TERA PROBE, INC.

City:

YOKOHAMA

Country:

Japan

Published Applications:

Last publication date:

2016-08-11

Patent Grants:

Last grant date:

2017-03-28

Top Inventors for applications by TERA PROBE, INC.

These are the the leading inventors for applications assigned to TERA PROBE, INC.:

Ichiro Mihara 2 Tachikawa, Japan
Aiko Mizusawa 2 Kunitachi-shi, Japan
Osamu Okada 2 Hamura, Japan
Osamu Okada 2 Hamura-shi, Japan

Ichiro Mihara 2 Tachikawa-shi, Japan
Aiko Mizusawa 2 Kunitachi, Japan
Takeshi Wakabayashi 2 Sayama-shi, Japan
Takeshi Wakabayashi 2 Sayama, Japan

Ichiro Kono 1 Higashiyamato, Japan
Ichiro KONO 1 Tokyo, Japan
Ichiro KONO 1 Higashiyamato-shi, Japan
Junji Shiota 1 Hamura, Japan

Tsutomu MIYAMOTO 1 Tama-shi, Japan
Norihiko KANEKO 1 Fussa-shi, Japan
Junji SHIOTA 1 Tokyo, Japan
Nobuatsu SEKITA 1 Fuchu-shi, Japan

Recent patent applications by TERA PROBE, INC.

TERA PROBE, INC. based in YOKOHAMA, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2016-08-11 ✅ Patent 9,607,861 granted on 2017-03-28

US20160233111A1

Electricity

Semiconductor device and method of manufacturing the same

#2 | 2015-11-05 ✅ Patent 9,640,478 granted on 2017-05-02

US20150318244A1

Electricity

Semiconductor device having low dielectric insulating film and manufacturing method of the same

#3 | 2015-08-20

US20150235845A1

Electricity

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#4 | 2015-01-08 ✅ Patent 9,070,638 granted on 2015-06-30

US20150008579A1

Electricity

Semiconductor device having low dielectric insulating film and manufacturing method of the same

AssigneeID:

85793 ⎘