108220 ⎘
Special methods for preparing compositions containing mixtures of detergents ; Methods for using cleaning compositions; Special cleaning or washing methods characterised by the objects to be cleaned "Hard" surfaces Electronic devices, e.g. PCBs or semiconductors
Composition for removing silicone resins and method of thinning substrate by using the same
#302Post chemical mechanical polishing formulations and method of use
#303TiN hard mask and etch residue removal
#304INTELLIGENT WATER CONTROL EQUIPMENT FOR INTERMITTENTLY COUNTERCURRENT RINSING PLATING ARTICLES AND AUTOMATIC WATER CONTROL METHOD THEREOF
#305Photoresist stripper composition for manufacturing liquid crystal display
#306Cleaning formulations
#307Method of manufacturing a semiconductor device and a cleaning composition for an adhesive layer
#308SUPERCRITICAL SYNTHETIC Y-GRADE NGL
#309Post-etch residue removal for advanced node beol processing
#310Defect reduction rinse solution containing ammonium salts of sulfoesters
#311Cleaning compositions and methods of use therefor
#312Composition for removing resist
#313Cleaning liquid and method for manufacturing the same
#314Cleaning liquid, anticorrosion agent, and method for manufacturing the same
#315Method for cleaning bonding interface before bonding
#316Composition and method for removing residue from chemical-mechanical planarization substrate
#317Cleaning agent composition for glass hard disk substrate
#318Cleaning compositions for removing post etch residue
#319Methods and apparatus for detection and analysis of nanoparticles from semiconductor chamber parts
#320METHODS AND APPARATUS FOR DETECTION AND ANALYSIS OF NANOPARTICLES FROM SEMICONDUCTOR CHAMBER PARTS
#321Apparatus and method for treating substrate
#322Treatment composition for chemical mechanical polishing, chemical mechanical polishing method, and cleaning method
#323Cleaning formulations
#324Cleaning formulations for removing residues on semiconductor substrates
#325Anhydrous substrate cleaning composition, substrate treating method, and substrate treating apparatus
#326Cleaning solution and cleaning method for material comprising carbon-incorporated silicon oxide for use in recycling wafer
#327Compositions and methods that promote charge complexing copper protection during low pKa driven polymer stripping
#328Composition for removing photoresist residue and/or polymer residue
#329SEPARATING METHOD OF FLUORINE-CONTAINING SOLVENT, REMOVING METHOD OF FLUORINE-CONTAINING SOLVENT CONTAMINANT, AND APPARATUS THEREFORE
#330Metal-compound-removing solvent and method in lithography
#331Metal-compound-removing solvent and method in lithography
#332Post chemical mechanical polishing formulations and method of use
#333CLEANING COMPOSITION FOR REMOVING OXIDE AND METHOD OF CLEANING USING THE SAME
#334Substrate treating apparatus and substrate treating method
#335Stripping compositions for removing photoresists from semiconductor substrates
#336Liquid particle counting of semiconductor component parts
#337Semiconductor treatment composition and treatment method
#338Substrate cleaning method and substrate cleaning apparatus
#339Cleaning solution, method of removing a removal target and method of etching a substrate using said cleaning solution
#340Cleaner composition and preparation of thin substrate
#341Cleaner composition and preparation of thin substrate
#342Semiconductor element cleaning solution that suppresses damage to tungsten-containing materials, and method for cleaning semiconductor element using same
#343SUPERCRITICAL Y-GRADE NGL
#344Cleaning method and laminate of aluminum nitride single-crystal substrate
#345Compositions and methods for selectively etching titanium nitride
#346Cleaning liquid and method for cleaning
#347Cleaning composition for semiconductor substrate and cleaning method
#348Semiconductor element cleaning solution that suppresses damage to cobalt, and method for cleaning semiconductor element using same
#349Semiconductor element cleaning solution that suppresses damage to tantalum-containing materials, and cleaning method using same
#350COMPOSITIONS CONTAINING FLUORINE SUBSTITUTED OLEFINS AND METHODS AND SYSTEMS USING SAME
#351Composition for resist patterning and method for forming pattern using same
#352CLEANING FLUIDS AND METHODS OF CLEANING MICROFLUIDIC CHANNELS
#353Functional water producing apparatus and functional water producing method
#354Substrate processing apparatus and method of cleaning substrate processing apparatus
#355Anti-reflective coating cleaning and post-etch residue removal composition having metal, dielectric and nitride compatibility
#356Aqueous and semi-aqueous cleaners for the removal of post-etch residues with tungsten and cobalt compatibility
#357Developer for lithography
#358Method of polishing silicon wafer and method of producing epitaxial wafer
#359Rinse solution and method of fabricating integrated circuit device by using the same
#360Liquid composition for cleaning semiconductor device, and method for cleaning semiconductor device
#361Coated probe tips for plunger pins of an integrated circuit package test system
#362Substrate treatment apparatus and substrate treatment method
#363Substrate treating method for a substrate treating apparatus that carries out etching treatment of substrates
#364STABILIZATION OF TRIS(2 HYDROXYETHYL)METHYLAMMONIUM HYDROXIDE AGAINST DECOMPOSITION WITH DIALKYHYDROXYLAMINE
#365Cleaning composition following CMP and methods related thereto
#366Substrate detergent composition
#367Stripper composition for removing photoresists and method for stripping photoresists using the same
#368Surfactants and methods of making and using same
#369LIQUID COMPOSITION FOR CLEANING SEMICONDUCTOR DEVICE, METHOD FOR CLEANING SEMICONDUCTOR DEVICE, AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
#370METHOD OF CLEANING SUBSTRATE AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
#371TiN hard mask and etch residual removal
#372Substrate processing method and substrate processing apparatus
#373Cleaning formulation for removing residues on surfaces
#374Liquid composition for cleaning semiconductor device, method for cleaning semiconductor device, and method for fabricating semiconductor device
#375Small thermal mass pressurized chamber
#376Substrate processing apparatus
#377NEW ANTIOXIDANTS FOR POST-CMP CLEANING FORMULATIONS
#378Method for treating a semiconductor device
#379METHOD AND APPARATUS FOR DRYING SEMICONDUCTOR SUBSTRATES USING LIQUID CARBON DIOXIDE
#380METHOD AND COMPOSITION FOR REMOVING RESIST, ETCH RESIDUE, AND COPPER OXIDE FROM SUBSTRATES HAVING COPPER, METAL HARDMASK AND LOW-K DIELECTRIC MATERIAL
#381Method for treating substrates with an aqueous liquid medium exposed to UV-radiation
#382Cleaning formulations
#383TiN pull-back and cleaning composition
#384Compositions containing chlorofluoroolefins or fluoroolefins
#385SEMICONDUCTOR CLEANING PROCESS SYSTEM AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES
#386Gigasonic cleaning techniques
#387Developer for lithography
#388Wet clean process for removing CHFetch residue
#389Substrate cleaning method and substrate cleaning apparatus
#390Photoresist cleaning composition used in photolithography and a method for treating substrate therewith
#391Method for cleaning lanthanum gallium silicate wafer
#392Cleaning composition for photolithography and method of forming photoresist pattern using the same
#393Washing hydrogen water producing method and producing apparatus
#394Semiconductor element cleaning liquid and cleaning method
#395Solvent-Based Mitigating Of Organic Contaminants In A Hard Disk Drive
#396Substrate processing apparatus and method for detecting clogging of exhaust pipe in substrate processing apparatus
#397Liquid chemical for forming protecting film
#398CLEANING SOLUTION, CLEANING FACILITY AND METHOD OF CLEANING MOUNT SUBSTRATE
#399Surfactants and methods of making and using same
#400Cleaner composition
#401Substrate processing method
#402Non-amine post-CMP compositions and method of use
#403Apparatus and method for treating substrate
#404POST CHEMICAL MECHANICAL POLISHING FORMULATIONS AND METHOD OF USE
#405METHOD TO CLEAN SURFACES EXPOSED TO PLASMA
#406Ternary compositions of methyl perfluoroheptene ethers and trans-1,2-dichloroethylene, and uses thereof
#407Removal composition for selectively removing hard mask and methods thereof
#408Composition for treating surface of substrate, method and device
#409Liquid composition for removing titanium nitride, semiconductor-element cleaning method using same, and semiconductor-element manufacturing method
#410Cleaning agent for semiconductor substrates and method for processing semiconductor substrate surface
#411Removal composition for selectively removing hard mask and methods thereof
#412Method for cleaning wafer
#413Semiconductor substrate treatment liquid, treatment method, and method for manufacturing semiconductor-substrate product using these
#414Method and composition for removing resist, etch residue, and copper oxide from substrates having copper, metal hardmask and low-k dielectric material
#415METHOD AND COMPOSITION FOR SELECTIVELY REMOVING METAL HARDMASK AND OTHER RESIDUES FROM SEMICONDUCTOR DEVICE SUBSTRATES COMPRISING LOW-K DIELECTRIC MATERIAL AND COPPER
#416NON-AMINE POST-CMP COMPOSITION AND METHOD OF USE
#417Cleaning composition
#418Cleaning composition and method of manufacturing metal wiring using the same
#419Photoresist stripping using intelligent liquids
#420Thinner composition
#421Liquid chemical for forming water repellent protecting film, and process for cleaning wafers using the same
#422Cleaner composition for process of manufacturing semiconductor and display
#423Solutions and processes for removing substances from substrates
#424Cleaning composition and method for cleaning semiconductor wafers after CMP
#425Pre-fill wafer cleaning formulation
#426Stripping compositions for removing photoresists from semiconductor substrates
#427Stripping compositions having high WN/W etching selectivity
#428Cleaning composition for removing oxide and method of cleaning using the cleaning composition
#429Semi-aqueous photoresist or semiconductor manufacturing residue stripping and cleaning composition with improved silicon passivation
#430Method for manufacturing semiconductor device
#431Stripping and Cleaning Compositions for Removal of Thick Film Resist
#432PHOTORESIST REMOVAL
#433Liquid chemical for forming protecting film
#434Cleaning composition after chemical mechanical polishing of organic film and cleaning method using the same
#435Compositions and methods for selectively etching titanium nitride
#436COMPOSITIONS AND METHODS FOR REMOVING CERIA PARTICLES FROM A SURFACE
#437Cleaning liquid for lithography and method for cleaning substrate
#438Methods of manufacturing integrated circuit devices by using photomask cleaning compositions
#439Compositions for removing residues and related methods
#440Cleaning composition and method for semiconductor device fabrication
#441Method for processing an inner wall surface of a micro vacancy
#442COPPER CLEANING AND PROTECTION FORMULATIONS
#443Substrate cleaning method and substrate cleaning apparatus
#444Method of fabricating semiconductor device
#445Spot heater and device for cleaning wafer using the same
#446CLEANING AGENT FOR METAL WIRING SUBSTRATE, AND METHOD FOR CLEANING SEMICONDUCTOR SUBSTRATE
#447Cleaning method and composition in photolithography
#448Pattern forming method, active light sensitive or radiation sensitive resin composition, resist film, method for manufacturing electronic device, and electronic device
#449Resist removing liquid, resist removal method using same and method for producing photomask
#450CLEANING COMPOSITION FOR SEMICONDUCTOR SUBSTRATE AND CLEANING METHOD
#451COPPER CLEANING AND PROTECTION FORMULATIONS
#452Post-CMP removal using compositions and method of use
#453Photoresist layer and method
#454Copper corrosion inhibition system
#455Photoresist and method of manufacture
#456STRIPPING SOLUTION THAT IS USED FOR REMOVAL OF TITANIUM OR A TITANIUM COMPOUND AND METHOD OF WIRING FORMATION
#457Thinner composition for improving coating and removing performance of resist
#458AQUEOUS CLEANING COMPOSITION CONTAINING COPPER-SPECIFIC CORROSION INHIBITOR FOR CLEANING INORGANIC RESIDUES ON SEMICONDUCTOR SUBSTRATE
#459Compositions for cleaning III-V semiconductor materials and methods of using same
#460Cleaning composition and cleaning method
#461Use of compositions comprising a surfactant and a hydrophobizer for avoiding anti pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below
#462Substrate cleaning liquid and substrate cleaning method
#463Cleaning solution composition and method of cleaning semiconductor device using the same
#464Composition for removing and preventing formation of oxide on the surface of metal wire
#465Cleaning solution, cleaning facility and method of cleaning mount substrate
#466Chemical-liquid mixing method and chemical-liquid mixing apparatus
#467Process for manufacturing resist composition and patterning process
#468Compositions and methods of rinsable primers used to aid in the removal of temporary functional coatings
#469Treating solution for electronic parts, and process for producing electronic parts
#470Substrate liquid processing apparatus and method, and computer-readable recording medium with substrate liquid processing program recorded therein
#471Slurry for chemical-mechanical polishing of metals and use thereof
#472Photoresist system and method
#473Cleaning agent for semiconductor provided with metal wiring
#474Particle removal from electrochromic films using non-aqueous fluids
#475Cleaning composition, cleaning process, and process for producing semiconductor device
#476Metal-safe solid form aqueous-based compositions and methods to remove polymeric materials in electronics manufacturing
#477PROCESSES AND SOLUTIONS FOR SUBSTRATE CLEANING AND ELECTROLESS DEPOSITION
#478COMPOSITION FOR REMOVING SUBSTANCES FROM SUBSTRATES
#479Process for treating fluid
#480Cleaning liquid for semiconductor elements and cleaning method using same
#481Water-repellent protective film, and chemical solution for forming protective film
#482Composition for titanium nitride hard mask and etch residue removal
#483Compositions containing chlorofluoroolefins or fluoroolefins
#484CLEANING COMPOSITION FOR REMOVING ORGANIC MATERIAL AND METHOD OF FORMING SEMICONDUCTOR DEVICE USING THE COMPOSITION
#485Cleaning fluid for semiconductor, and cleaning method using the same
#486Cleaning formulation for removing residues on surfaces
#487Cleaning formulation for removing residues on surfaces
#488Compositions for anti pattern collapse treatment comprising gemini additives
#489Cleaning liquid composition, method for cleaning semiconductor element, and method for manufacturing semiconductor element
#490ETCHANT, PREPARATION THEREOF AND METHOD OF USING THE SAME IN THE CLEANING PROCESS
#491Cleaning agent for semiconductor substrates and method for processing semiconductor substrate surface
#492Cleaning composition and method of manufacturing metal wiring using the same
#493PHOTORESIST AND POST ETCH RESIDUE CLEANING SOLUTION
#494Substrate cleaning method, substrate cleaning system, and memory medium
#495System and method for enhanced removal of metal hardmask using ultra violet treatment
#496Reconfigurable surfaces for information security and protection of physical biometrics
#497UNIVERSAL POLISHING SOLUTIONS
#498Wet clean process for removing CHFetch residue
#499AQUEOUS CLEAN SOLUTION WITH LOW COPPER ETCH RATE FOR ORGANIC RESIDUE REMOVAL IMPROVEMENT
#500Wafer cleaning formulation
#501Cleaning formulations for removing residues on surfaces
#502Method for manufacturing semiconductor device
#503Aqueous cleaning techniques and compositions for use in semiconductor device manufacture
#504Aqua regia and hydrogen peroxide HCL combination to remove Ni and NiPt residues
#505Silicon wafer cleaning agent
#506Method for manufacturing a resist composition
#507Aqueous solution and process for removing substances from substrates
#508Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition
#509METHODS FOR THE SELECTIVE REMOVAL OF ASHED SPIN-ON GLASS
#510Glass-electrode responsive-glass cleaning liquid and method for cleaning glass-electrode responsive-glass
#511Substrate processing method and substrate processing apparatus
#512POST-CMP FORMULATION HAVING IMPROVED BARRIER LAYER COMPATIBILITY AND CLEANING PERFORMANCE
#513Photoresist stripping and cleaning composition, method of its preparation and its use
#514Post chemical-mechanical-polishing (post-CMP) cleaning composition comprising a specific sulfur-containing compound and a sugar alcohol or a polycarboxylic acid
#515Cleaning method for semiconductor device fabrication
#516Oxidizing aqueous cleaner for the removal of post-etch residues
#517Liquid chemical for forming protecting film
#518Cleaning liquid for semiconductor device and method for cleaning substrate for semiconductor device
#519Non-amine post-CMP composition and method of use
#520Silicone solvent
#521Rinse liquid for insulating film and method of rinsing insulating film
#522Label sheet for cleaning and conveying member having cleaning function
#523Oxidizing bleach composition
#524Compositions containing chlorfluoroolefins or fluoroolefins
#525Systems and methods for drying a rotating substrate
#526Portable sonic particle removal tool with a chemically controlled working fluid
#527Microelectronic substrate cleaning compositions having copper/azole polymer inhibition
#528Semi-aqueous polymer removal compositions with enhanced compatibility to copper, tungsten, and porous low-K dielectrics
#529Apparatus and method for cleaning semiconductor substrate
#530Enhanced cleaning process of chamber used plasma spray coating without damaging coating
#531Cleaning composition and method for semiconductor device fabrication
#532Photoresist removal
#533Antioxidants for post-CMP cleaning formulations
#534Peeling liquid for a resist
#535Methods and compositions for removal of metal hardmasks
#536Method for wafer dicing and composition useful thereof
#537Apparatus and method of cleaning wafers
#538Dynamic multi-purpose composition for the removal of photoresists and method for its use
#539Process and composition for removing substances from substrates
#540Cleaning composition, cleaning process, and process for producing semiconductor device
#541Cleaning composition and process for cleaning semiconductor devices and/or tooling during manufacturing thereof
#542Method of fabricating semiconductor cleaners
#543Cleaning composition and cleaning method using the same
#544Compositions for use in semiconductor devices
#545Substrate treatment method and substrate treatment apparatus
#546Cleaning composition and method for cleaning a semiconductor device substrate after chemical mechanical polishing
#547Photovoltaic back contact
#548Maranagoni dry with low spin speed for charging release
#549Platen and adapter assemblies for facilitating silicon electrode polishing
#550Method for cleaning wafers using a polycarboxylate solution
#551Nonaqueous cleaning liquid and method for etching processing of silicon substrate
#552Aqueous, nitrogen-free cleaning composition and its use for removing residues and contaminants from semiconductor substrates suitable for manufacturing microelectronic devices
#553Photoresist stripping composition for manufacturing LCD
#554Metal conservation with stripper solutions containing resorcinol
#555Composition for and method of suppressing titanium nitride corrosion
#556Water-rich stripping and cleaning formulation and method for using same
#557Method for cleansing nanoimprinting molds
#558Use of surfactants having at least three short-chain perfluorinated groups RF for manufacturing integrated circuits having patterns with line-space dimensions below 50 NM
#559Aqueous cleaning techniques and compositions for use in semiconductor device manufacturing
#560Cleaning methods and compositions
#561Process for the removal of polymer thermosets from a substrate
#562Aluminum post-etch residue removal with simultaneous surface passivation
#563Compositions containing chlorofluoroolefins or fluoroolefins
#564Cleaning solution and damascene process using the same
#565Cleaning agent for semiconductor provided with metal wiring
#566Surface treatment composition and surface treatment method using same
#567Cleaning liquid for semiconductor device substrates and method of cleaning substrate for semiconductor devices
#568Dynamic multi-purpose compositions for the removal of photoresists and method for its use
#569Composition and method for removing photoresist and bottom anti-reflective coating for a semiconductor substrate
#570Systems and methods for drying a rotating substrate
#571Method of manufacturing semiconductor memory device
#572Aqueous alkaline cleaning compositions and methods of their use
#573Method and composition for removing resist, etch residue, and copper oxide from substrates having copper, metal hardmask and low-k dielectric material
#574Substrate cleaning method, substrate cleaning system and program storage medium
#575Cleaning liquid composition for electronic device
#576METHOD AND APPARATUS FOR DISPENSING AN INERT GAS
#577Method of cleaning copper material surfaces in ultra large scale integrated circuits after polishing the same
#578Photoresist and post etch residue cleaning solution
#579Process to remove Ni and Pt residues for NiPtSi applications using aqua regia with microwave assisted heating
#580Method of cleaning aluminum plasma chamber parts
#581Composition for stripping color filter and regeneration method of color filter using the same
#582Method and apparatus for processing wafer-shaped articles
#583METHOD AND APPARATUS FOR PROCESSING WAFER-SHAPED ARTICLES
#584Liquid concentrate for cleaning composition, cleaning composition and cleaning method
#585Slurry for chemical-mechanical polishing of metals and use thereof
#586Aqueous alkaline etching and cleaning composition and method for treating the surface of silicon substrates
#587Thinner composition for RRC process, apparatus for supplying the same, and thinner composition for EBR process
#588Aqueous cleaning composition containing copper-specific corrosion inhibitor for cleaning inorganic residues on semiconductor substrate
#589Cleaning formulations and method of using the cleaning formulations
#590COMPOSITION FOR CLEANING SUBSTRATES POST-CHEMICAL MECHANICAL POLISHING
#591Methods for cleaning a semiconductor substrate
#592METHOD AND COMPOSITION FOR REMOVING RESIST, ETCH RESIDUE, AND COPPER OXIDE FROM SUBSTRATES HAVING COPPER, METAL HARDMASK AND LOW-K DIELECTRIC MATERIAL
#593LIQUID COMPOSITION FOR CLEANING SEMICONDUCTOR SUBSTRATE AND METHOD OF CLEANING SEMICONDUCTOR SUBSTRATE USING THE SAME
#594HYDROCHLOROFLUOROOLEFIN-BASED CLEANING COMPOSITIONS
#595Nitrile and amidoxime compounds and methods of preparation for semiconductor processing
#596Cleaning composition for temporary wafer bonding materials
#597METHOD OF CLEANING WAFER SURFACES AFTER POLISHING ALUMINUM WIRINGS IN ULTRA LARGE SCALE INTEGRATED CIRCUITS
#598CMP Polishing Method, CMP Polishing Apparatus, and Process for Producing Semiconductor Device
#599Photoresist removal
#600MICROELECTRONIC SUBSTRATE CLEANING SYSTEMS WITH POLYELECTROLYTE AND ASSOCIATED METHODS