166129 ⎘
Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter
Sub-classes:APPARATUS FOR MEASURING TEMPERATURE
#2METHOD AND APPARATUS FOR SENSING THERMAL RADIATION FLUX
#3METHOD AND SYSTEM FOR MEASUREMENT OF NONTHERMAL FAR-INFRARED RADIATION
#4Thermal Infrared Sensor That Can Be Fixed Onto Infrared Windows
#5TEMPERATURE MEASUREMENT METHOD, TEMPERATURE MEASUREMENT APPARATUS, TEMPERATURE CONTROL METHOD, TEMPERATURE CONTROL APPARATUS, METHOD FOR MANUFACTURING STEEL MATERIAL, AND FACILITY FOR MANUFACTURING STEEL MATERIAL
#6MIRROR DEVICE, PROJECTION OBJECTIVE AND METHOD FOR MEASURING THE TEMPERATURE OF A MIRROR
#7METHOD FOR EMISSIVITY-CORRECTED PYROMETRY
#8BALER THERMAL SCANNING
#9METHOD AND DEVICE FOR MEASURING TEMPERATURE OF WIRE ROD, STORAGE MEDIUM, AND COMPUTER DEVICE
#10DOMESTIC APPLIANCE DEVICE
#11LASER PROCESSING APPARATUS METHOD INCLUDING SAME AND PROCESSED OBJECT PROCESSED THEREBY
#12System for detecting heater failure by thermal image
#13APPARATUS AND METHOD FOR RELIABLE DETECTION OF TEMPERATURE READING
#14METHODS AND APPARATUS TO AUTONOMOUSLY DETECT THERMAL ANOMALIES
#15DEVICE AND METHOD FOR MONITORING AN EMISSION TEMPERATURE OF A RADIATION EMITTING ELEMENT
#16SURFACE TEMPERATURE MEASURING APPARATUS, SURFACE TEMPERATURE MEASURING METHOD, AND OPTICAL CHARACTERISTIC MEASURING APPARATUS
#17THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT DETECTION METHOD, AND DEFECT DETECTION DEVICE
#18FOCUS RING INSPECTION DEVICE AND FOCUS RING INSPECTION METHOD
#19ESTIMATION OF THE TEMPERATURE OF A STEEL PRODUCT
#20Surface roughness and emissivity determination
#21METHOD AND APPARATUS FOR MONITORING ELECTRIC VEHICLES
#22Unit Cell Inspecting Device, Electrode Assembly Manufacturing Equipment Including Same, and Electrode Assembly Manufacturing Method
#23SUBSTRATE TEMPERATURE MEASURING DEVICE, SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME, AND SUBSTRATE TEMPERATURE MEASURING METHOD USING THE SAME
#24EMISSIVITY INDEPENDENCE TUNING
#25METHOD FOR CHARACTERIZATION OF TEMPERATURE IN WELD ZONE OF FRICTION STIR WELDING BASED ON INFRARED THERMAL IMAGER
#26METHOD AND DEVICE FOR CONTACTLESS MEASUREMENT OF A TEMPERATURE
#27TEMPERATURE DISTRIBUTION LEARNING APPARATUS
#28Solder device and system controller thereof
#29Methods and apparatus to autonomously detect thermal anomalies
#30Systems and methods of pyrometric temperature measurement and control in dye sublimation
#31Devices, systems, and methods for calibrating and maintaining a temperature of materials in an additive manufacturing build chamber
#32PHOTOTHERMAL ANALYSIS OF A PART OF SOLID MATERIAL
#33Spectral emissivity and temperature measurements of metal powders during continuous processing in powder bed fusion additive manufacturing
#34Temperature measurement method and electronic device
#35Sheet for temperature measurement, and temperature measurement system
#36Measurement of body temperature of a subject
#37System and method for lens heating control
#38CALIBRATION METHOD FOR TEMPERATURE MEASUREMENT DEVICE, CALIBRATION DEVICE FOR TEMPERATURE MEASUREMENT DEVICE, CALIBRATION METHOD FOR PHYSICAL QUANTITY MEASUREMENT DEVICE, AND CALIBRATION DEVICE FOR PHYSICAL QUANTITY MEASUREMENT DEVICE
#39Stress properties measurement method, device, and system correlated based on stress gradients on multiple regions
#40Method and Apparatus for Non-Contact Temperature Measurement and Analysis for Detection of Symptomatic Conditions
#41Detection methods for epitachophoresis workflow automation
#42Thickness measurement method, thickness measurement device, defect detection method, and defect detection device
#43Oxide film thickness measurement device and method
#44APPARATUSES, SYSTEMS, AND METHODS FOR THERMAL IMAGING
#45Method and system comprising entrance optics, interferometer, and transformation layer for detection of electromagnetic radiation
#46Infrared detection device
#47Multi-spectral temperature measuring device based on adaptive emissivity model and temperature measuring method thereof
#48Method for detecting the surface properties of components, use of the method for monitoring the surface quality of components and device for adjusting the surface properties of components
#49Scale composition determination system, scale composition determination method, and program
#50Food cooking unit
#51Device and method for process control for surfaces with a low, unknown, and/or variable emissivity
#52Thermal camera health monitoring
#53Thermal imaging with an integrated photonics chip
#54Tire temperature optimization system and method for use
#55Methods and apparatus for controlling a cooking appliance
#56Monitoring system
#57Solder device and system controller thereof
#58Stress measurement device, stress measurement system, and stress measurement method
#59Characterizing tropospheric boundary layer thermodynamic and refractivity profiles utilizing selected waveband infrared observations
#60Inspection method, inspection apparatus, production method, and production system for heatsink
#61INFRARED DETECTION APPARATUS
#62Method and apparatus for real time, in situ sensing and characterization of roughness, geometrical shapes, geometrical structures, composition, defects, and temperature in three-dimensional manufacturing systems
#63Environmentally aware pet leash
#64Automatic fever detection system and method
#65Thermal image sensing system and thermal image sensing method
#66Method for increasing accuracy of measurement of body temperature
#67Thermal infrared sensor that can be fixed onto infrared windows
#68Scale composition determination system, scale composition determination method, and program
#69METHOD OF IMPROVING THE ACCURACY OF THE TEMPERATURE MEASUREMENT OF THERMAL/INFRARED ARRAY SENSOR
#70Fluid sensor and method for providing same
#71Building automation system and method using ceiling-mounted infrared sensors
#72Vehicle lamp, inspection method of vehicle lamp, and inspection apparatus for vehicle lamp
#73Temperature sensor for a high speed rotating machine
#74Methods and systems for temperature measurement with machine learning algorithm
#75Electromagnetic wave emittance-based specimen analysis
#76INSPECTION METHOD, INSPECTION APPARATUS, PRODUCTION METHOD, AND PRODUCTION SYSTEM FOR HEATSINK
#77Semiconductor workpiece temperature measurement system
#78Low-drift infrared detector
#79Method for measuring temperature of process area
#80Locating an aperture based on a signature of an embedded conductive element
#81Stress measurement device, stress measurement system, and stress measurement method
#82Automated thermographic inspection for composite structures
#83Polished-rod thermal imaging system for preventing failures in the operation of a sucker rod pump
#84Radiometry device
#85Infrared contrasting color emissivity measurement system
#86Control system for determining temperature of paving material
#87Systems, devices, and apparatus for monitoring temperature at remote locations using infrared light
#88Non-contact temperature calibration tool for a substrate support and method of using the same
#89Method for temperature measurements of surfaces with a low, unknown and/or variable emissivity
#90Optical observation device
#91Method and system for calibrating thermal imaging systems
#92Information collecting apparatus, information collecting system and information collecting method
#93Raman spectrum inspection apparatus and security monitoring method for Raman spectrum inspection apparatus
#94Raman spectrum-based object inspection apparatus and method
#95Observation apparatus
#96Excrement-based body temperature measurement device
#97Laser annealing apparatus
#98Measuring temperature of metallic part under uniaxial deformation pressure by optical pyrometry
#99Housing cover and indoor unit of air conditioning apparatus having the housing cover
#100Infrared sensor for measuring ambient air temperature
#101Active thermoelectric cooling pad with infrared thermal sensor
#102Automated thermographic inspection for composite structures
#103Spherical-motion average radiant temperature sensor
#104Method for determining the temperature of a strand
#105Applique and method for thermographic inspection
#106Wireless temperature probe
#107Heat source detection device and heat source detection method
#108Optical fiber temperature control system and method
#109Thermal Imaging Cooking System
#110Detection of the presence of a product sprayed onto a surface
#111Method for noncontact, radiation thermometric temperature measurement
#112Vanadium oxide film and process for producing same
#113Analysis system and analysis method
#114Optical Nonlinearity Estimation Using Increase in Harmonic Content With Increase in Intensity
#115Monitoring surface temperature of devices
#116Method and System For Inspecting A Pipe
#117Temperature sensor, device using same, and temperature measurement method
#118Non-contact thermal measurements of VUV optics
#119Additive manufacturing temperature controller/sensor apparatus and method of use thereof
#120IR temperature sensor for induction heating of food items
#121Infrared Transmissive Protective Cover, Method for Manufacturing the Same and Monitoring Method Using the Same
#122Methods and apparatus for controlling a cooking appliance
#123Method for measuring temperature of object in atmosphere having dust
#124System and method for measuring optical resolution with an optical resolution target assembly
#125REFRIGERATOR PROVIDING LOCAL COOLING
#126Temperature determination based on emissivity
#127Temperature measurement method for ultraviolet light transmittance member, temperature measurement device for ultraviolet light transmittance member, and light source device
#128Characterization of spectral emissivity via thermal conductive heating and in-situ radiance measurement using a low-e mirror
#129Non-contact infrared temperature sensor with wireless functionality
#130Electromagnetic (EM) power density and field characterization technique
#131Pyrometric detection device, method for calibrating the same, and apparatus for producing three-dimensional work pieces
#132Method of measuring temperature of a heated part
#133Method for measuring temperature by refraction and change in velocity of waves with magnetic susceptibility
#134Thermally determining flow and/or heat load distribution in parallel paths
#135APPARATUS AND METHODS FOR CONTROLLING THE TEMPERATURE OF A CHROMATOGRAPHY COLUMN
#136Digital temperature determination using a radiometrically calibrated and a non-calibrated digital thermal imager
#137Additive manufacturing temperature controller/sensor apparatus and method of use thereof
#138Surface temperature measuring apparatus and surface temperature measuring method
#139Temperature monitoring device for workflow monitoring system
#140Emissivity independent optical pyrometer
#141Temperature probe
#142Method and apparatus for measuring rail surface temperature
#143Temperature monitoring device for workflow monitoring system
#144System and process for calibrating pyrometers in thermal processing chambers
#145Device for determining the temperature of a substrate
#146Device for temperature measurements of surfaces with a low unknown and/or variable emissivity
#147Infrared contrasting color temperature measurement system
#148Alloyed position determining method, alloyed position determining apparatus, and recording medium
#149Method and system for emissivity determination
#150Thermally determining flow and/or heat load distribution in parallel paths
#151Electromagnetic (EM) power density and field characterization technique
#152Thermal image smoothing method, surface temperature-measuring method, and surface temperature-measuring device
#153Method for quantifying amorphous content in bulk metallic glass parts using thermal emissivity
#154Automated object classification using temperature profiles
#155Automated object classification using temperature profiles
#156Device for measuring temperature distribution
#157Temperature monitoring device for workflow monitoring system
#158Method and system for monitoring and controlling a glass container forming process
#159IR temperature sensor for induction heating of food items
#160Method of hot stamping galvanized steel sheet
#161Infrared detecting element and electronic device
#162System and process for calibrating pyrometers in thermal processing chambers
#163GAS SENSOR, ANALYZER AND METHOD FOR MEASURING OXYGEN CONCENTRATION OF A RESPIRATORY GAS
#164Abnormal measurement detection device and method for infrared radiation thermometer
#165NON-CONTACT TYPE TEMPERATURE SENSING DEVICE WITH CONSTANT DISTANCE MEASUREMENT AND TEMPERATURE MEASURING METHOD THEREOF
#166Non-contact thermometer
#167Method and system for determining optical properties of semiconductor wafers
#168Methods and systems for in-situ pyrometer calibration
#169Method of manufacturing vitreous silica crucible
#170DETECTION AND IDENTIFICATION OF SOLID MATTER
#171Nadir emissive hyperspectral measurement operation (NEHMO)
#172MULTIPLE OBJECT TALKING NON-CONTACT THERMOMETER
#173System and process for calibrating pyrometers in thermal processing chambers
#174Apparatus and method for aligning a wafer's backside to a wafer's frontside
#175System and method for monitoring hot glass containers to enhance their quality and control the forming process
#176Method and system for monitoring and controlling a glass container forming process
#177Method and apparatus for determining measurement values
#178Multi-site attachments for ear thermometers
#179Thermometer for determining the temperature of an animal's ear drum and method of using same
#180Thermometer for determining the temperature of an animal's ear drum and method of using the same
#181Pyrometer adapted for detecting UV-radiation and use thereof
#182Pyrometer
#183Lighting apparatus
#184Quantification of energy loss from buildings
#185Detection and identification of solid matter
#186RADIATION THERMOMETRY AND RADIATION THERMOMETRY SYSTEM
#187Method for calibrating a pyrometer, method for determining the temperature of a semiconducting wafer and system for determining the temperature of a semiconducting wafer
#188Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing
#189SUBSTRATE COOL DOWN CONTROL
#190Calibrated assembly for IR thermometer apparatus
#191IR thermometry probe cover
#192Method and apparatus for determining the emissivity, area and temperature of an object
#193System and process for calibrating pyrometers in thermal processing chambers
#194Thermal profiling to validate electronic device authenticity
#195Method, Apparatus and Kit for Measuring Optical Properties of Materials
#196Ear Thermometer using optical fiber transmission
#197Plasma processing apparatus and temperature measuring method and apparatus used therein
#198SUBSTRATE TEMPERATURE MEASURING APPARATUS AND SUBSTRATE TEMPERATURE MEASURING METHOD
#199Mechanism of monitoring unit of electric rotating machinery and monitoring method of electric rotating machinery
#200Temperature uniformity measurement during thermal processing
#201Decompressing type heater, its heating method, and electronic product manufacturing method
#202Temperature measuring device and temperature measuring method
#203Emmissivity test instrument for overhead electrical transmission and distribution
#204Abnormal measurement detection device and method for infrared radiation thermometer
#205Method of measuring in situ differential emissivity and temperature
#206Temperature measurement with reduced extraneous infrared in a processing chamber
#207SUBSTRATE TEMPERATURE MEASUREMENT BY INFRARED TRANSMISSION IN AN ETCH PROCESS
#208Non-contact thermometer
#209Temperature measuring method and temperature measuring device of steel plate, and temperature control method of steel plate
#210RADIOMETER AND TEMPERATURE COMPENSATION SYSTEM
#211Health monitoring through a correlation of thermal images and temperature data
#212DETERMINATION OF A SURFACE TEMPERATURE OF A COOLING BODY
#213Method and system for monitoring of the temperature of the surface of an aircraft
#214Method of Assessing Energy Efficiency of Buildings
#215Temperature Sensor Module
#216Automatic focus and emissivity measurements for a substrate system
#217Guiding IR temperature measuring device with probe cover
#218Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing
#219Method for Operating a Device for Splicing Optical Waveguides
#220Detachable probe cover for ear thermometer and manufacturing method thereof
#221Calibration substrate and method of calibration therefor
#222Methods and systems for detecting concealed objects
#223Pyroelectric detection systems and methods of making the same
#224Methods of thermoreflectance thermography
#225APPARATUS FOR MEASURING THICKNESS OF A SUBSTRATE
#226Infrared thermometer
#227Infrared thermometer
#228Infrared Radiation Temperature Measuring System with Error Source Radiance Optical Filtering System and Method Using the Same
#229IN SITU OPTICAL SURFACE TEMPERATURE MEASURING TECHNIQUES AND DEVICES
#230NON-CONTACT THERMAL IMAGING SYSTEM FOR HETEROGENEOUS COMPONENTS
#231Substrate temperature measurement by infrared transmission
#232APPARATUS AND METHOD FOR INSPECTING A WAFER
#233Infrared inspection and reporting process
#234Method for thermal tomography of thermal effusivity from pulsed thermal imaging
#235Maximum blade surface temperature estimation for advanced stationary gas turbines in near-infrared (with reflection)
#236Method for the certification of heater blankets by means of infrared thermography
#237Stage for Holding Silicon Wafer Substrate and Method for Measuring Temperature of Silicon Wafer Substrate
#238Method of temperature measurement and temperature-measuring device using the same
#239System and method for enabling temperature measurement using a pyrometer and pyrometer target for use with same
#240Calibration wafer and method of calibrating in situ temperatures
#241Active temperature feedback control of continuous casting
#242Compact emissivity and temperature measuring infrared detector
#243Tympanic thermometer probe cover
#244Liquid temperature detectors
#245Method for measuring physical quantity of measurement object in substrate processing apparatus and storage medium storing program for implementing the method
#246Explosive device detection based on differential emissivity
#247In-situ wafer parameter measurement method employing a hot susceptor as a reflected light source
#248Devices, systems and methods for determining temperature and/or optical characteristics of a substrate
#249Method and apparatus for manufacturing a semiconductor device
#250Emissivity-independent silicon surface temperature measurement
#251Method of measuring in situ differential emissivity and temperature
#252Heatable infrared sensor and infrared thermometer comprising such an infrared sensor
#253Method and system for determining optical properties of semiconductor wafers
#254Infrared inspection and reporting process
#255High performance CCD-based thermoreflectance imaging using stochastic resonance
#256Method and apparatus for measuring spatial temperature distribution of flames
#257Methods and apparatus for remote temperature measurement of a specular surface
#258Methods of depositing an elemental silicon-comprising material over a substrate
#259In-situ wafer parameter measurement method employing a hot susceptor as radiation source for reflectance measurement
#260Method for measuring temperature in microscale
#261Calibration wafer and method of calibrating in situ temperatures
#262Tympanic thermometer probe cover
#263In situ optical surface temperature measuring techniques and devices
#264Method of defining the emission coefficient of a surface to be heated
#265Calibration and measurement of temperatures in melts by optical fibers
#266Process for determining the temperature of a semiconductor wafer in a rapid heating unit
#267Temperature measurement and heat-treating methods and systems
#268Analytical system and method for measuring and controlling a production process
#269Operational range designation and enhancement in optical readout of temperature
#270Device and method for heat test
#271Compact emissivity and temperature measuring infrared detector
#272Thermometer with image display
#273Temperature measuring apparatus, temperature measurement method, temperature measurement system, control system and control method
#274Emissivity measuring device
#275Apparatus and method for measuring the temperature of substrates
#276Method and apparatus for monitoring and detecting defects in plastic package sealing
#277Method and apparatus for measuring temperature and emissivity
#278Method and apparatus for measuring temperature of substrate
#279Monitoring system for cooking station
#280Method of measuring thickness of thin film using infrared thermal imaging system
#281Method and apparatus for measuring temperature of substrate
#282Methods of depositing an elemental silicon-comprising material over a semiconductor substrate and methods of cleaning an internal wall of a chamber
#283Focusing thermometer
#284Analytical instruments for monitoring photopolymerization
#285Method and device for laser beam welding with reduced blemishes
#286Thermography test method and apparatus for bonding evaluation in sputtering targets
#287Method and device for normalizing temperature variations
#288Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing
#289Ear thermometer with illumination
#290Temperature measurement and heat-treating methods and system
#291Temperature measuring system, heating device using it and production method for semiconductor wafer, heat ray insulating translucent member, visible light reflection membner, exposure system-use reflection mirror and exposure system, and semiconductor device produced by using them and vetical heat treating device
#292Method and device for measuring internal temperature of heap fermentation based on infrared temperature measurement
#293Image acquisition method for microbolometer thermal imaging systems
#294Micromechanical photothermal spectroscopy system and method
#295Heat detection system
#296Equivalent wave field processing of thermal images
#297Methods and systems for measurement and estimation of normalized contrast in infrared thermography