Thomas M. Moore

Optical Probe System for the Electron Microscope

Coaxial fiber optical pyrometer with laser sample heater

Method and apparatus for alignment of optical and charged-particle beams in an electron microscope

Method for processing samples held by a nanomanipulator

Apparatus for precursor delivery system for irradiation beam instruments

Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images

Method for stem sample inspection in a charged particle beam instrument

Method for stem sample inspection in a charged particle beam instrument

Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument

METHOD OF ETCHING MATERIALS WITH ELECTRON BEAM AND LASER ENERGY

METHODS FOR ELECTRON-BEAM INDUCED DEPOSITION OF MATERIAL INSIDE ENERGETIC-BEAM MICROSCOPES

Single-channel optical processing system for energetic-beam microscopes

Method of forming TEM sample holder

Method and apparatus for precursor delivery system for irradiation beam instruments

Method and apparatus for transfer of samples in a controlled environment

Method for automated stress testing of flip-chip packages

Method for STEM sample inspection in a charged particle beam instrument

Strain detection for automated nano-manipulation

TEM sample holder and method of forming same

Apparatus and method for automated stress testing of flip-chip packages

Kit for preparing a tem sample holder

Apparatus for preparing a TEM sample holder

Method of preparing a sample for examination in a TEM

TEM sample holder

Method and apparatus for the automated process of in-situ lift-out

Multiple gas injection system for charged particle beam instruments

Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope

Method and apparatus for rapid sample preparation in a focused ion beam microscope