TOKYO SEIMITSU CO., LTD.

PROBE, AND SHAPE MEASURING DEVICE

#2 | 2026-01-15

US20260016400A1

MEASUREMENT DEVICE AND MEASUREMENT METHOD

#3 | 2025-12-18

US20250383197A1

SPECTROSCOPE AND OPTICAL DEVICE

#4 | 2025-09-25

US20250301536A1

TEMPERATURE CONTROL DEVICE, TEMPERATURE CONTROL METHOD, PROGRAM, PROBER, AND LEARNING MODEL GENERATING METHOD

#5 | 2025-09-25

US20250297968A1

INSPECTION DEVICE AND INSPECTION METHOD

#6 | 2025-09-04

US20250276417A1

MACHINING DEVICE

#7 | 2025-07-17

US20250233438A1

CHARGE/DISCHARGE TEST SYSTEM AND CONTROL METHOD FOR CHARGE/DISCHARGE TEST SYSTEM

#8 | 2025-07-17

US20250231246A1

CHARGE/DISCHARGE TEST SYSTEM

#9 | 2025-06-19 ✅ Patent 12,456,217 granted on 2025-10-28

US20250200777A1

SHAPE MEASUREMENT DEVICE

#10 | 2025-01-30 ✅ Patent 12,387,966 granted on 2025-08-12

US20250038035A1

WAFER CHUCK, TEMPERATURE CONTROL SYSTEM, AND TEMPERATURE CONTROL METHOD

#11 | 2025-01-30

US20250035426A1

THREE-DIMENSIONAL SHAPE MEASURING DEVICE AND THREE-DIMENSIONAL SHAPE MEASURING METHOD

#12 | 2025-01-16

US20250022744A1

EXPANSION RETAINING RING

#13 | 2025-01-16

US20250018605A1

DICING DEVICE

#14 | 2025-01-16

US20250018504A1

LASER OPTICAL SYSTEM AND ADJUSTMENT METHOD THEREFOR, AND LASER MACHINING DEVICE AND METHOD

#15 | 2025-01-16

US20250018502A1

LASER LIGHT CORRECTION METHOD

#16 | 2025-01-16

US20250018501A1

METHOD AND DEVICE FOR ADJUSTING OPTICAL AXIS OF LASER LIGHT

#17 | 2025-01-09

US20250012563A1

SURFACE SHAPE MEASUREMENT DEVICE AND SURFACE SHAPE MEASUREMENT METHOD

#18 | 2024-12-26

US20240426600A1

SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD

#19 | 2024-12-05 ✅ Patent 12,463,068 granted on 2025-11-04

US20240404847A1

SHEET RELEASE APPARATUS

#20 | 2024-12-05 ✅ Patent 12,528,663 granted on 2026-01-20

US20240400339A1

WORKPIECE PROCESSING APPARATUS

#21 | 2024-11-28

US20240393104A1

SURFACE SHAPE MEASURING DEVICE AND SURFACE SHAPE MEASUREMENT METHOD

#22 | 2024-11-28 ✅ Patent 12,656,100 granted on 2026-06-16

US20240393098A1

ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE

#23 | 2024-11-28

US20240393097A1

THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITION ADJUSTMENT METHOD THEREFOR, AND MEASUREMENT MODE SWITCHING METHOD THEREFOR

#24 | 2024-11-21 ✅ Patent 12,281,956 granted on 2025-04-22

US20240385067A1

Automatic balancer

#25 | 2024-11-07 ✅ Patent 12,282,061 granted on 2025-04-22

US20240369623A1

Wafer test system, probe card replacing method, and prober

#26 | 2024-11-07 ✅ Patent 12,173,939 granted on 2024-12-24

US20240369270A1

Mechanical engineering

Chiller system

#27 | 2024-10-03

US20240329617A1

MACHINING STATE DETECTION APPARATUS, MACHINING STATE DETECTION METHOD, PROGRAM, DICING APPARATUS, AND LEARNING MODEL GENERATION METHOD

#28 | 2024-10-03

US20240328769A1

GROOVE SHAPE MEASURING METHOD AND GROOVE SHAPE MEASURING APPARATUS

#29 | 2024-09-26 ✅ Patent 12,399,215 granted on 2025-08-26

US20240319264A1

HOUSING AND PROBER

#30 | 2024-09-12 ✅ Patent 12,379,272 granted on 2025-08-05

US20240302232A1

APPARATUS AND METHOD FOR DETECTING TENSION ABNORMALITY IN DICING TAPE

#31 | 2024-08-08

US20240261941A1

WORKPIECE SUCTION DEVICE

#32 | 2024-06-06

US20240183645A1

MEASUREMENT PROGRAM GENERATION METHOD AND THREE-DIMENSIONAL COORDINATE MEASURING MACHINE

#33 | 2024-05-30 ✅ Patent 12,447,507 granted on 2025-10-21

US20240173750A1

WAFER BACK SURFACE CLEANING DEVICE

#34 | 2024-04-18 ✅ Patent 12,466,687 granted on 2025-11-11

US20240124258A1

TAPE AFFIXING SYSTEM

#35 | 2024-03-21 ✅ Patent 12,007,413 granted on 2024-06-11

US20240094254A1

Prober controlling device, prober controlling method, and prober

#36 | 2024-03-14 ✅ Patent 12,368,064 granted on 2025-07-22

US20240087922A1

TAPE AFFIXING APPARATUS

#37 | 2024-03-07 ✅ Patent 12,474,164 granted on 2025-11-18

US20240077304A1

ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS

#38 | 2024-02-29

US20240068798A1

MEASURING DEVICE AND MACHINING DEVICE

#39 | 2024-01-11 ✅ Patent 12,298,121 granted on 2025-05-13

US20240011767A1

Calibration method for optical rotation probe

#40 | 2023-12-28 ✅ Patent 11,940,463 granted on 2024-03-26

US20230417797A1

Particle measurement device, three-dimensional shape measurement device, prober device, particle measurement system, and particle measurement method

#41 | 2023-12-14 ✅ Patent 12,588,458 granted on 2026-03-24

US20230402301A1

TAPE AFFIXING APPARATUS AND TAPE MAGAZINE

#42 | 2023-08-24 ✅ Patent 12,160,663 granted on 2024-12-03

US20230269470A1

Image processing device, image processing method, and three-dimensional shape measuring device

#43 | 2023-08-24

US20230264292A1

LASER MACHINING APPARATUS AND LASER MACHINING METHOD

#44 | 2023-05-18 ✅ Patent 12,605,788 granted on 2026-04-21

US20230150054A1

LASER MACHINING DEVICE, WAFER PROCESSING SYSTEM, AND METHOD FOR CONTROLLING LASER MACHINING DEVICE

#45 | 2023-04-27

US20230125120A1

SPHERICAL ABERRATION ADJUSTMENT METHOD FOR OBJECTIVE OPTICAL SYSTEM, OBJECTIVE OPTICAL SYSTEM AND LASER MACHINING DEVICE

#46 | 2023-03-02 ✅ Patent 12,373,974 granted on 2025-07-29

US20230064860A1

SHAPE MEASUREMENT DEVICE AND METHOD FOR CONTROLLING SAME

#47 | 2023-02-16 ✅ Patent 11,859,969 granted on 2024-01-02

US20230052870A1

Measurement device

#48 | 2023-01-26 ✅ Patent 11,740,074 granted on 2023-08-29

US20230028748A1

Inner surface shape measurement device, and alignment method for inner surface shape measurement device

#49 | 2023-01-05 ✅ Patent 11,740,072 granted on 2023-08-29

US20230003510A1

Inner surface shape measurement device, and alignment method and magnification calibration method for inner surface shape measurement device

#50 | 2022-11-17

US20220362958A1

DICING DEVICE, AND BLADE HEIGHT CORRECTION METHOD AND WORKPIECE PROCESSING METHOD FOR DICING DEVICE

#51 | 2022-11-10 ✅ Patent 11,656,068 granted on 2023-05-23

US20220357143A1

Workpiece diameter measurement method and workpiece circularity measurement machine

#52 | 2022-09-01 ✅ Patent 11,525,660 granted on 2022-12-13

US20220276037A1

Surface shape measuring device and surface shape measuring method

#53 | 2021-09-23 ✅ Patent 11,365,959 granted on 2022-06-21

US20210293519A1

Three-dimensional measuring system, and three-dimensional measuring method

#54 | 2021-09-16 ✅ Patent 11,397,073 granted on 2022-07-26

US20210285751A1

Displacement detector, surface shape measuring apparatus, and roundness measuring apparatus

#55 | 2021-09-16 ✅ Patent 11,571,785 granted on 2023-02-07

US20210283745A1

Workpiece processing device and method

#56 | 2021-09-09 ✅ Patent 11,260,470 granted on 2022-03-01

US20210276121A1

Laser machining device and control method therefor

#57 | 2021-08-12 ✅ Patent 11,964,361 granted on 2024-04-23

US20210245324A1

Workpiece processing device and method

#58 | 2021-06-17 ✅ Patent 11,472,055 granted on 2022-10-18

US20210178621A1

Workpiece processing device and method

#59 | 2021-06-17 ✅ Patent 11,504,869 granted on 2022-11-22

US20210178550A1

Workpiece processing device and method

#60 | 2021-01-07 ✅ Patent 10,950,471 granted on 2021-03-16

US20210005476A1

Laser machining device and laser machining method

#61 | 2020-10-01 ✅ Patent 11,025,151 granted on 2021-06-01

US20200313535A1

Linear drive mechanism and shape measuring machine

#62 | 2020-08-20 ✅ Patent 11,075,071 granted on 2021-07-27

US20200266047A1

Method for processing wafer

#63 | 2020-04-23 ✅ Patent 11,067,382 granted on 2021-07-20

US20200124400A1

Three-dimensional coordinate measurement apparatus

#64 | 2020-04-23 ✅ Patent 11,458,594 granted on 2022-10-04

US20200122297A1

Method for manufacturing cutting blade, and cutting blade

#65 | 2020-04-16 ✅ Patent 11,065,722 granted on 2021-07-20

US20200114473A1

Laser processing apparatus and laser processing method

#66 | 2019-12-05 ✅ Patent 10,724,841 granted on 2020-07-28

US20190368855A1

Detector, surface property measuring machine, and roundness measuring machine

#67 | 2019-11-28 ✅ Patent 10,571,238 granted on 2020-02-25

US20190360793A1

Detector for surface measuring device

#68 | 2019-07-11 ✅ Patent 11,141,830 granted on 2021-10-12

US20190210178A1

Method for setting processing device

#69 | 2019-01-24 ✅ Patent 10,564,185 granted on 2020-02-18

US20190025342A1

Prober and prober operation method

#70 | 2019-01-17 ✅ Patent 10,510,574 granted on 2019-12-17

US20190019711A1

Prober

#71 | 2018-12-06 ✅ Patent 10,421,172 granted on 2019-09-24

US20180345439A1

Processing device

#72 | 2018-10-18 ✅ Patent 10,232,483 granted on 2019-03-19

US20180297165A1

Ultrasonic displacement sensor and workpiece identification apparatus including the same

#73 | 2018-09-06 ✅ Patent 10,416,228 granted on 2019-09-17

US20180252765A1

Prober

#74 | 2018-08-16 ✅ Patent 10,514,389 granted on 2019-12-24

US20180231582A1

Transfer unit and prober

#75 | 2018-08-16 ✅ Patent 10,173,296 granted on 2019-01-08

US20180229341A1

Grinding machine

#76 | 2018-08-02 ✅ Patent 10,507,561 granted on 2019-12-17

US20180215006A1

Grinding apparatus

#77 | 2018-05-31 ✅ Patent 10,663,283 granted on 2020-05-26

US20180149470A1

Three-dimensional coordinate measurement apparatus

#78 | 2018-05-31 ✅ Patent 10,041,779 granted on 2018-08-07

US20180149457A1

Surface shape measuring method, misalignment amount calculating method, and surface shape measuring device

#79 | 2018-01-18 ✅ Patent 10,338,101 granted on 2019-07-02

US20180017594A1

Prober

#80 | 2017-11-09 ✅ Patent 10,481,177 granted on 2019-11-19

US20170322236A1

Wafer inspection method

#81 | 2017-11-09 ✅ Patent 9,921,049 granted on 2018-03-20

US20170322016A1

Three-dimensional coordinate measurement apparatus

#82 | 2017-11-09 ✅ Patent 10,322,467 granted on 2019-06-18

US20170320165A1

Position detecting device and laser processing device

#83 | 2017-08-10 ✅ Patent 9,829,303 granted on 2017-11-28

US20170227346A1

Shape measuring apparatus

#84 | 2017-05-25 ✅ Patent 10,732,220 granted on 2020-08-04

US20170146595A1

Positioning and fixing device

#85 | 2017-01-12 ✅ Patent 9,869,715 granted on 2018-01-16

US20170010323A1

Semiconductor wafer inspection apparatus and semiconductor wafer inspection method

#86 | 2017-01-05 ✅ Patent 9,719,769 granted on 2017-08-01

US20170003110A1

Bidirectional displacement detector

#87 | 2016-12-22 ✅ Patent 9,685,355 granted on 2017-06-20

US20160372349A1

Laser dicing device and dicing method

#88 | 2016-12-08 ✅ Patent 9,874,429 granted on 2018-01-23

US20160356592A1

Three-dimensional coordinate measuring machine

#89 | 2016-09-15 ✅ Patent 9,574,908 granted on 2017-02-21

US20160265947A1

Angle measuring method and angle measuring system

#90 | 2016-06-09 ✅ Patent 9,581,424 granted on 2017-02-28

US20160161239A1

Roundness measuring apparatus

#91 | 2016-06-02

US20160153771A1

Shape Measuring Device

#92 | 2015-12-17 ✅ Patent 9,442,156 granted on 2016-09-13

US20150362553A1

Alignment support device and alignment support method for probe device

#93 | 2015-12-17 ✅ Patent 9,664,733 granted on 2017-05-30

US20150362552A1

Probe device for testing electrical characteristics of semiconductor element

#94 | 2015-10-15 ✅ Patent 9,372,099 granted on 2016-06-21

US20150292914A1

Angle measuring method and angle measuring system

#95 | 2015-04-23 ✅ Patent 9,983,256 granted on 2018-05-29

US20150109625A1

Probing device for electronic device and probing method

#96 | 2014-10-09 ✅ Patent 9,134,145 granted on 2015-09-15

US20140300903A1

Angle measuring method and angle measuring system

#97 | 2012-07-19 ✅ Patent 8,949,071 granted on 2015-02-03

US20120185210A1

Circularity measuring apparatus and measurement value correcting method for circularity measuring method

#98 | 2011-07-07 ✅ Patent 8,299,397 granted on 2012-10-30

US20110163079A1

Laser dicing apparatus and dicing method

#99 | 2011-03-03 ✅ Patent 8,116,893 granted on 2012-02-14

US20110054657A1

Dicing method

#100 | 2011-02-03 ✅ Patent 8,440,040 granted on 2013-05-14

US20110024020A1