MULTI-MODE THICKNESS MEASUREMENT DEVICE AND METHODS

WIRE GAUGE DETERMINATION

A METHOD AND DEVICE FOR DETERMINING THICKNESS AND SOLID FRACTION OF A PHARMACEUTICAL TABLET USING NON-INVASIVE PROCESS ELECTRICAL TOMOGRAPHY

NON-CONTACT WAFER METROLOGY SYSTEM

WEAR SENSING APPARATUS

CIRCUITS AND METHODS TO CALIBRATE MIRROR DISPLACEMENT

Method and apparatus for determining properties of containers made of paper or cardboard

WIRE HARNESS

METHOD FOR MONITORING GATE OXIDE THICKNESS

METHOD FOR MONITORING GATE OXIDE THICKNESS

APPARATUS AND METHOD FOR CONTROLLING EDGE RING VARIATION

METHOD AND SYSTEM FOR MONITORING THE FILM THICKNESS OF A LUBRICANT WITHIN A LUBRICATED BEARING

WAFER TEMPERATURE MEASUREMENT IN AN ION IMPLANTATION SYSTEM

Circuits and methods to calibrate mirror displacement

Device and method for measuring thickness of dielectric layer in circuit board

Thickness detection device, method and system

DEVICE THAT INCLUDES A MEMS TUNABLE FILTER AND A METHOD FOR OPERATING THE DEVICE

Thickness measuring device

Apparatus and method for controlling edge ring variation

Wafer temperature measurement in an ion implantation system

Capacitance Sensor in a Battery

Flexible three-dimensional sensing input device

Size detection

Displacement measuring device

Method and apparatus for measuring process kit centering

Vacuum pump, main sensor, and thread groove stator

Method and apparatus for measuring process kit centering

Long range capacitive gap measurement in a wafer form sensor system

SENSOR SHEET, CAPACITIVE SENSOR, AND METHOD FOR MANUFACTURING SENSOR SHEET

Measuring device and operation method of system for inspecting focus ring

Thickness measurement device and methods of use

Sensor device

Coin sensor

Device for detecting foreign object attached on surface of sheet-like medium

Material damage system and method for determining same

CONTAINER WALL THICKNESS INSPECTION DEVICE

Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies

Non-invasive thickness measurement using capacitance measurement

Shape measurement device and shape measurement method

Capacitive distance sensor

Sensor arrangement for combine harvester

Self calibration for mirror positioning in optical MEMS interferometers

Measurement system and measurement method

Wall thickness inspection device

Ice thickness measurement sensor

LITHOGRAPHY APPARATUS, METHOD OF MEASURING SURFACE POSITION, AND METHOD OF PRODUCING DEVICE

Clearance measuring sensor with abradable electrode

METHOD AND APPARATUS FOR MEASURING THICKNESS OF LAYER IN PRINTED CIRCUIT BOARD

Techniques for quantifying fin-thickness variation in FINFET technology

Techniques for quantifying fin-thickness variation in FINFET technology

Contactless capacitive distance sensor

Spectral imaging device and method to calibrate the same

Self calibration for mirror positioning in optical MEMS interferometers

Determining layer thickness

Determining thermal interface material (TIM) thickness change

Apparatus and method of using impedance resonance sensor for thickness measurement

Technique to determine mirror position in optical interferometers

Sensor head for film measurements

Process for measuring heat spreader tilt

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

Process for measuring bond-line thickness

Device and method for capacitive measurement by a floating bridge

Apparatus and method for capacitive measurement of materials

Method of evaluating shape of semiconductor wafer and apparatus for evaluating shape of semiconductor wafer

Gate oxide measurement apparatus

Methods for measuring distance

Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies