G01B9/02097 - CPC Classification Index

#1

20260078999

2026-03-19

OPTICAL MEASUREMENT DEVICE AND METHOD

#2

20250297849

2025-09-25

SEMICONDUCTOR MEASUREMENT DEVICE

#3

20240369345

2024-11-07

METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETERMINING AN INPUT PHASE AND/OR AN INPUT AMPLITUDE OF AN INPUT LIGHT FIELD

#4

20240230314

2024-07-11

SEMICONDUCTOR MEASUREMENT APPARATUS

#5

20240133673

2024-04-25

SEMICONDUCTOR MEASUREMENT APPARATUS

#6

20240115128

2024-04-11

FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS

#7

20240060766

2024-02-22

Self-mixing inteferometry sensor module, electronic device and method of determining an optical power ratio for a self-mixing inteferometry sensor module

#8

20230349811

2023-11-02

Method for determining a focal length of a particle in a medium

#9

20230152081

2023-05-18

Self-Mixing Interference Device for Sensing Applications

#10

20230073039

2023-03-09

Finger devices with self-mixing interferometric proximity sensors

#11

20230064721

2023-03-02

SCANNING SELF-MIXING INTERFEROMETRY WITH WAVEGUIDE

#12

20220244036

2022-08-04

Scanning self-mixing interferometry system and sensor

#13

20220221802

2022-07-14

Self-referencing interferometer and dual self-referencing interferometer devices

#14

20220099436

2022-03-31

Surface quality sensing using self-mixing interferometry

#15

20220091032

2022-03-24

Two-Dimensional Second Harmonic Dispersion Interferometer

#16

20220034645

2022-02-03

METHOD, INTERFEROMETER AND SIGNAL DEVICE, EACH FOR DETERMINING AN INPUT PHASE AND/OR AN INPUT AMPLITUDE OF AN INPUT LIGHT FIELD

#17

20220018649

2022-01-20

Methods and systems of holographic interferometry

#18

20210199575

2021-07-01

Two-dimensional second harmonic dispersion interferometer

#19

20210007601

2021-01-14

Frequency-domain interferometric based imaging systems and methods

#20

20210003385

2021-01-07

Self-mixing interference device for sensing applications

#21

20190219378

2019-07-18

Method for determining a phase of an input beam bundle

#22

20190145831

2019-05-16

Three-dimensional interferometer and method for determining a phase of an electric field

#23

20190049866

2019-02-14

Position sensing arrangement and lithographic apparatus including such an arrangement, position sensing method and device manufacturing method

#24

20180348703

2018-12-06

Methods and systems of holographic interferometry

#25

20180164506

2018-06-14

Interferometer based on a tilted MMI

#26

20180143010

2018-05-24

Rotation angle measuring system and machining system comprising the same

#27

20180128592

2018-05-10

Integrated fourier transform optical spectrometer

#28

20170268866

2017-09-21

Three-dimensional interferometer, method for calibrating such an interferometer and method for reconstructing an image

#29

20170191820

2017-07-06

Two-channel point-diffraction interferometer

#30

20170153434

2017-06-01

Portable interferometric device

#31

20170115110

2017-04-27

Compact portable double differential fiber optic Sagnac interferometer

#32

20170105618

2017-04-20

Frequency-domain interferometric based imaging systems and methods

#33

20170059301

2017-03-02

System and method for a self-referencing interferometer

#34

20170045349

2017-02-16

POLARIZATION-SENSITIVE SPECTRAL INTERFEROMETRY

#35

20160305761

2016-10-20

System and a method for quantitative sample imaging using off-axis interferometry with extended field of view or faster frame rate

#36

20160109216

2016-04-21

Optical position measuring device for generating wavelength-dependent scanning signals

#37

20160091372

2016-03-31

Method for detecting focal plane based on grating talbot effect

#38

20160061587

2016-03-03

Device for interferential distance measurement

#39

20160054112

2016-02-25

Methods for 3-dimensional interferometric microscopy

#40

20150168214

2015-06-18

Wavelength-encoded tomography

#41

20150049343

2015-02-19

Portable interferometric device

#42

20140374575

2014-12-25

Spatial frequency reproducing apparatus and optical distance measuring apparatus

#43

20140293015

2014-10-02

Method of 3-dimensional imaging of activated samples

#44

20140139842

2014-05-22

System and method for a self-referencing interferometer

#45

20120136259

2012-05-31

Polarization-sensitive spectral interferometry

#46

20120038927

2012-02-16

Light reflection mechanism, optical interferometer and spectrometric analyzer

#47

20120013908

2012-01-19

System and method for a virtual reference interferometer

#48

20110170200

2011-07-14

Optical interfering apparatus

#49

20110157552

2011-06-30

SS OCT interferometry for measuring a sample

#50

20110141451

2011-06-16

Displacement measurement device, exposure apparatus, and working device

#51

20110109913

2011-05-12

Short coherence interferometry for measuring distances

#52

20110096336

2011-04-28

Apparatus and method for measuring displacement

#53

20100312394

2010-12-09

Force sensor and industrial robot including the same

#54

20100302550

2010-12-02

DEVICE AND METHOD FOR THE OPTICAL MEASUREMENT OF RELATIVE DISTANCES

#55

20100280321

2010-11-04

Self-interfering tomography system

#56

20100271636

2010-10-28

Talbot interferometer, its adjustment method, and measurement method

#57

20100231922

2010-09-16

Three-dimensional interferometric microscopy

#58

20080291463

2008-11-27

Polarization-sensitive spectral interferometry

#59

20080158551

2008-07-03

Systems and methods for 3-dimensional interferometric microscopy

#60

20070236699

2007-10-11

Optical tomography method & device

#61

20070024854

2007-02-01

Heterodyne array detector

#62

20070008550

2007-01-11

Systems and methods for tilt and range measurement

#63

20060119861

2006-06-08

Method for measuring contour variations

#64

20050046863

2005-03-03

Common optical-path testing of high-numerical-aperture wavefronts

#65

19073498

2025-11-11

Self-referencing interferometric microscope

#66

15371933

2018-01-16

Interferometer based on a tilted MMI

#67

15330822

2019-10-08

High speed Michelson interferometer microscope