ClassID:

166294

G01J2009/0234 - CPC Classification

Classification description:

Measuring optical phase difference ; Determining degree of coherence; Measuring optical wavelength by interferometric methods Measurement of the fringe pattern

Sub-classes:
Recent Application in this class:
#1
20240201014
2024-06-20

SPECTROGRAPH STABILIZATION USING A SINGLE-DELAY INTERFEROMETER

#2
20230144290
2023-05-11

Device and method for measuring wavelength for laser device

#3
20190301938
2019-10-03

Spectroscope, wavelength measuring device, and spectrum measuring method

#4
20190212130
2019-07-11

Three-dimensional shape, displacement, and strain measurement device and method using periodic pattern, and program therefor

#5
20180292748
2018-10-11

Imprint apparatus, imprint method, detecting method, and method of manufacturing device

#6
20170199083
2017-07-13

Collimation evaluation device and collimation evaluation method

#7
20150076724
2015-03-19

Imprint apparatus to detect a contact state between a mold and a substrate

#8
20110157599
2011-06-30

Uses of electromagnetic interference patterns

#9
20100309482
2010-12-09

Surface shape measurement apparatus and method

#10
20090219494
2009-09-03

EVALUATION METHOD, EVALUATION APPARATUS, AND EXPOSURE APPARATUS

#11
20090046293
2009-02-19

Optical communications using spectral interferometry

#12
20080180659
2008-07-31

Laser system

#13
20080174786
2008-07-24

Phase shift amount measurement apparatus and transmittance measurement apparatus

#14
20080043224
2008-02-21

Scanning simultaneous phase-shifting interferometer

#15
20070206201
2007-09-06

Phase shifting interferometry with multiple accumulation

#16
20070177157
2007-08-02

Optical readhead

#17
20070024854
2007-02-01

Heterodyne array detector

#18
20060007447
2006-01-12

Method and apparatus for feedback control of tunable laser wavelength

#19
20050206906
2005-09-22

Optical image measuring apparatus for forming an image of an object to be measured based on interference light