Charged Particle Optical System and Charged Particle Beam Apparatus
#7 | 2024-05-02Electron Microscope, Multipole Element for Use Therein, and Control Method for Such Electron Microscope
#8 | 2024-05-02 ✅ Patent 12,631,578 granted on 2026-05-19Analyzing Method and Analyzer
#9 | 2024-03-21 ✅ Patent 12,500,059 granted on 2025-12-16Sample Milling Apparatus, Shield Plate, and Sample Milling Method
#10 | 2024-03-14 ✅ Patent 12,586,752 granted on 2026-03-24Electron Microscope and Specimen Orientation Alignment Method
#11 | 2024-03-12 ✅ Patent 11,927,653 granted on 2024-03-12Solid sample magnetic coupling high resolution nuclear magnetic resolution probe and method of use
#12 | 2024-02-29 ✅ Patent 12,474,424 granted on 2025-11-18Sample Tube Transport Apparatus
#13 | 2024-02-01 ✅ Patent 12,476,095 granted on 2025-11-18Sample Analyzing Apparatus and Method
#14 | 2024-02-01 ✅ Patent 12,512,243 granted on 2025-12-30SUPERCONDUCTING COIL DEVICE
#15 | 2024-01-18 ✅ Patent 12,482,629 granted on 2025-11-25Specimen Processing Holder and Specimen Processing Method
#16 | 2023-12-21 ✅ Patent 12,436,120 granted on 2025-10-07Sample Container and Measuring Method
#17 | 2023-12-14 ✅ Patent 12,431,326 granted on 2025-09-30Charged Particle Beam Device and Image Acquisition Method
#18 | 2023-11-30 ✅ Patent 12,431,328 granted on 2025-09-30Electron Microscope and Calibration Method
#19 | 2023-11-23 ✅ Patent 12,586,169 granted on 2026-03-24Mass Image Processing Apparatus and Method
#20 | 2023-10-26 ✅ Patent 12,586,750 granted on 2026-03-24Charged Particle Beam System and Control Method Therefor
#21 | 2023-09-28 ✅ Patent 12,597,582 granted on 2026-04-07Charged Particle Beam Apparatus
#22 | 2023-09-14 ✅ Patent 12,500,064 granted on 2025-12-16Charged Particle Beam Apparatus and Control Method for Charged Particle Beam Apparatus
#23 | 2023-08-31 ✅ Patent 12,542,265 granted on 2026-02-03Partial Structure Estimation Apparatus and Method of Generating Partial Structure Estimation Model
#24 | 2023-08-31 ✅ Patent 12,394,591 granted on 2025-08-19Charged Particle Beam Apparatus
#25 | 2023-08-24 ✅ Patent 12,354,827 granted on 2025-07-08Aberration Correcting Device and Electron Microscope
#26 | 2023-08-17 ✅ Patent 12,498,269 granted on 2025-12-16Phase Analyzer, Sample Analyzer, and Analysis Method
#27 | 2023-08-15 ✅ Patent 11,726,152 granted on 2023-08-15Solid sample magnetic coupling high resolution nuclear magnetic resolution probe and method of use
#28 | 2023-08-10 ✅ Patent 12,525,431 granted on 2026-01-13Aberration Corrector and Electron Microscope
#29 | 2023-08-03 ✅ Patent 12,630,505 granted on 2026-05-19Alkyne Compound, Vitamin D Compound, Analytical Method, and Production Method
#30 | 2023-07-27 ✅ Patent 12,609,266 granted on 2026-04-21Sample Cartridge Holding Apparatus
#31 | 2023-07-20 ✅ Patent 12,334,300 granted on 2025-06-17Focused Ion Beam System and Method of Correcting Deviation of Field of View of Ion Beam
#32 | 2023-07-06 ✅ Patent 11,894,854 granted on 2024-02-06Optical lattice clock and magnetic field correction method for optical lattice clock
#33 | 2023-06-29 ✅ Patent 12,451,337 granted on 2025-10-21Sample Cartridge Carrier Apparatus and Carrier Base
#34 | 2023-06-22 ✅ Patent 12,431,323 granted on 2025-09-30Apparatus and Method for Milling Sample
#35 | 2023-05-11 ✅ Patent 12,206,333 granted on 2025-01-21High voltage amplifier circuit and analyzer apparatus
#36 | 2023-05-11 ✅ Patent 12,332,328 granted on 2025-06-17Angle Adjuster for NMR
#37 | 2023-05-04 ✅ Patent 12,555,762 granted on 2026-02-17Mass Spectrometry Apparatus and Mass Spectrometry Method
#38 | 2023-05-04 ✅ Patent 12,467,888 granted on 2025-11-11Phase Analyzer, Sample Analyzer, and Analysis Method
#39 | 2023-05-04 ✅ Patent 12,469,675 granted on 2025-11-11Phase Analyzer, Sample Analyzer, and Analysis Method
#40 | 2023-05-04 ✅ Patent 11,929,754 granted on 2024-03-12Triaxial magnetic field correction coil, physics package, physics package for optical lattice clock, physics package for atomic clock, physics package for atom interferometer, physics package for quantum information processing device, and physics package system
#41 | 2023-04-27 ✅ Patent 12,518,944 granted on 2026-01-06Electron Microscope and Image Acquisition Method
#42 | 2023-04-20 ✅ Patent 12,211,647 granted on 2025-01-28Tri-axial magnetic field correction coil, physical package, physical package for optical lattice clock, physical package for atomic clock, physical package for atom interferometer, physical package for quantum information processing device, and physical package system
#43 | 2023-04-13 ✅ Patent 12,261,013 granted on 2025-03-25Charged particle beam system and control method therefor
#44 | 2023-04-13 ✅ Patent 12,291,546 granted on 2025-05-06Phosphonium compound, reagent kit for derivatization, mass spectrometric method, and method for producing phosphonium compound
#45 | 2023-04-13 ✅ Patent 12,105,229 granted on 2024-10-01Radiation detection apparatus and sample analysis apparatus
#46 | 2023-03-30 ✅ Patent 12,362,134 granted on 2025-07-15Charged Particle Beam Apparatus and Image Adjustment Method
#47 | 2023-03-16 ✅ Patent 12,399,142 granted on 2025-08-26Scatter Diagram Display Device, Scatter Diagram Display Method, and Analyzer
#48 | 2023-03-09 ✅ Patent 12,431,319 granted on 2025-09-30Charged Particle Beam Device and Image Generation Method
#49 | 2023-02-16 ✅ Patent 12,103,080 granted on 2024-10-01Particle filtration from air recycling in a three-dimensional powder bed fusion additive manufacturing apparatus
#50 | 2023-02-16 ✅ Patent 11,801,558 granted on 2023-10-31Three-dimensional powder bed fusion additive manufacturing apparatus
#51 | 2023-02-16 ✅ Patent 11,914,009 granted on 2024-02-27NMR apparatus and gas replacement method for replacing gas in NMR probe
#52 | 2023-01-26 ✅ Patent 12,255,041 granted on 2025-03-18Electron microscope and method of correcting aberration
#53 | 2023-01-19 ✅ Patent 12,278,084 granted on 2025-04-15Electron microscope and image generation method
#54 | 2023-01-19 ✅ Patent 12,429,333 granted on 2025-09-30Specimen Machining Device and Specimen Machining Method
#55 | 2023-01-19 ✅ Patent 12,261,014 granted on 2025-03-25Scanning electron microscope and objective lens
#56 | 2022-12-29 ✅ Patent 12,222,658 granted on 2025-02-11Stage apparatus and electron beam lithography system
#57 | 2022-12-22 ✅ Patent 12,412,728 granted on 2025-09-09Electron Beam Inspection System
#58 | 2022-12-08 ✅ Patent 11,837,437 granted on 2023-12-05Specimen machining device and information provision method
#59 | 2022-12-08 ✅ Patent 12,476,071 granted on 2025-11-18Specimen Machining Device and Specimen Machining Method
#60 | 2022-12-08 ✅ Patent 12,148,594 granted on 2024-11-19Charged particle beam apparatus and image acquiring method
#61 | 2022-12-08 ✅ Patent 12,255,043 granted on 2025-03-18Scanning electron microscope and image generation method using scanning electron microscope
#62 | 2022-11-24 ✅ Patent 12,340,997 granted on 2025-06-24Mass Spectrometry Method and Information Processing Device
#63 | 2022-10-13 ✅ Patent 12,131,881 granted on 2024-10-29Electron microscope and specimen contamination prevention method
#64 | 2022-09-29 ✅ Patent 12,631,581 granted on 2026-05-19Spectrum Analysis Apparatus and Database Creation Method
#65 | 2022-09-22 ✅ Patent 11,774,525 granted on 2023-10-03NMR probe
#66 | 2022-09-15 ✅ Patent 11,878,348 granted on 2024-01-23Three-dimensional powder bed fusion additive manufacturing apparatus and three-dimensional powder bed fusion additive manufacturing method
#67 | 2022-09-08 ✅ Patent 12,266,502 granted on 2025-04-01Sample milling apparatus and method of adjustment therefor
#68 | 2022-09-01 ✅ Patent 11,990,312 granted on 2024-05-21Specimen machining device and specimen machining method
#69 | 2022-08-18 ✅ Patent 11,837,433 granted on 2023-12-05Method of measuring relative rotational angle and scanning transmission electron microscope
#70 | 2022-08-18 ✅ Patent 11,842,880 granted on 2023-12-12Estimation model generation method and electron microscope
#71 | 2022-08-04 ✅ Patent 11,733,188 granted on 2023-08-22Analyzer and image processing method
#72 | 2022-07-28 ✅ Patent 11,929,238 granted on 2024-03-12Ion beam processing apparatus and method for controlling operation thereof
#73 | 2022-07-21 ✅ Patent 11,764,029 granted on 2023-09-19Method of measuring aberration and electron microscope
#74 | 2022-07-14 ✅ Patent 11,631,569 granted on 2023-04-18Charged particle beam system
#75 | 2022-07-14 ✅ Patent 12,112,917 granted on 2024-10-08Sample holder and charged particle beam system
#76 | 2022-07-14 ✅ Patent 12,362,133 granted on 2025-07-15Transport Device and Charged Particle Beam System
#77 | 2022-07-14 ✅ Patent 11,640,895 granted on 2023-05-02Sample holder and charged particle beam system
#78 | 2022-07-07 ✅ Patent 11,776,787 granted on 2023-10-03Charged particle beam apparatus
#79 | 2022-07-07 ✅ Patent 11,705,303 granted on 2023-07-18Sample loading method and charged particle beam apparatus
#80 | 2022-07-07 ✅ Patent 12,253,445 granted on 2025-03-18Specimen pretreatment method
#81 | 2022-06-30 ✅ Patent 11,718,590 granted on 2023-08-08Compound, derivatization reagent, and method for synthesizing compound
#82 | 2022-06-16 ✅ Patent 11,651,936 granted on 2023-05-16Charged particle beam apparatus
#83 | 2022-06-02 ✅ Patent 11,742,176 granted on 2023-08-29Transmission electron microscope and method of adjusting optical system
#84 | 2022-06-02 ✅ Patent 11,699,567 granted on 2023-07-11X-ray detection apparatus and method
#85 | 2022-05-19 ✅ Patent 11,710,615 granted on 2023-07-25Charged particle beam device and analysis method
#86 | 2022-05-12 ✅ Patent 11,788,976 granted on 2023-10-17X-ray measurement apparatus and X-ray measurement method
#87 | 2022-04-28 ✅ Patent 11,721,535 granted on 2023-08-08Apparatus and method for processing mass spectrum
#88 | 2022-04-21 ✅ Patent 12,014,914 granted on 2024-06-18Mass spectrum processing apparatus and method
#89 | 2022-04-14 ✅ Patent 11,961,726 granted on 2024-04-16Mass spectrum processing apparatus and method
#90 | 2022-03-17 ✅ Patent 11,676,796 granted on 2023-06-13Charged particle beam device
#91 | 2022-03-17 ✅ Patent 11,796,518 granted on 2023-10-24Apparatus and method for processing mass spectrum
#92 | 2022-02-17 ✅ Patent 11,562,886 granted on 2023-01-24Ion milling apparatus and sample holder
#93 | 2022-02-17 ✅ Patent 11,694,875 granted on 2023-07-04Charged particle beam drawing device and method of controlling charged particle beam drawing device
#94 | 2022-02-10 ✅ Patent 11,959,844 granted on 2024-04-16Automatic analyzer, cool box, and pouch
#95 | 2022-02-03 ✅ Patent 11,495,432 granted on 2022-11-08Charged particle beam device and method for controlling sample stage
#96 | 2022-01-27 ✅ Patent 11,574,795 granted on 2023-02-07Charged particle beam apparatus and setting assisting method
#97 | 2022-01-27 ✅ Patent 11,557,458 granted on 2023-01-17Charged particle beam apparatus and setting assisting method
#98 | 2022-01-27 ✅ Patent 11,682,539 granted on 2023-06-20Charged particle beam apparatus and setting assisting method
#99 | 2022-01-27 ✅ Patent 11,587,761 granted on 2023-02-21Charged particle beam apparatus and setting assisting method
#100 | 2022-01-27 ✅ Patent 11,674,913 granted on 2023-06-13Sample analysis apparatus and method
Also check out JEOL Ltd.'s (Tokyo, Japan) applicant profile with 460 patent applications submitted.
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