Dallas, Texas
United States
32
2016-02-04
27
2016-05-24
These are the the leading inventors for applications assigned to OMNIPROBE, INC.:
OMNIPROBE, INC. based in Dallas, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Total release method for sample extraction in an energetic-beam instrument
#2 | 2014-01-16 ✅ Patent 9,097,625 granted on 2015-08-04Gas injection system for energetic-beam instruments
#3 | 2013-04-18 ✅ Patent 8,513,622 granted on 2013-08-20Method for extracting frozen specimens and manufacture of specimen assemblies
#4 | 2013-02-14 ✅ Patent 8,759,765 granted on 2014-06-24Method for processing samples held by a nanomanipulator
#5 | 2013-01-31 ✅ Patent 8,512,474 granted on 2013-08-20Apparatus for precursor delivery system for irradiation beam instruments
#6 | 2012-02-02 ✅ Patent 8,440,969 granted on 2013-05-14Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images
#7 | 2011-08-25APPARATUS FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENT
#8 | 2011-02-10 ✅ Patent 8,247,768 granted on 2012-08-21Method for stem sample inspection in a charged particle beam instrument
#9 | 2011-02-10 ✅ Patent 8,168,949 granted on 2012-05-01Method for stem sample inspection in a charged particle beam instrument
#10 | 2011-01-27 ✅ Patent 8,227,781 granted on 2012-07-24Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument
#11 | 2011-01-27VARIABLE-TILT TEM SPECIMEN HOLDER FOR CHARGED-PARTICLE BEAM INSTRUMENTS
#12 | 2010-08-12 ✅ Patent 8,054,558 granted on 2011-11-08Multiple magnification optical system with single objective lens
#13 | 2010-08-12METHOD OF ETCHING MATERIALS WITH ELECTRON BEAM AND LASER ENERGY
#14 | 2010-03-18METHODS FOR ELECTRON-BEAM INDUCED DEPOSITION OF MATERIAL INSIDE ENERGETIC-BEAM MICROSCOPES
#15 | 2010-03-04 ✅ Patent 7,961,397 granted on 2011-06-14Single-channel optical processing system for energetic-beam microscopes
#16 | 2010-02-04GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENT
#17 | 2009-12-31 ✅ Patent 8,288,740 granted on 2012-10-16Method for preparing specimens for atom probe analysis and specimen assemblies made thereby
#18 | 2009-12-03 ✅ Patent 7,935,937 granted on 2011-05-03Method of forming TEM sample holder
#19 | 2009-09-10 ✅ Patent 8,394,454 granted on 2013-03-12Method and apparatus for precursor delivery system for irradiation beam instruments
#20 | 2009-03-26 ✅ Patent 7,644,637 granted on 2010-01-12Method and apparatus for transfer of samples in a controlled environment
#21 | 2009-01-15 ✅ Patent 7,755,372 granted on 2010-07-13Method for automated stress testing of flip-chip packages
#22 | 2008-10-23 ✅ Patent 7,834,315 granted on 2010-11-16Method for STEM sample inspection in a charged particle beam instrument
#23 | 2007-04-26 ✅ Patent 7,395,727 granted on 2008-07-08Strain detection for automated nano-manipulation
#24 | 2006-09-21 ✅ Patent 7,446,542 granted on 2008-11-04Apparatus and method for automated stress testing of flip-chip packages
#25 | 2006-06-01 ✅ Patent 7,126,133 granted on 2006-10-24Kit for preparing a tem sample holder
#26 | 2006-06-01 ✅ Patent 7,126,132 granted on 2006-10-24Apparatus for preparing a TEM sample holder
#27 | 2006-06-01 ✅ Patent 7,315,023 granted on 2008-01-01Method of preparing a sample for examination in a TEM
#28 | 2006-06-01 ✅ Patent 7,115,882 granted on 2006-10-03TEM sample holder
#29 | 2006-05-04 ✅ Patent 7,414,252 granted on 2008-08-19Method and apparatus for the automated process of in-situ lift-out
#30 | 2006-05-04 ✅ Patent 7,208,724 granted on 2007-04-24Apparatus and method of detecting probe tip contact with a surface
#31 | 2006-02-02 ✅ Patent 7,381,971 granted on 2008-06-03Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope
#32 | 2006-01-26 ✅ Patent 7,053,383 granted on 2006-05-30Method and apparatus for rapid sample preparation in a focused ion beam microscope
Also check out Omniprobe, Inc.'s (Dallas, United States) applicant profile with 1 patent applications submitted.
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