164210 ⎘
Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers Reduction or prevention of errors; Testing; Calibration
Sub-classes:Optical Coherence Tomography With Self-Inspecting Imaging Device
#2ANGULAR AVERAGING CALIBRATION ON BARE WAFER METROLOGY TOOLS FOR ESFQR MATCHING IMPROVEMENT
#3FILTERING FOR CO-SENSOR FUSION IN ATOMIC SENSORS
#4ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS
#5Fault processing system for displacement sensor
#6Optical Coherence Tomography With Self-Inspecting Imaging Device
#7Method and device for characterizing the surface shape of an optical element
#8Calibration kit for an optical scanning device
#9Methods and systems of characterizing and counting microbiological colonies
#10Method and apparatus for nondestructive determination of core size of hollow-core photonic bandgap fiber using Fabry-Perot interference
#11Spatial accuracy correction method and apparatus
#12Optical roughness sensor for a coordinate measuring machine
#13Intensity Noise Reduction Methods and Apparatus for Interferometric Sensing and Imaging Systems
#14CONTROL SYSTEM, AND CONTROL METHOD AND PROGRAM FOR CONTROL SYSTEM
#15Optical coherence tomographic device
#16Method and apparatus for determining a plurality of spatial coordinates on a measurement object
#17Compact, low dispersion, and low aberration adaptive optics scanning system and method
#18PHASE-INVERTED SIDELOBE-ANNIHILATED OPTICAL COHERENCE TOMOGRAPHY
#19Interferential position-measuring device and method for operating an interferential position-measuring device
#20Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems
#21Daily checking and calibrating method of length measuring machine
#22SYSTEM FOR CONTROLLING AN OPTICAL SURFACE TO BE MEASURED
#23Multiple measurement channel detector circuit for interferometers
#24Temperature-stable incoherent light source
#25Apolarized interferometric system, and apolarized interferometric measurement method
#26Profile measuring apparatus
#27Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems
#28Orthogonal-polarization mirau interferometry and beam-splitting module and interferometric system using the same
#29System and method for measuring displacement
#30Method and apparatus for calibrating the apex offset on fiberoptic connector measuring interferometer