Tokyo
Japan
8
2025-11-20
The entities that hold a legal rights for patent applications filed by inventor Sagawa Ryusuke:
Ryusuke Sagawa from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Image Acquisition Method and Scanning Transmission Electron Microscope
#2 | 2024-08-15Electron Microscope, Aberration Correction Method, And Imaging Method
#3 | 2023-01-26Electron microscope and method of correcting aberration
#4 | 2022-08-18Estimation model generation method and electron microscope
#5 | 2022-07-21Method of measuring aberration and electron microscope
#6 | 2021-10-28Scanning transmission electron microscope and adjustment method of optical system
#7 | 2018-11-22Scanning transmission electron microscope and method of image generation
#8 | 2018-05-10Electron microscope and image acquisition method
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