STANDARD SAMPLE FOR USE IN TRANSMISSION ELECTRON MICROSCOPE, METHOD OF PREPARING THE SAME, METHOD OF ADJUSTING TRANSMISSION ELECTRON MICROSCOPE, AND METHOD OF ANALYZING OBSERVATION IMAGE OBTAINED WITH TRANSMISSION ELECTRON MICROSCOPE

COMPOSITIONS AND METHODS FOR NANOHISTOLOGY

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTIPLE SAMPLES

SAMPLE PREPARATION WITH NON-UNIFORM DOSE

SPECIMEN POLISHING APPARATUS

PREPARATION METHOD OF MICRO-NANOFLUIDIC MODEL OF TRIPLE-MEDIUM CARBONATE RESERVOIR

OPTICAL END-POINT DETECTION FOR INTEGRATED CIRCUIT DELAYERING; SYSTEMS AND METHODS USING THE SAME

METHOD OF IDENTIFYING DEFECTS IN CRYSTALS

Ion Milling Device

METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INVESTIGATION DEVICE TO PERFORM SUCH METHOD

METHODS FOR DETECTING DEFECTS IN A SINGLE CRYSTAL SILICON STRUCTURE

SUPPORT STRUCTURE OF INVERTED LAMELLA FOR TALL ROI

Quality control evaluation method of cyanate ester matrix resin material within CFRP composite concerning localized hydrolytic degradation

METHOD FOR SCREENING THE OPTIMAL ZINC ION CONCENTRATION OF A PRIMARY LOOP DURING A THERMAL STATE FUNCTION TEST OF A NUCLEAR POWER PLANT

APPARATUS FOR MANUFACTURING ANALYTICAL SEMICONDUCTOR SAMPLES AND METHOD FOR MANUFACTURING ANALYTICAL SEMICONDUCTOR SAMPLES BY USING THE SAME

COMBINED LASER AND BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTIPLE SAMPLES

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

Broad ion beam (BIB) systems for more efficient processing of multiple samples

Ion Milling Device and Ion Milling Method

QUANTITATIVE STATISTICAL CHARACTERIZATION METHOD OF MICRON-LEVEL SECOND PHASE IN ALUMINUM ALLOY BASED ON DEEP LEARNING

Photographing condition determining method for metal structure, photographing method for metal structure, phase classification method for metal structure, photographing condition determining device for metal structure, photographing device for metal structure, phase classification device for metal structure, material property estimating method for metal material, and material property estimating device for metal material

Analysis device, analysis method, and storage medium

ARTIFICIAL INTELLIGENCE METHODS FOR CORRELATING LASER-INDUCED BREAKDOWN SPECTROSCOPY (LIBS) MEASUREMENTS WITH DEGREE OF SENSITIZATION (DOS) VALUES TO DETERMINE THE SENSITIZATION OF AN ALLOY

METHOD FOR DETERMINING TRACE METALS IN SILICON

METHOD TO PREPARE A SAMPLE FOR ATOM PROBE TOMOGRAPHY (APT), PREPARATION DEVICE TO PERFORM SUCH METHOD AND METHOD TO INVESTIGATE A REGION OF INTEREST OF A SAMPLE INCLUDING SUCH PERFORMING METHOD

METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND DENDRITE SPACING OF HIGH-TEMPERATURE ALLOY INGOT

IN-SITU MONITORING TO LABEL TRAINING SPECTRA FOR MACHINE LEARNING SYSTEM FOR SPECTROGRAPHIC MONITORING

Method for detecting coverage rate of intermetallic compound

Optical end-pointing for integrated circuit delayering; systems and methods using the same

Physical calibration slide

Intelligent quantitative microscopic identification system and intelligent identification method for whole rock polished sections

Perimeter trench formation and delineation etch delayering

Die extraction method

Atom probe tomography specimen preparation

Method and system for quantitatively evaluating surface roughness of organic pore of kerogen in shale

Ion milling apparatus and sample holder

Method for evaluating defect in monoclinic gallium oxide

Method of preparing and analyzing thin films

Ion beam delayering system and method, topographically enhanced delayered sample produced thereby, and imaging methods and systems related thereto

Method for preparing a sample for transmission electron microscopy

Adaptive geometry for optimal focused ion beam etching

INVERSION IDENTIFICATION METHOD OF CRYSTAL PLASTICITY MATERIAL PARAMETERS BASED ON NANOINDENTATION EXPERIMENTS

Hydrogen Analysis System

Method for obtaining rock mechanical-geometric parameters and holographic scanning system

Specimen preparation method for eliminating membrane penetration effect on highly-weathered rock

Method of material deposition

METHODS FOR DETERMINING CHEMICAL HETEROGENEITY OF GLASS CONTAINERS

Method of in-situ TEM nanoindentation for damaged layer of silicon

Method, device and system for the treatment of biological cryogenic samples by plasma focused ion beams

Method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials

Perimeter trench formation and delineation etch delayering

Method and system for ion beam delayering of a sample and control thereof

Thin-sample-piece fabricating device and thin-sample-piece fabricating method

Planar grinder

Method of, and an apparatus for, rinsing materialographic samples

Method of acquiring sample for evaluation of SiC single crystal

Methods and compositions for micro-electron diffraction

Apparatus for electrolytic etching and dissolution and method for extracting metal compound particles

Method for extracting metal compound particles, method for analyzing the metal compound particles, and electrolytic solution used therefor

Face-on, gas-assisted etching for plan-view lamellae preparation

Dose-based end-pointing for low-kV FIB milling in TEM sample preparation

Method for operating a plurality of FIB-SEM systems

Methods and apparatus for semiconductor sample workflow

Methods for acquiring planar view STEM images of device structures

Full-view-field quantitative statistical distribution characterization method of precipitate particles in metal material

Method for evaluating surface defects of substrate to be bonded

Specimen preparation and inspection in a dual-beam charged particle microscope

Depth-controllable ion milling

Method for the vapour phase etching of a semiconductor wafer for trace metal analysis

Sample holder, ion milling apparatus, sample processing method, sample observing method, and sample processing and observing method

Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimen

Method for determining defect region

Method of material deposition

SILICON SUBSTRATE ANALYZING DEVICE

Methods, apparatuses, systems and software for treatment of a specimen by ion-milling

Methods for determining chemical heterogeneity of glass containers

Analysis device

Apparatus with two or more particle beams for processing a specimen

COLOURING METHOD FOR WROUGHT ALUMINIUM ALLOY WELDED JOINT COLOUR METALLOGRAPHY

High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella

Loading station for transferring frozen samples at low temperatures

Automatic localized substrate analysis device and analysis method

Method of material deposition

Sample carrier and method for processing a sample

Method of preparing a sample for microstructure diagnostics, and sample for microstructure diagnostics

Method and system for ion beam delayering of a sample and control thereof

Method and system for ion beam delayering of a sample and control thereof

Automated high speed metallographic system

Apparatus for measuring impurities on wafer and method of measuring impurities on wafer

Ion milling apparatus and sample processing method

Method of, and an apparatus for, rinsing materialographic samples

Method for preparing cross-sections by ion beam milling

Workpiece transport and positioning apparatus

Method of preparing a sample for microstructure diagnostics, and sample for microstructure diagnostics

Cross-section processing-and-observation method and cross-section processing-and-observation apparatus

Method for generating image data relating to an object and particle beam device for carrying out this method

Differential imaging with pattern recognition for process automation of cross sectioning applications

Method of modifying a sample surface layer from a microscopic sample

Method for S/TEM sample analysis

Method of specimen processing in an apparatus with two or more particle beams and apparatus for this processing

Specimen preparation device

Specimen holder, specimen preparation device, and positioning method

Ion milling device

Methods and instrumentation for during-synthesis monitoring of polymer functional evolution

MICROSCOPE SLIDE WITH ETCHED SHAPES

Method and System of Creating a Symmetrical FIB Deposition

FILM REMOVING DEVICE

Substrate etching apparatus and substrate analysis method

Ion implantation to alter etch rate

METHOD FOR PREPARING SAMPLES FOR IMAGING

TEM sample preparation

Method for creating S/TEM sample and sample structure

Method and apparatus for sample extraction and handling

Method and system for reducing curtaining in charged particle beam sample preparation

Cross-section processing and observation method and cross-section processing and observation apparatus

Multidimensional structural access

Methods, apparatuses, systems and software for treatment of a specimen by ion-milling

Fabrication of a malleable lamella for correlative atomic-resolution tomographic analyses

High aspect ratio structure analysis

Bulk deposition for tilted mill protection

Workpiece transport and positioning apparatus

Alignment marking for rock sample analysis

Method for S/TEM sample analysis

Observation and photography apparatus

Specimen sample holder for workpiece transport apparatus

Workpiece holder for workpiece transport apparatus

Setup for multiple cross-section sample preparation

SPECIMEN PREPARATION METHOD

Differential imaging with pattern recognition for process automation of cross sectioning applications

Cross section processing method and cross section processing apparatus

Integrated lamellae extraction station

Method for preparing thin samples for TEM imaging

Detaching probe from TEM sample during sample preparation

Cross-section processing-and-observation method and cross-section processing-and-observation apparatus

Skewed sectional measurement of striated glass

Ion milling device

Ion beam sample preparation apparatus and methods

Method to delineate crystal related defects

Low energy ion milling or deposition

Method and arrangement for manufacturing a sample for microstructural materials diagnostics and corresponding sample

Focused ion beam apparatus and method of working sample using the same

Method for preparing samples for imaging

Microfluidic surface processing systems with self-regulated distance-to surface control

Cross-section processing and observation method and cross-section processing and observation apparatus

Method of processing a material-specimen

Automated high speed metallographic system

Method for creating S/TEM sample and sample structure

Particle beam system and method of processing a TEM-sample

Microfluidic surface processing systems with self-regulated distance-to surface control

System and method for ex situ analysis of a substrate

Dose-based end-pointing for low-kV FIB milling TEM sample preparation

Grinder/polisher

Ion beam sample preparation apparatus and methods

Method for S/TEM sample analysis

Lamella creation method and device using fixed-angle beam and rotating sample stage

Preparation of lamellae for TEM viewing

Surface sampling concentration and reaction probe with controller to adjust sampling position

Cross-section processing and observation method and cross-section processing and observation apparatus

High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella

Method and apparatus for ex-situ lift-out specimen preparation

Sample preparation method and apparatus

TEM sample preparation method

Method and apparatus for sample extraction and handling

Method and system for ion beam delayering of a sample and control thereof

Charged particle beam device and sample production method

METHOD OF CHARACTERIZING A MATERIAL USING THREE DIMENSIONAL RECONSTRUCTION OF SPATIALLY REFERENCED CHARACTERISTICS AND USE OF SUCH INFORMATION

Composite charged particle beam apparatus

Method for processing samples held by a nanomanipulator

Method and apparatus for ion beam polishing

REDEPOSITION TECHNIQUE FOR MEMBRANE ATTACHMENT

Charged particle beam apparatus, and sample processing and observation method

Apparatus for measuring impurities on wafer and method of measuring impurities on wafer

Transmission electron microscopy sample etching fixture

Apparatus and method for sample preparation

TEM-lamella, process for its manufacture, and apparatus for executing the process

Apparatus for cooling samples during ion beam preparation

Method for creating S/TEM sample and sample structure

METHOD AND APPARATUS FOR GENERATING THREE-DIMENSIONAL IMAGE DATA

Ion beam sample preparation apparatus and methods

Ion beam sample preparation apparatus and methods

Ion beam sample preparation thermal management apparatus and methods

Method and apparatus for specimen fabrication

Ion beam sample preparation apparatus and methods

Surface sampling concentration and reaction probe

METHOD AND SYSTEM FOR PREPARING A LAMELA

Method of etching surface layer portion of silicon wafer and method of analyzing metal contamination of silicon wafer

Method of evaluating center segregation of continuous cast slab

Defect etching of germanium

METHOD AND SYSTEM FOR PREPARING A SAMPLE

Auxiliary stage and method of utilizing auxiliary stage

ION Beam System and Machining Method

Preparation of test plates for matrix assisted laser desorption ionization

Method and apparatus for specimen fabrication

Etching composition, in particular for strained or stressed silicon materials, method for characterizing defects on surfaces of such materials and process of treating such surfaces with the etching composition

Underwater remote inspection device and method for underwater remote inspection

ANALYTICAL METHOD

Reducing particle implantation

Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument

Method for S/TEM sample analysis

Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging

Method for creating S/TEM sample and sample structure

Method and apparatus for sample extraction and handling

Method for creating S/tem sample and sample structure

High-density FIB-SEM tomography via real-time imaging

Method for treating germanium surfaces and solutions to be employed therein

Focused ion beam system and sample processing method using the same

Method for revealing emergent dislocations in a germanium-base crystalline element

Composite focused ion beam device, and processing observation method and processing method using the same

TEM grids for determination of structure-property relationships in nanotechnology

Method and apparatus for collecting chemicals from semiconductor wafer

Slide holder for sample holder for grinder/polisher

METHOD FOR CLEANING A HIGH RESOLUTION SCANNING ELECTRON MICROSCOPE SAMPLE WITH A LOW POWER ION BEAM

Retractable water dispenser arm for grinder/polisher

Method for metal gate quality characterization

Method of machining a work piece with a focused particle beam

Method for the production of a sample for electron microscopy

Transmission electron microscopy sample etching fixture

Grinder/polisher

METHODS AND INSTRUMENTATION FOR DURING-SYNTHESIS MONITORING OF POLYMER FUNCTIONAL EVOLUTION

Method for the Determination of the Surface Occupation of a Silica Glass Component

METHOD OF REPAIRING A SPECIMEN INTENDED TO BE ANALYSED BY ELECTRON MICROSCOPY

Defect Etching of Germanium

Method for sample preparation

Method and system for imaging a cross section of a specimen

CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVATION METHOD

Method and apparatus for specimen fabrication

Sample Preparation for Micro-Analysis

Method for analyzing quartz member

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

Method and apparatus for specimen fabrication

Charged particle beam processing apparatus

Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same

Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis

Method to analyze physical and chemical properties on the surface layer of a solid

Method for checking surface condition after cleaning

IC chip uniform delayering methods

Ion Milling system and ion milling method

Conditioning chamber for metallurgical surface science

Integrated circuit and methods of measurement and preparation of measurement structure

Charged particle beam device probe operation

Ion beam system and machining method

Probe-holding apparatus, sample-obtaining apparatus, sample-processing apparatus, sample-processing method and sample-evaluating method

Backside unlayering of MOSFET devices for electrical and physical characterization

Sample preparation system

High-density FIB-SEM tomography via real-time imaging

Method of preparing a sample for transmission electron microscopy

Planar view sample preparation

Endpoint for electroprocessing

Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods

Chemical etch solution and technique for imaging a device's shallow junction profile

Electron induced chemical etching/deposition for enhanced detection of surface defects

ELECTRON INDUCED CHEMICAL ETCHING FOR MATERIALS CHARACTERIZATION

Sample preparation

Method of analyzing carbon concentration in crystalline silicon

Method for assaying copper in silicon wafers

Method and apparatus for collecting chemicals from semiconductor wafer

Method for evaluating crystal defects of silicon wafer

Method of manufacturing semiconductor substrate and method of evaluating quality of semiconductor substrate

Method, System and Device for Microscopic Examination Employing Fib-Prepared Sample Grasping Element

Atom probe apparatus and method for working sample preliminary for the same

Method for creating observational sample

SUBSTRATE PROTECTING MEMBER AND METHOD OF FORMING ANALYSIS SAMPLE USING THE SAME

Method and sample for radiation microscopy including a particle beam channel formed in the sample source

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Focused ion beam apparatus for specimen fabrication

Apparatus and method for inspecting a sample of a specimen by means of an electron beam

Charged particle beam apparatus

Processing apparatus using focused charged particle beam

Method and apparatus for processing samples

GRID STRUCTURE FOR HOLDING SPECIMEN OF ELECTRON MICROSCOPY

Examination method and examination assistant device for quartz product of semiconductor processing apparatus

Focused ion beam system

Method of cross-section milling with focused ion beam (FIB) device

Method for local wafer thinning and reinforcement

Method for preparing a sample for electron microscopic examinations, and sample supports and transport holders used therefor

Method and apparatus for preparing specimen

TEM sample preparation from a circuit layer structure

Method and apparatus for specimen fabrication

Glow discharge drilling apparatus and glow discharge drilling method

Ultra-thin sample preparation for transmission electron microscopy

Method and apparatus for quantitative three-dimensional reconstruction in scanning electron microscopy

Charged particle beam device probe operation

Method and apparatus for specimen fabrication

Sample support prepared by semiconductor silicon process technique

Repetitive circumferential milling for sample preparation

Method of obtaining release-standing micro structures and devices by selective etch removal of protective and sacrificial layer using the same

Ion beam device and ion beam processing method

Method of making lamina specimen

Delineation of wafers

Chemical etch solution and technique for imaging a device's shallow junction profile

Method for analysing physical and/or chemical properties of the surface layer of a solid body (variants)

Etching solution for D-defect evaluation in silicon wafer and evaluation method using the same

Planar view TEM sample preparation from circuit layer structures

Method and equipment for specimen preparation

Probe-holding apparatus, sample-obtaining apparatus, sample-processing apparatus, sample-processing method and sample-evaluating method

Transmission electron microscope specimen and method of manufacturing the same

Charged particle beam apparatus and sample manufacturing method