166295 ⎘
Measuring optical phase difference ; Determining degree of coherence; Measuring optical wavelength by interferometric methods; Measurement of the fringe pattern the pattern being processed optically, e.g. by Fourier transformation
METHODS AND SYSTEMS FOR TWO-DIMENSIONAL DETERMINATION OF THE SIZE AND SHAPE OF A BRIGHT, MICRON-SIZE LIGHT SOURCE USING INTERFEROMETRY WITH A TWO-DIMENSIONAL NON-REDUNDANT APERTURE MASK, INCLUDING METHODS AND SYSTEMS FOR WAVEFRONT SENSING
#2LASER SYSTEM, SPECTRUM WAVEFORM CALCULATION METHOD, AND ELECTRONIC DEVICE MANUFACTURING METHOD
#3Totagraphy: coherent diffractive/digital information reconstruction by iterative phase recovery using special masks
#4Coherent light detection system and method
#5APPARATUS FOR MEASURE OF COHERENCE OF LIGHT SOURCE FOR HOLOGRAPHIC DISPLAY AND METHOD THEREOF
#6High speed random access variable focusing and steering of a patterned line
#7Method and device for measuring wavefront using diffraction grating, and exposure method and device
#8Ocular metrology employing spectral wavefront analysis of reflected light
#9Detection device and detection method
#10Wavefront analyser
#11Ocular metrology employing spectral wavefront analysis of reflected light
#12Method and device for measuring wavefront using light-exit section causing light amount distribution in at least one direction
#13Device and method for characterizing a light beam
#14WAVEFRONT ABERRATION AND DISTANCE MEASUREMENT PHASE CAMERA
#15Totagraphy: Coherent diffractive/digital information reconstruction by iterative phase recovery using special masks