Assignee profile:

JEOL, LTD.

City:

Tokyo

Country:

Japan

Published Applications:

572

Last publication date:

2025-12-25

Patent Grants:

551

Last grant date:

2025-09-23

Quarterly JEOL, LTD. Patent Applications

Top Inventors for applications by JEOL, LTD.

These are the the leading inventors for applications assigned to JEOL, LTD.:

Recent patent applications by JEOL, LTD.

JEOL, LTD. based in Tokyo, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2025-12-25
US20250391634A1
Electricity

Lithography System

#2 | 2025-09-23 ✅ Patent 12,422,508 granted on 2025-09-23
US18599786
Physics

Sliding band capacitor inductive coupling in a low temperature nuclear magnetic resonance probe and methods of use

#3 | 2025-09-11 ✅ Patent 12,584,981 granted on 2026-03-24
US20250283960A1
Physics

INDUCTIVE TUNING WITH A SLIDING BAND CAPACITOR IN A LOW TEMPERATURE NUCLEAR MAGNETIC RESONANCE PROBE AND METHODS OF USE

#4 | 2024-08-15 ✅ Patent 12,640,339 granted on 2026-05-26
US20240274402A1
Electricity

Electron Microscope, Aberration Correction Method, And Imaging Method

#5 | 2024-05-09 ✅ Patent 12,487,298 granted on 2025-12-02
US20240151789A1
Physics

MAS Apparatus

#6 | 2024-05-02 ✅ Patent 12,633,491 granted on 2026-05-19
US20240145211A1
Electricity

Method of Adjusting Charged Particle Optical System and Charged Particle Beam Apparatus

#7 | 2024-05-02
US20240145210A1
Electricity

Electron Microscope, Multipole Element for Use Therein, and Control Method for Such Electron Microscope

#8 | 2024-05-02 ✅ Patent 12,631,578 granted on 2026-05-19
US20240142395A1
Physics

Analyzing Method and Analyzer

#9 | 2024-03-21 ✅ Patent 12,500,059 granted on 2025-12-16
US20240096584A1
Electricity

Sample Milling Apparatus, Shield Plate, and Sample Milling Method

#10 | 2024-03-14 ✅ Patent 12,586,752 granted on 2026-03-24
US20240087840A1
Electricity

Electron Microscope and Specimen Orientation Alignment Method

#11 | 2024-03-12 ✅ Patent 11,927,653 granted on 2024-03-12
US18215516
Physics

Solid sample magnetic coupling high resolution nuclear magnetic resolution probe and method of use

#12 | 2024-02-29 ✅ Patent 12,474,424 granted on 2025-11-18
US20240069129A1
Physics

Sample Tube Transport Apparatus

#13 | 2024-02-01 ✅ Patent 12,476,095 granted on 2025-11-18
US20240038513A1
Electricity

Sample Analyzing Apparatus and Method

#14 | 2024-02-01 ✅ Patent 12,512,243 granted on 2025-12-30
US20240038427A1
Electricity

SUPERCONDUCTING COIL DEVICE

#15 | 2024-01-18 ✅ Patent 12,482,629 granted on 2025-11-25
US20240021405A1
Electricity

Specimen Processing Holder and Specimen Processing Method

#16 | 2023-12-21 ✅ Patent 12,436,120 granted on 2025-10-07
US20230408427A1
Physics

Sample Container and Measuring Method

#17 | 2023-12-14 ✅ Patent 12,431,326 granted on 2025-09-30
US20230402252A1
Electricity

Charged Particle Beam Device and Image Acquisition Method

#18 | 2023-11-30 ✅ Patent 12,431,328 granted on 2025-09-30
US20230386782A1
Electricity

Electron Microscope and Calibration Method

#19 | 2023-11-23 ✅ Patent 12,586,169 granted on 2026-03-24
US20230377116A1
Physics

Mass Image Processing Apparatus and Method

#20 | 2023-10-26 ✅ Patent 12,586,750 granted on 2026-03-24
US20230343550A1
Electricity

Charged Particle Beam System and Control Method Therefor

#21 | 2023-09-28 ✅ Patent 12,597,582 granted on 2026-04-07
US20230307206A1
Electricity

Charged Particle Beam Apparatus

#22 | 2023-09-14 ✅ Patent 12,500,064 granted on 2025-12-16
US20230290607A1
Electricity

Charged Particle Beam Apparatus and Control Method for Charged Particle Beam Apparatus

#23 | 2023-08-31 ✅ Patent 12,542,265 granted on 2026-02-03
US20230274923A1
Electricity

Partial Structure Estimation Apparatus and Method of Generating Partial Structure Estimation Model

#24 | 2023-08-31 ✅ Patent 12,394,591 granted on 2025-08-19
US20230274910A1
Electricity

Charged Particle Beam Apparatus

#25 | 2023-08-24 ✅ Patent 12,354,827 granted on 2025-07-08
US20230268155A1
Electricity

Aberration Correcting Device and Electron Microscope

#26 | 2023-08-17 ✅ Patent 12,498,269 granted on 2025-12-16
US20230258499A1
Physics

Phase Analyzer, Sample Analyzer, and Analysis Method

#27 | 2023-08-15 ✅ Patent 11,726,152 granted on 2023-08-15
US17896416
Physics

Solid sample magnetic coupling high resolution nuclear magnetic resolution probe and method of use

#28 | 2023-08-10 ✅ Patent 12,525,431 granted on 2026-01-13
US20230253181A1
Electricity

Aberration Corrector and Electron Microscope

#29 | 2023-08-03 ✅ Patent 12,630,505 granted on 2026-05-19
US20230242480A1
Chemistry; metallurgy

Alkyne Compound, Vitamin D Compound, Analytical Method, and Production Method

#30 | 2023-07-27 ✅ Patent 12,609,266 granted on 2026-04-21
US20230238208A1
Electricity

Sample Cartridge Holding Apparatus

#31 | 2023-07-20 ✅ Patent 12,334,300 granted on 2025-06-17
US20230230801A1
Electricity

Focused Ion Beam System and Method of Correcting Deviation of Field of View of Ion Beam

#32 | 2023-07-06 ✅ Patent 11,894,854 granted on 2024-02-06
US20230216513A1
Electricity

Optical lattice clock and magnetic field correction method for optical lattice clock

#33 | 2023-06-29 ✅ Patent 12,451,337 granted on 2025-10-21
US20230207287A1
Electricity

Sample Cartridge Carrier Apparatus and Carrier Base

#34 | 2023-06-22 ✅ Patent 12,431,323 granted on 2025-09-30
US20230197401A1
Electricity

Apparatus and Method for Milling Sample

#35 | 2023-05-11 ✅ Patent 12,206,333 granted on 2025-01-21
US20230148109A1
Electricity

High voltage amplifier circuit and analyzer apparatus

#36 | 2023-05-11 ✅ Patent 12,332,328 granted on 2025-06-17
US20230145398A1
Physics

Angle Adjuster for NMR

#37 | 2023-05-04 ✅ Patent 12,555,762 granted on 2026-02-17
US20230140037A1
Electricity

Mass Spectrometry Apparatus and Mass Spectrometry Method

#38 | 2023-05-04 ✅ Patent 12,467,888 granted on 2025-11-11
US20230137130A1
Physics

Phase Analyzer, Sample Analyzer, and Analysis Method

#39 | 2023-05-04 ✅ Patent 12,469,675 granted on 2025-11-11
US20230135601A1
Electricity

Phase Analyzer, Sample Analyzer, and Analysis Method

#40 | 2023-05-04 ✅ Patent 11,929,754 granted on 2024-03-12
US20230134841A1
Electricity

Triaxial magnetic field correction coil, physics package, physics package for optical lattice clock, physics package for atomic clock, physics package for atom interferometer, physics package for quantum information processing device, and physics package system

#41 | 2023-04-27 ✅ Patent 12,518,944 granted on 2026-01-06
US20230127255A1
Electricity

Electron Microscope and Image Acquisition Method

#42 | 2023-04-20 ✅ Patent 12,211,647 granted on 2025-01-28
US20230120920A1
Electricity

Tri-axial magnetic field correction coil, physical package, physical package for optical lattice clock, physical package for atomic clock, physical package for atom interferometer, physical package for quantum information processing device, and physical package system

#43 | 2023-04-13 ✅ Patent 12,261,013 granted on 2025-03-25
US20230115486A1
Electricity

Charged particle beam system and control method therefor

#44 | 2023-04-13 ✅ Patent 12,291,546 granted on 2025-05-06
US20230112623A1
Chemistry; metallurgy

Phosphonium compound, reagent kit for derivatization, mass spectrometric method, and method for producing phosphonium compound

#45 | 2023-04-13 ✅ Patent 12,105,229 granted on 2024-10-01
US20230112252A1
Physics

Radiation detection apparatus and sample analysis apparatus

#46 | 2023-03-30 ✅ Patent 12,362,134 granted on 2025-07-15
US20230100291A1
Electricity

Charged Particle Beam Apparatus and Image Adjustment Method

#47 | 2023-03-16 ✅ Patent 12,399,142 granted on 2025-08-26
US20230083479A1
Physics

Scatter Diagram Display Device, Scatter Diagram Display Method, and Analyzer

#48 | 2023-03-09 ✅ Patent 12,431,319 granted on 2025-09-30
US20230072991A1
Electricity

Charged Particle Beam Device and Image Generation Method

#49 | 2023-02-16 ✅ Patent 12,103,080 granted on 2024-10-01
US20230050527A1
Performing operations; transporting

Particle filtration from air recycling in a three-dimensional powder bed fusion additive manufacturing apparatus

#50 | 2023-02-16 ✅ Patent 11,801,558 granted on 2023-10-31
US20230049933A1
Performing operations; transporting

Three-dimensional powder bed fusion additive manufacturing apparatus

#51 | 2023-02-16 ✅ Patent 11,914,009 granted on 2024-02-27
US20230047563A1
Physics

NMR apparatus and gas replacement method for replacing gas in NMR probe

#52 | 2023-01-26 ✅ Patent 12,255,041 granted on 2025-03-18
US20230026970A1
Electricity

Electron microscope and method of correcting aberration

#53 | 2023-01-19 ✅ Patent 12,278,084 granted on 2025-04-15
US20230015400A1
Electricity

Electron microscope and image generation method

#54 | 2023-01-19 ✅ Patent 12,429,333 granted on 2025-09-30
US20230015109A1
Physics

Specimen Machining Device and Specimen Machining Method

#55 | 2023-01-19 ✅ Patent 12,261,014 granted on 2025-03-25
US20230014270A1
Electricity

Scanning electron microscope and objective lens

#56 | 2022-12-29 ✅ Patent 12,222,658 granted on 2025-02-11
US20220413396A1
Physics

Stage apparatus and electron beam lithography system

#57 | 2022-12-22 ✅ Patent 12,412,728 granted on 2025-09-09
US20220406560A1
Electricity

Electron Beam Inspection System

#58 | 2022-12-08 ✅ Patent 11,837,437 granted on 2023-12-05
US20220392744A1
Electricity

Specimen machining device and information provision method

#59 | 2022-12-08 ✅ Patent 12,476,071 granted on 2025-11-18
US20220392739A1
Electricity

Specimen Machining Device and Specimen Machining Method

#60 | 2022-12-08 ✅ Patent 12,148,594 granted on 2024-11-19
US20220392738A1
Electricity

Charged particle beam apparatus and image acquiring method

#61 | 2022-12-08 ✅ Patent 12,255,043 granted on 2025-03-18
US20220392737A1
Electricity

Scanning electron microscope and image generation method using scanning electron microscope

#62 | 2022-11-24 ✅ Patent 12,340,997 granted on 2025-06-24
US20220375737A1
Electricity

Mass Spectrometry Method and Information Processing Device

#63 | 2022-10-13 ✅ Patent 12,131,881 granted on 2024-10-29
US20220328280A1
Electricity

Electron microscope and specimen contamination prevention method

#64 | 2022-09-29 ✅ Patent 12,631,581 granted on 2026-05-19
US20220307996A1
Physics

Spectrum Analysis Apparatus and Database Creation Method

#65 | 2022-09-22 ✅ Patent 11,774,525 granted on 2023-10-03
US20220299585A1
Physics

NMR probe

#66 | 2022-09-15 ✅ Patent 11,878,348 granted on 2024-01-23
US20220288691A1
Performing operations; transporting

Three-dimensional powder bed fusion additive manufacturing apparatus and three-dimensional powder bed fusion additive manufacturing method

#67 | 2022-09-08 ✅ Patent 12,266,502 granted on 2025-04-01
US20220285125A1
Electricity

Sample milling apparatus and method of adjustment therefor

#68 | 2022-09-01 ✅ Patent 11,990,312 granted on 2024-05-21
US20220277925A1
Electricity

Specimen machining device and specimen machining method

#69 | 2022-08-18 ✅ Patent 11,837,433 granted on 2023-12-05
US20220262597A1
Electricity

Method of measuring relative rotational angle and scanning transmission electron microscope

#70 | 2022-08-18 ✅ Patent 11,842,880 granted on 2023-12-12
US20220262595A1
Electricity

Estimation model generation method and electron microscope

#71 | 2022-08-04 ✅ Patent 11,733,188 granted on 2023-08-22
US20220244202A1
Physics

Analyzer and image processing method

#72 | 2022-07-28 ✅ Patent 11,929,238 granted on 2024-03-12
US20220238310A1
Electricity

Ion beam processing apparatus and method for controlling operation thereof

#73 | 2022-07-21 ✅ Patent 11,764,029 granted on 2023-09-19
US20220230838A1
Electricity

Method of measuring aberration and electron microscope

#74 | 2022-07-14 ✅ Patent 11,631,569 granted on 2023-04-18
US20220223371A1
Electricity

Charged particle beam system

#75 | 2022-07-14 ✅ Patent 12,112,917 granted on 2024-10-08
US20220223370A1
Electricity

Sample holder and charged particle beam system

#76 | 2022-07-14 ✅ Patent 12,362,133 granted on 2025-07-15
US20220223369A1
Electricity

Transport Device and Charged Particle Beam System

#77 | 2022-07-14 ✅ Patent 11,640,895 granted on 2023-05-02
US20220223368A1
Electricity

Sample holder and charged particle beam system

#78 | 2022-07-07 ✅ Patent 11,776,787 granted on 2023-10-03
US20220216033A1
Electricity

Charged particle beam apparatus

#79 | 2022-07-07 ✅ Patent 11,705,303 granted on 2023-07-18
US20220216030A1
Electricity

Sample loading method and charged particle beam apparatus

#80 | 2022-07-07 ✅ Patent 12,253,445 granted on 2025-03-18
US20220214250A1
Physics

Specimen pretreatment method

#81 | 2022-06-30 ✅ Patent 11,718,590 granted on 2023-08-08
US20220204459A1
Chemistry; metallurgy

Compound, derivatization reagent, and method for synthesizing compound

#82 | 2022-06-16 ✅ Patent 11,651,936 granted on 2023-05-16
US20220189731A1
Electricity

Charged particle beam apparatus

#83 | 2022-06-02 ✅ Patent 11,742,176 granted on 2023-08-29
US20220172924A1
Electricity

Transmission electron microscope and method of adjusting optical system

#84 | 2022-06-02 ✅ Patent 11,699,567 granted on 2023-07-11
US20220172923A1
Electricity

X-ray detection apparatus and method

#85 | 2022-05-19 ✅ Patent 11,710,615 granted on 2023-07-25
US20220157558A1
Electricity

Charged particle beam device and analysis method

#86 | 2022-05-12 ✅ Patent 11,788,976 granted on 2023-10-17
US20220146442A1
Physics

X-ray measurement apparatus and X-ray measurement method

#87 | 2022-04-28 ✅ Patent 11,721,535 granted on 2023-08-08
US20220130653A1
Electricity

Apparatus and method for processing mass spectrum

#88 | 2022-04-21 ✅ Patent 12,014,914 granted on 2024-06-18
US20220122825A1
Electricity

Mass spectrum processing apparatus and method

#89 | 2022-04-14 ✅ Patent 11,961,726 granted on 2024-04-16
US20220115219A1
Electricity

Mass spectrum processing apparatus and method

#90 | 2022-03-17 ✅ Patent 11,676,796 granted on 2023-06-13
US20220084783A1
Electricity

Charged particle beam device

#91 | 2022-03-17 ✅ Patent 11,796,518 granted on 2023-10-24
US20220082537A1
Physics

Apparatus and method for processing mass spectrum

#92 | 2022-02-17 ✅ Patent 11,562,886 granted on 2023-01-24
US20220051870A1
Electricity

Ion milling apparatus and sample holder

#93 | 2022-02-17 ✅ Patent 11,694,875 granted on 2023-07-04
US20220051869A1
Electricity

Charged particle beam drawing device and method of controlling charged particle beam drawing device

#94 | 2022-02-10 ✅ Patent 11,959,844 granted on 2024-04-16
US20220042888A1
Physics

Automatic analyzer, cool box, and pouch

#95 | 2022-02-03 ✅ Patent 11,495,432 granted on 2022-11-08
US20220037110A1
Electricity

Charged particle beam device and method for controlling sample stage

#96 | 2022-01-27 ✅ Patent 11,574,795 granted on 2023-02-07
US20220028654A1
Electricity

Charged particle beam apparatus and setting assisting method

#97 | 2022-01-27 ✅ Patent 11,557,458 granted on 2023-01-17
US20220028653A1
Electricity

Charged particle beam apparatus and setting assisting method

#98 | 2022-01-27 ✅ Patent 11,682,539 granted on 2023-06-20
US20220028651A1
Electricity

Charged particle beam apparatus and setting assisting method

#99 | 2022-01-27 ✅ Patent 11,587,761 granted on 2023-02-21
US20220028649A1
Electricity

Charged particle beam apparatus and setting assisting method

#100 | 2022-01-27 ✅ Patent 11,674,913 granted on 2023-06-13
US20220026378A1
Physics

Sample analysis apparatus and method

Also check out JEOL Ltd.'s (Tokyo, Japan) applicant profile with 460 patent applications submitted.

AssigneeID:

5956 ⎘