ClassID:

164210

G01B9/02055 - CPC Classification

Classification description:

Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers Reduction or prevention of errors; Testing; Calibration

Sub-classes:
Recent Application in this class:
#1
20250283712
2025-09-11

Optical Coherence Tomography With Self-Inspecting Imaging Device

#2
20240353219
2024-10-24

ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESFQR MATCHING IMPROVEMENT

#3
20240125587
2024-04-18

FILTERING FOR CO-SENSOR FUSION IN ATOMIC SENSORS

#4
20240077304
2024-03-07

ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS

#5
20230288197
2023-09-14

Fault processing system for displacement sensor

#6
20230280153
2023-09-07

Optical Coherence Tomography With Self-Inspecting Imaging Device

#7
20230108466
2023-04-06

Method and device for characterizing the surface shape of an optical element

#8
20220252873
2022-08-11

Calibration kit for an optical scanning device

#9
20200024634
2020-01-23

Methods and systems of characterizing and counting microbiological colonies

#10
20190316988
2019-10-17

Method and apparatus for nondestructive determination of core size of hollow-core photonic bandgap fiber using Fabry-Perot interference

#11
20190187661
2019-06-20

Spatial accuracy correction method and apparatus

#12
20190033056
2019-01-31

Optical roughness sensor for a coordinate measuring machine

#13
20180306569
2018-10-25

Intensity Noise Reduction Methods and Apparatus for Interferometric Sensing and Imaging Systems

#14
20180120087
2018-05-03

CONTROL SYSTEM, AND CONTROL METHOD AND PROGRAM FOR CONTROL SYSTEM

#15
20180035894
2018-02-08

Optical coherence tomographic device

#16
20170234676
2017-08-17

Method and apparatus for determining a plurality of spatial coordinates on a measurement object

#17
20160062112
2016-03-03

Compact, low dispersion, and low aberration adaptive optics scanning system and method

#18
20160047644
2016-02-18

PHASE-INVERTED SIDELOBE-ANNIHILATED OPTICAL COHERENCE TOMOGRAPHY

#19
20150354937
2015-12-10

Interferential position-measuring device and method for operating an interferential position-measuring device

#20
20150153157
2015-06-04

Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems

#21
20150143871
2015-05-28

Daily checking and calibrating method of length measuring machine

#22
20150036149
2015-02-05

SYSTEM FOR CONTROLLING AN OPTICAL SURFACE TO BE MEASURED

#23
20140218745
2014-08-07

Multiple measurement channel detector circuit for interferometers

#24
20130265584
2013-10-10

Temperature-stable incoherent light source

#25
20130222810
2013-08-29

Apolarized interferometric system, and apolarized interferometric measurement method

#26
20110270562
2011-11-03

Profile measuring apparatus

#27
20110228280
2011-09-22

Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems

#28
20100214570
2010-08-26

Orthogonal-polarization mirau interferometry and beam-splitting module and interferometric system using the same

#29
15839658
2018-12-18

System and method for measuring displacement

#30
13837059
2015-04-21

Method and apparatus for calibrating the apex offset on fiberoptic connector measuring interferometer