ClassID:

121238

C30B15/206 - CPC Classification

Classification description:

Single-crystal growth by pulling from a melt, e.g. Czochralski method; Controlling or regulating the thermal history of growing the ingot

Recent Application in this class:
#1
20250305181
2025-10-02

INGOT PULLER APPARATUS INCLUDING COOLING JACKET WITH VARYING SURFACE EMISSIVITY FOR CONTROLLED INGOT COOLING PROFILES

#2
20250305180
2025-10-02

INGOT PULLER APPARATUS INCLUDING MOVEABLE COOLING JACKET FOR CONTROLLED INGOT COOLING PROFILES

#3
20250129507
2025-04-24

METHODS AND SYSTEMS FOR CONTROLLING CRYSTAL GROWTH

#4
20250075367
2025-03-06

DUAL REFRIGERATION SYSTEMS FOR A MONO-CRYSTAL FURNACE AND METHODS FOR PULLING A MONO-CRYSTAL

#5
20250069945
2025-02-27

METHODS OF PREPARING SILICON-ON-INSULATOR STRUCTURES USING EPITAXIAL WAFERS

#6
20250034749
2025-01-30

AUTOMATIC DECISION-MAKING FOR PULLING

#7
20240401228
2024-12-05

ASYMMETRIC THERMAL FIELDS FOR EXCLUDING IMPURITIES IN SINGLE CRYSTAL MANUFACTURING DEVICE

#8
20240368806
2024-11-07

SINGLE-CRYSTAL SILICON CARBIDE WAFER, SINGLE-CRYSTAL SILICON CARBIDE INGOT, AND METHOD FOR PRODUCING SINGLE-CRYSTAL SILICON CARBIDE

#9
20240218556
2024-07-04

METHOD, APPARATUS, SYSTEM AND COMPUTER STORAGE MEDIUM OF CONTROLLING CRYSTAL GROWTH

#10
20240167193
2024-05-23

SYSTEMS AND METHODS FOR COOLING A CHUNK POLYCRYSTALLINE FEEDER

#11
20240141553
2024-05-02

VACANCY-RICH SILICON FOR USE WITH A GALLIUM NITRIDE EPITAXIAL LAYER

#12
20240093402
2024-03-21

SEMI-INSULATING GALLIUM ARSENIDE SINGLE CRYSTAL, PREPARATION METHOD AND GROWTH DEVICE THEREFOR

#13
20230374700
2023-11-23

Indium phosphide substrate, semiconductor epitaxial wafer, method for producing indium phosphide single-crystal ingot and method for producing indium phosphide substrate

#14
20230323564
2023-10-12

NITROGEN DOPED AND VACANCY DOMINATED SILICON INGOT AND THERMALLY TREATED WAFER FORMED THEREFROM HAVING RADIALLY UNIFORMLY DISTRIBUTED OXYGEN PRECIPITATION DENSITY AND SIZE

#15
20230287593
2023-09-14

INGOT GROWING APPARATUS AND METHOD THEREOF

#16
20230215759
2023-07-06

Radio frequency silicon on insulator structure with superior performance, stability, and manufacturability

#17
20230110359
2023-04-13

Method and System for Controlling Temperature during Crystal Growth

#18
20230062816
2023-03-02

Radio frequency silicon on insulator wafer platform with superior performance, stability, and manufacturability

#19
20220328636
2022-10-13

Semiconductor wafer of monocrystalline silicon and method of producing the semiconductor wafer

#20
20220205136
2022-06-30

CRYSTAL GROWTH METHOD AND CRYSTAL GROWTH APPARATUS

#21
20210340691
2021-11-04

CRYSTAL PULLING SYSTEM AND METHODS FOR PRODUCING MONOCRYSTALLINE INGOTS WITH REDUCED EDGE BAND DEFECTS

#22
20210198805
2021-07-01

Nitrogen doped and vacancy dominated silicon ingot and thermally treated wafer formed therefrom having radially uniformly distributed oxygen precipitation density and size

#23
20210098259
2021-04-01

Method for manufacturing ingot block, method for manufacturing semiconductor wafer, and device for manufacturing ingot block

#24
20210079555
2021-03-18

Method for validating the thermal history of a semiconductor ingot

#25
20200399783
2020-12-24

Method for controlling convection pattern of silicon melt, method for producing silicon single crystals, and device for pulling silicon single crystals

#26
20200270764
2020-08-27

Single crystal of silicon with <100> orientation, which is doped with n-type dopant, and method for producing such a single crystal

#27
20200224329
2020-07-16

N-type silicon single crystal production method, n-type silicon single crystal ingot, silicon wafer, and epitaxial silicon wafer

#28
20200168712
2020-05-28

Semiconductor wafer of monocrystalline silicon and method of producing the semiconductor wafer

#29
20200165742
2020-05-28

Method and apparatus for manufacturing silicon single crystal

#30
20190211471
2019-07-11

Temperature control device for single crystal ingot growth and temperature control method applied thereto

#31
20190161888
2019-05-30

Single crystal silicon plate-shaped body

#32
20190136408
2019-05-09

Crystal pulling systems and methods for producing monocrystalline ingots with reduced edge band defects

#33
20180266016
2018-09-20

Nitrogen doped and vacancy dominated silicon ingot and thermally treated wafer formed therefrom having radially uniformly distributed oxygen precipitation density and size

#34
20180197751
2018-07-12

Epitaxial silicon wafer

#35
20170283980
2017-10-05

Method for producing a silicon single crystal doped with red phosphorous with reduced number of stacking faults and method for producing a silicon wafer using the same

#36
20170247810
2017-08-31

SYSTEM FOR MEASURING MATERIAL THICKNESSES AT HIGH TEMPERATURES

#37
20170226659
2017-08-10

C-PLANE SAPPHIRE METHOD AND APPARATUS

#38
20170145587
2017-05-25

Crystal pulling system and method for inhibiting precipitate build-up in exhaust flow path

#39
20170107639
2017-04-20

Crystal pulling systems and methods for producing monocrystalline ingots with reduced edge band defects

#40
20170044685
2017-02-16

Method for growing a silicon single crystal while suppressing a generation of slip dislocations in a tail portion

#41
20170037535
2017-02-09

Method for growing a silicon crystal substrate from a melt by directing a flow of molten silicon around a baffle structure

#42
20170029975
2017-02-02

Manufacturing method of silicon monocrystal

#43
20160237589
2016-08-18

Method for manufacturing silicon single crystal

#44
20160194783
2016-07-07

Silicon single crystal pulling apparatus comprising a vertically movable supporting member holding the heater and shield

#45
20160102419
2016-04-14

Silicon single crystal growing device and method of growing the same

#46
20160102418
2016-04-14

Method for producing single crystal, and method for producing silicon wafer

#47
20160042974
2016-02-11

Epitaxial silicon wafer and method for manufacturing same

#48
20160032491
2016-02-04

Nitrogen doped and vacancy dominated silicon ingot and thermally treated wafer formed therefrom having radially uniformly distributed oxygen precipitation density and size

#49
20160024685
2016-01-28

Crystal growing systems and methods including a passive heater

#50
20160017514
2016-01-21

Cooling rate control apparatus and ingot growing apparatus including same

#51
20150240380
2015-08-27

Method for growing silicon single crystal

#52
20150159299
2015-06-11

Method for growing silicon carbide crystal

#53
20150159297
2015-06-11

Method for growing silicon carbide crystal

#54
20150136016
2015-05-21

Method for producing SiC single crystal

#55
20150044422
2015-02-12

Silicon wafer and method for manufacturing the same

#56
20140191370
2014-07-10

Silicon single crystal wafer, manufacturing method thereof and method of detecting defects

#57
20140116323
2014-05-01

C-Plane Sapphire Method

#58
20130337631
2013-12-19

Semiconductor structure and method

#59
20130220216
2013-08-29

Method and an apparatus for growing a silicon single crystal from a melt

#60
20130161793
2013-06-27

Silicon single crystal substrate and method of manufacturing the same

#61
20130112135
2013-05-09

Thermal load leveling during silicon crystal growth from a melt using anisotropic materials

#62
20120260846
2012-10-18

METHOD FOR FORMING BULK CRYSTALS, IN PARTICULAR MONOCRYSTALS OF FLUORIDES DOPED WITH RARE-EARTH IONS

#63
20110229707
2011-09-22

METHOD OF MANUFACTURING SINGLE CRYSTAL INGOT AND WAFER MANUFACTURED BY THEREBY

#64
20110197809
2011-08-18

SINGLE CRYSTAL COOLER AND SINGLE CRYSTAL GROWER INCLUDING THE SAME

#65
20110084366
2011-04-14

Epitaxial wafer and production method thereof

#66
20110056427
2011-03-10

Single-crystal manufacturing apparatus and single-crystal manufacturing method

#67
20100288185
2010-11-18

Method and an apparatus for growing a silicon single crystal from a melt

#68
20100127354
2010-05-27

SILICON SINGLE CRYSTAL AND METHOD FOR GROWING THEREOF, AND SILICON WAFER AND METHOD FOR MANUFACTURING THEREOF

#69
20100052103
2010-03-04

SILICON WAFER AND METHOD FOR PRODUCING THE SAME

#70
20100051945
2010-03-04

Silicon wafer and method for producing the same

#71
20090301385
2009-12-10

Method for producing silicon wafer

#72
20090249998
2009-10-08

Single crystal pulling apparatus

#73
20090210166
2009-08-20

Method for predicting precipitation behavior of oxygen in silicon single crystal, method for determining production parameter of silicon single crystal, and storage medium for storing program for predicting precipitation behavior of oxygen in silicon single crystal

#74
20090173272
2009-07-09

Apparatus for pulling single crystal by CZ method

#75
20090090294
2009-04-09

Method and apparatus for manufacturing an ultra low defect semiconductor single crystalline ingot

#76
20090072202
2009-03-19

Device and process for growing Ga-doped single silicon crystals suitable for making solar cells

#77
20090061140
2009-03-05

Silicon single crystal producing method, annealed wafer, and method of producing annealed wafer

#78
20090022930
2009-01-22

SINGLE CRYSTAL SILICON HAVING IMPROVED GATE OXIDE INTEGRITY

#79
20080311021
2008-12-18

Apparatus for pulling single crystal by CZ method

#80
20080311019
2008-12-18

Apparatus for pulling single crystal by CZ method

#81
20080292523
2008-11-27

SILICON SINGLE CRYSTAL WAFER AND THE PRODUCTION METHOD

#82
20080286565
2008-11-20

Method for manufacturing epitaxial wafer

#83
20080113171
2008-05-15

Silicon wafer for semiconductor and manufacturing method thereof

#84
20080075941
2008-03-27

C-plane sapphire method and apparatus

#85
20080020168
2008-01-24

SILICON ON INSULATOR STRUCTURE WITH A SINGLE CRYSTAL CZ SILICON DEVICE LAYER HAVING A REGION WHICH IS FREE OF AGGLOMERATED INTRINSIC POINT DEFECTS

#86
20070269361
2007-11-22

Silicon material with controlled agglomerated point defects and oxygen clusters induced by the lateral surface

#87
20070266929
2007-11-22

Controlling agglomerated point defect and oxygen cluster formation induced by the lateral surface of a silicon single crystal during CZ growth

#88
20070256625
2007-11-08

Apparatus for pulling single crystal by CZ method

#89
20070224783
2007-09-27

Process for forming low defect density, ideal oxygen precipitating silicon

#90
20070169683
2007-07-26

Nitrogen-doped silicon substantially free of oxidation induced stacking faults

#91
20060292890
2006-12-28

Method and device for the production of a silicon single crystal, silicon single crystal, and silicon semiconductor wafers with determined defect distributions

#92
20060272570
2006-12-07

Method for producing a single crystal

#93
20060254498
2006-11-16

Silicon single crystal, and process for producing it

#94
20060243192
2006-11-02

Method of simulation with respect to density distribution and size distribution of void defect within single crystal and oxygen precipitation nucleus within single crystal

#95
20060016387
2006-01-26

Silicon wafer, its manufacturing method, and its manufacturing apparatus

#96
20050268840
2005-12-08

Apparatus for pulling single crystal by CZ method

#97
20050238905
2005-10-27

Vacancy-dominated, defect-free silicon

#98
20050211158
2005-09-29

Silicon wafer for epitaxial growth, an epitaxial wafer, and a method for producing it

#99
20050205000
2005-09-22

Low defect density silicon

#100
20050170610
2005-08-04

Low defect density, ideal oxygen precipitating silicon

#101
20050160967
2005-07-28

Process for preparing single crystal silicon having improved gate oxide integrity

#102
20050150445
2005-07-14

Low defect density silicon having a vacancy-dominated core substantially free of oxidation induced stacking faults

#103
20050132948
2005-06-23

Method for the production of low defect density silicon

#104
20050130394
2005-06-16

Process for implementing oxygen into a silicon wafer having a region which is free of agglomerated intrinsic point defects

#105
18326374
2024-09-17

Asymmetric thermal fields for excluding impurities in single crystal manufacturing device