Method and apparatus for the automated process of in-situ lift-out

Ion beam system and machining method

Transmission electron microscopy sample preparation method for electron holography

Method for electron beam-initiated coating for application of transmission electron microscopy

Apparatus and method for evaluating cross section of specimen

Method of approaching probe and apparatus for realizing the same

Backside unlayering of MOSFET devices for electrical and physical characterization

Method and apparatus for sample formation and microanalysis in a vacuum chamber

Apparatus for sample formation and microanalysis in a vacuum chamber

Probe and small sample pick up mechanism

Method for the removal of a microscopic sample from a substrate

Methods of measurement and preparation of measurement structure of integrated circuit

Method of evaluating adhesiveness of member

Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same

Ion beam device and ion beam processing method, and holder member

Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis

Method for analyzing metal element on surface of wafer

High resolution cross-sectioning of polysilicon features with a dual beam tool

Conditioning chamber for metallurgical surface science

Probe current imaging

Probe tip processing

Method, system and device for microscopic examination employing fib-prepared sample grasping element

System and method for decapsulating an encapsulated object

Method of processing backside unlayering of MOSFET devices for electrical and physical characterization including a collimated ion plasma

Apparatus and method for preparing samples

Specimen cooling system of focused ion beam apparatus

Methods for preparing samples for atom probe analysis

Mask and apparatus using it to prepare sample by ion milling

ETCHANT COMPOSITION FOR SEM IMAGE ENHANCEMENT OF P-N JUNCTION CONTRAST

Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devices

Endpoint compensation in electroprocessing

Method and apparatus for specimen fabrication

Site-specific method for large area uniform thickness plan view transmission electron microscopy sample preparation

Rapid and comprehensive method for evaluating pitting resistance of stainless steel pipe welds

Classified characterization method for connectivity of organic matter (OM)-hosted pores in shale

Intelligent system and method for preparing cryo-electron microscopy samples and electronic device

Method of determining an index of quality of a weld in a formed object through mechanical contact testing

Methods for acquiring planar view stem images of device structures

Method of producing lift out specimens for teaching, practice, and training

Machine for preparing an asphalt sample by polishing the surface of the sample and associated method