G01B9/02062 - CPC Classification Index

ClassID:

164216 ⎘

G01B9/02062 - CPC Classification

Classification description:

Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers; Reduction or prevention of errors; Testing; Calibration Active error reduction, i.e. varying with time

Sub-classes:

G01B9/02063 » {by particular alignment of focus position, e.g. dynamic focussing in optical coherence tomography} 112
G01B9/02064 » {by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry} 57
G01B9/02067 » {by electronic control systems, i.e. using feedback acting on optics or light} 90

Recent Application in this class:

20250198742

2025-06-19

Line-field OCT System with K Space Calibration

20240168397

2024-05-23

ASYMMETRY EXTENDED GRID MODEL FOR WAFER ALIGNMENT

20190101373

2019-04-04

Apparatus for measuring thickness and surface profile of multilayered film structure using imaging spectral optical system and measuring method

20180279873

2018-10-04

OPHTHALMOLOGIC APPARATUS

20180045500

2018-02-15

Method of air refractive index correction for absolute long distance measurement

20180017372

2018-01-18

Precision surface measurement in a vacuum

20160153771

2016-06-02

Shape Measuring Device

20160123718

2016-05-05

Accurate chirped synthetic wavelength interferometer

20150320309

2015-11-12

Ophthalmologic apparatus for measuring position of measuring portion inside eye

#10

20150184995

2015-07-02

Spectral filtering of k-clock signal in OCT system and method

#11

20140198307

2014-07-17

Interferometer system, lithography apparatus, and article manufacturing method

#12

20140098375

2014-04-10

Position monitoring system with reduced noise

#13

20120200827

2012-08-09

Ophthalmologic apparatus

#14

20120013914

2012-01-19

Apparatus and methods for uniform frequency sample clocking

#15

20090310141

2009-12-17

TWO-WAVELENGTH LASER INTERFEROMETER AND METHOD OF ADJUSTING OPTICAL AXIS IN THE SAME

#16

20090046295

2009-02-19

Apparatus and methods for uniform frequency sample clocking