ClassID:

83798

B81B7/0054 - CPC Classification

Classification description:

Microstructural systems; Auxiliary parts of microstructural devices or systems; Packages or encapsulation for reducing stress inside of the package structure between other parts not provided for in  - 

Recent Application in this class:
#1
20260028224
2026-01-29

Embedded Digital Sensor Structure

#2
20250313454
2025-10-09

METHODS AND APPARATUS FOR ELECTRONIC DEVICE PACKAGING

#3
20250178887
2025-06-05

MICROELECTROMECHANICAL COMPONENT WITH A METAL STANDOFF

#4
20240228265
2024-07-11

METHODS AND APPARATUS FOR SEMICONDUCTOR PACKAGES WITH WINDOW ASSEMBLIES

#5
20240166496
2024-05-23

MEMS switch and manufacture method

#6
20240079350
2024-03-07

ELECTRONIC COMPONENT WITH REDUCED STRESS

#7
20230174373
2023-06-08

SEALED CAVITY STRUCTURE AND METHOD FOR MANUFACTURING SEALED CAVITY STRUCTURE

#8
20230126914
2023-04-27

METHODS AND APPARATUS FOR ELECTRONIC DEVICE PACKAGING

#9
20220009770
2022-01-13

MEMS device with a diaphragm having a net compressive stress

#10
20200354214
2020-11-12

Structures for packaging stress-sensitive micro-electro-mechanical system stacked onto electronic circuit chip

#11
20190302140
2019-10-03

Device with terminal-containing sensor

#12
20190284043
2019-09-19

Micromechanical component

#13
20190169019
2019-06-06

Structures for packaging stress-sensitive micro-electro-mechanical system stacked onto electronic circuit chip

#14
20180148321
2018-05-31

Microelectromechanical sensor device with reduced stress-sensitivity and corresponding manufacturing process

#15
20180127266
2018-05-10

Structures for packaging stress-sensitive micro-electro-mechanical system stacked onto electronic circuit chip

#16
20180011124
2018-01-11

Sensor with symmetrically embedded sensor elements

#17
20170369306
2017-12-28

Stress decoupled piezoresistive relative pressure sensor and method for manufacturing the same

#18
20170313578
2017-11-02

Method and structure of MEMS PLCSP fabrication

#19
20170305741
2017-10-26

Deformable apparatus and method

#20
20170167933
2017-06-15

Pressure sensor

#21
20170073220
2017-03-16

Microelectromechanical sensor device with reduced stress-sensitivity and corresponding manufacturing process

#22
20160264402
2016-09-15

Structure and method to mitigate soldering offset for wafer-level chip scale package (WLCSP) applications

#23
20150364363
2015-12-17

VHF etch barrier for semiconductor integrated microsystem

#24
20150344296
2015-12-03

Encapsulated component comprising a MEMS component and method for the production thereof

#25
20150298969
2015-10-22

Method of protecting microelectro mechanical system device

#26
20150266728
2015-09-24

Stress buffer layer for integrated microelectromechanical systems (MEMS)

#27
20150251901
2015-09-10

Semiconductor arrangement with stress release and thermal insulation

#28
20150251900
2015-09-10

Semiconductor arrangement with stress release configuration

#29
20150122042
2015-05-07

Pressure sensor with deformable membrane and method of manufacture

#30
20150122038
2015-05-07

Reduced stress pressure sensor

#31
20150102390
2015-04-16

Integrated CMOS back cavity acoustic transducer and the method of producing the same

#32
20140284729
2014-09-25

Electrical component and method of manufacturing the same

#33
20140055971
2014-02-27

Surface mount actuator

#34
20140008737
2014-01-09

Cantilever packages for sensor MEMS (micro-electro-mechanical system)

#35
20130119493
2013-05-16

Microelectro mechanical system encapsulation scheme

#36
20130113056
2013-05-09

Dynamic quantity sensor

#37
20130113055
2013-05-09

Sensor device manufacturing method and sensor device

#38
20130077948
2013-03-28

Surface mount actuator

#39
20120175747
2012-07-12

MEMS device assembly and method of packaging same

#40
20100308431
2010-12-09

Mechanical isolation for MEMS electrical contacts

#41
20100271787
2010-10-28

Sensor module

#42
20100148330
2010-06-17

Leadless package housing having a symmetrical construction with deformation compensation

#43
20090315127
2009-12-24

Isolation channel improving measurement accuracy of MEMS devices

#44
20090206444
2009-08-20

Integrated semiconductor device

#45
20090127697
2009-05-21

Housing with a Cavity for a Mechanically-Sensitive Electronic Component and Method for Production

#46
20090124074
2009-05-14

Wafer level sensing package and manufacturing process thereof

#47
20090121299
2009-05-14

Wafer level sensing package and manufacturing process thereof

#48
18960184
2025-09-09

Embedded digital sensor structure

#49
14052509
2014-12-30

Method of improving MEMS microphone mechanical stability