SYSTEM, APPARATUS, AND DEVICE FOR MEASURING AN AMOUNT OF DEPOSITED DIELECTRIC MATERIAL

CAPACITIVE DISTANCE SENSOR FOR MEASURING THE THICKNESS OF POWDER AND INHOMOGENEOUS MATERIAL LAYERS

METHOD AND APPARATUS FOR MEASURING THE THICKNESS OF ONE OR MORE LAYERS OF A MULTI-LAYER FILM

SETTLED DUST MEASUREMENT DEVICE USING CAPACITANCE

CAPACITATIVE SENSING DEVICE FOR IN-SITU MONITORING OF COATINGS

SYSTEMS AND METHODS FOR DETECTING ANTIMICROBIAL SURFACE COATINGS

Determining plastic or cellulose levels in composites

METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC LAYER

METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC LAYER

Capacitance-based quality monitoring and control in battery manufacturing

Systems and methods for detecting antimicrobial surface coatings

Determining plastic or cellulose levels in composites

Measuring device and method of obtaining thickness of sheath

Method for calculating capacitance and method for calculating thickness of substrate

Method for producing insulated electric wire, method for inspecting insulated electric wire, and apparatus for producing insulated electric wire

Capacitive-sensing paint borer

Device and methods for accounting for environmental capacitances caused by an external object when detecting presence and location of surface coatings on transparent and/or translucent medium

Thickness measurement device and methods of use

In-situ metrology method for thickness measurement during PECVD processes

Device for detecting foreign object attached on surface of sheet-like medium

Apparatus for measuring thickness of powder deposited on inner surface of pipe

Probe calibration devices and methods

Device for film thickness measurement and method for film thickness measurement

In-situ metrology method for thickness measurement during PECVD processes

APPARATUS FOR MEASURING CONTAMINATION OF PLASMA GENERATING DEVICE

Apparatus and method for measuring thickness of transparent and/or translucent mediums using a reflecting signal that is normal or near normal to the mediums

Detection system for detecting service life of baffle mechanism in a chamber for vacuum coating

Method for determining a characteristic of a surface layer of a fuser element

Techniques for quantifying fin-thickness variation in FINFET technology

Palladium coating thickness measurement

THIN METAL FILM MEASUREMENT METHOD

Micromechanical component having a test structure for determining the layer thickness of a spacer layer and method for manufacturing such a test structure

Gauge calibration

Measurement of a coating on a composite using capacitance

Device for monitoring internal pipe deposit accumulation

Device for locating studs on a surface