Method and arrangement for detecting free fibre ends in paper

Thermal Maturity Indicator

Apparatuses and methods for magnetic features of articles

Reflective sensor

Window wiper system incorporating window moisture and torque sensors

Method and apparatus for bacterial monitoring

Reflective surface treatments for optical sensors

Multiple light paths architecture and obscuration methods for signal and perfusion index optimization

Method of evaluating a machined surface of a workpiece, a controlling apparatus and a machine tool

Method for analyzing atypical cells in urine, urine analyzer, and method for analyzing atypical cells in body fluid

Method and system for imaging a target

Sensor device with OLED

Multi-spectral reflectometer

Method and apparatus for inspecting defects

Specimen measuring device and computer program product

Method of determining dose, inspection apparatus, patterning device, substrate and device manufacturing method

Method for determining a property of a heterogeneous medium

Device and method for sampling, preparing and analysing a sample

Optical transformation module and optical measurement system, and method of manufacturing a semiconductor device using optical transformation module and optical measurement system

METHOD FOR EVALUATING OPTICAL CHARACTERISTICS OF TRANSPARENT SUBSTRATE, AND OPTICAL DEVICE

OPTICAL MEASURING METHOD AND MANUFACTURING METHOD OF THE ALCOHOL

Process for matching color and appearance of coatings

Detection system and method of detecting corrosion under an outer protective layer

Method of characterizing interactions and screening for effectors

FLUID ANALYSIS SYSTEM WITH INTEGRATED COMPUTATION ELEMENT FORMED USING ATOMIC LAYER DEPOSITION

Devices, systems, and methods for acquisition of an angular-dependent material feature

Optical sensing array architectures for spatial profiling

Integrating sphere type device with specular control

Substrate, a method of measuring a property, an inspection apparatus and a lithographic apparatus

Absorption and scattering effects separation from diffuse spectrum data and model establishment and concentration prediction based thereon

Optical method and system for critical dimensions and thickness characterization

Image measuring method, system, device, and program

Systems and methods for determining the cleanliness of a surface

Method of evaluating optical characteristics of transparent substrate

Integrated illumination and optical surface topology detection system and methods of use thereof

Method of determining dose and focus, inspection apparatus, patterning device, substrate and device manufacturing method

Information processing apparatus, measurement system, information processing method, and storage medium for determining at least one measurement condition to measure reflection characteristics of an object which is to be used to generate a virtual image

Preservation environment information output method, preservation environment information output device, and recording medium

Method for observing biological species

Characterization of a physical object based on its surface roughness

System and method for haze measurement

Measurement apparatus and measurement method

Spectroscopic measurement device

Long wavelength infrared detection and imaging with long wavelength infrared source

Rod lens for lighting apparatus, lighting apparatus including the same and semiconductor manufacturing method using the apparatus

Barycentric filtering for measured biderectional scattering distribution function

Optical microscopy vapor-condensation-assisted device

Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same

MEASUREMENT PROBE AND OPTICAL MEASUREMENT SYSTEM

Methods for measuring concentrations of analytes in turbid solutions by applying turbidity corrections to raman observations

Device for inspecting substrate having irregular rough surface and inspection method using same

Scatterometry metrology methods and methods of modeling formation of a vertical region of a multilayer semiconductor substrate to comprise a scatterometry target

Recording medium determining device and recording medium determination method

Multispectral camera using zero-mode channel

Reflection characteristic measuring apparatus

Photoelectric smoke sensor

Flare-measuring mask, flare-measuring method, and exposure method

Formulation of complex coating mixtures with effect pigments

Catadioptric illumination system for metrology

OPTICAL SENSOR AND IMAGE FORMING APPARATUS INCORPORATING SAME

Attachment for placement onto an optical sensor and method of operating an optical sensor

Photometric device and method

Method and apparatus for creating images of fibrous structures

Material classification

Test apparatus for reflective cavity characterization

Light guide member having a curvatured detection face, object detection apparatus, and vehicle

Light guide member, object detection apparatus, and vehicle

Method and device for measuring the colour of an object

Sensor apparatus and image forming apparatus incorporating same

Optical detection device and optical detection method

Front quartersphere scattered light analysis

Front quartersphere scattered light analysis

System for determining a composition of a sample using wavelength dependent variability measurement with multiple time intervals

Assay devices and methods

Image processing device, method for controlling same, program, and inspection system

Hemispherical scanning optical scatterometer

Photon emitter array

Surface features by azimuthal angle

Apparatuses and methods for magnetic features of articles

Diagnostic detection device

Method of measuring surface properties of polishing pad

Methods and apparatus for an optical system outputting direct light and having a sensor

Apparatus for measuring surface properties of polishing pad

PERIODIC STRUCTURE AND MEASUREMENT METHOD USING THE SAME

Moisture sensor, moisture detector, and image forming apparatus

Sensor and image-forming apparatus

Remote optical sensing of the integrity of a structure using reflected or scattered light

Surface shape measuring apparatus

Method of fabricating translucent materials with desired appearance

Recording medium determining device and recording medium determination method

Reader for urine analysis

Reflection characteristic measuring apparatus

Apodization for pupil imaging scatterometry

Imaging a transparent article

Chemical characterization of surface features

Multispectral imaging for quantitative contrast of functional and structural features of layers inside optically dense media such as tissue

Material identification and discrimination

Imaging device and imaging system

Optical measuring device

Infrared skin detection sensor

Optical characteristic measuring apparatus

Scattered light measurement system

System with multiple scattered light collectors

Systems and methods for screening of biological samples

Optical polarimetric imaging

System and apparatus for measurement of light scattering from a sample

Optical measurement apparatus and optical measurement system

Duct detector with improved functional test capability

Apparatus and method for inspecting matter

Cell analyzer, cell processing apparatus, specimen preparing apparatus

Optical sensor and image forming apparatus

Method of characterizing interactions and screening for effectors

LASER SCAN DEVICE

Optical sensor and image forming apparatus

Optical analysis system for dynamic, real-time detection and measurement

Optical metrology tool equipped with modulated illumination sources

Methods and systems for photoacoustic signal processing

METHODS AND SYSTEMS FOR PHOTOACOUSTIC SIGNAL PROCESSING

COMPONENT CONCENTRATION MEASUREMENT DEVICE AND COMPONENT CONCENTRATION MEASUREMENT METHOD

Method for determining characteristics of a photoconverter without contact

OPTICAL SENSOR, IMAGE FORMING APPARATUS AND DETERMINATION METHOD

Moisture sensor, moisture detector, and image forming apparatus

Methods and systems for determining a characteristic of a wafer

Device, system and method for quantifying fluorescence and optical properties

Method and apparatus for optically inspecting a test specimen having an at least partly reflective surface

Diffuse reflection output conversion method, attached powder amount conversion method, and image forming apparatus

Modeling and rendering of heterogeneous translucent materals using the diffusion equation

LOW PROFILE, HIGH FLOWTHROUGH SMOKE CHAMBER

Tri modal spectroscopic imaging

Particle size analyzer

Method for the direct measure of molecular interactions by detection of light reflected from multilayered functionalized dielectrics

LASER-BASED METHOD FOR FRICTION COEFFICIENT CLASSIFICATION IN MOTOR VEHICLES

Laser radar projection with object feature detection and ranging

Evaluation method of fouling, fouling evaluation apparatus, production method of optical member, optical layered body, and display product

Evaluation method of fouling, fouling evaluation apparatus, production method of optical member, optical layered body, and display product

Apparatus and method for detecting the presence of water on a remote surface

Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device

METHOD AND SYSTEM FOR THE MEASUREMENT/DETECTION OF CHEMICAL SPILLAGE

Mixture segregation testing devices and methods

Image processing apparatus, method, and storage medium for performing soft proof processing

Inspecting a workpiece using scattered light

Multispectral imaging for quantitative contrast of functional and structural layers inside optically dense media such as tissue

Catadioptric illumination system for metrology

Methods and systems for optically characterizing a turbid material using a structured incident beam

Chemical/biological sensor employing scattered chromatic components in nano-patterned aperiodic surfaces

PORTABLE DEVICE AND METHOD FOR SPECTROSCOPIC ANALYSIS

CHARACTERIZATION OF PHYSICOCHEMICAL PROPERTIES OF A SOLID

Process for generating bidirectional reflectance distribution functions of gonioapparent materials with limited measurement data

Process for generating bidirectional reflectance distribution functions of gonioapparent materials with limited measurement data

Substrate, a method of measuring a property, an inspection apparatus and a lithographic apparatus

Device for the contact-less detection of the degree of dryness of a coat of varnish, and method for the same

System and method for hyperspectral imaging of treated fingerprints

Image forming apparatus for forming image on record medium

WET DETECTION DEVICE, WET DEVICE, AND WET DETECTING METHOD

Assay Devices and Methods

Thermal treatment apparatus, thermal treatment method and method of manufacturing semiconductor device

Optical detection system for motor-vehicles having multiple functions, including detection of the condition of the road surface

Light scattering measurement system based on flexible sensor array

Methods of optically monitoring wound healing

OPTICAL MEASURING UNIT AND METHOD FOR CARRYING OUT A REFLECTIVE MEASUREMENT

Detection apparatus

Integrating optical system and methods

Method and device for detecting soiling

Apparatus for detecting defects using multiple coordinate systems

Optical method for determining morphological parameters and physiological properties of tissue

SENSOR USING MASS ENHANCEMENT OF NANOPARTICLES

Inspection Apparatus, Lithographic Apparatus and Method of Measuring a Property of a Substrate

Information processing apparatus and method

System and method for improved forensic analysis

Rain sensor

Smoke sensor including a current to voltage circuit having a low frequency correction means to produce a correction current

Arrangement for Determining the Reflectivity of a Sample

DEVICE FOR OPTICAL SPECTROSCOPY AND MECHANICAL SWITCH FOR SUCH A DEVICE

Optical scanning systems and methods for measuring a sealed container with a layer for reducing diffusive scattering

Optical assay system for intraoperative assessment of tumor margins

Dynamic Calibration of an Optical Spectrometer

Surface inspection method and surface inspection apparatus

Back quartersphere scattered light analysis

Method for controlling the register between a printed pattern and a three-dimensional pattern on a packaging material

Flare-measuring mask, flare-measuring method, and exposure method

Device manufacturing method with angular-resolved spectroscopic lithography characterization

Image forming apparatus with a line sensor and a method of image forming of an image forming apparatus with a line sensor

Apparatus for observing the surface of a sample

Apparatus and method for observing the surface of a sample

Method for inspecting defect of article to be inspected

Device for optical characterization

PORTABLE MEASURING APPARATUS AND MEASURING METHOD FOR DETECTING SUNBURN

Inspection device and inspection method for the optical examination of object surfaces, particularly of wafer surfaces

Defect inspection method and apparatus

Self-contained multivariate optical computing and analysis system

ASSAY DEVICES AND METHODS

System and method for controlling a beam source in a workpiece surface inspection system

Apparatus for photodynamic therapy and photodetection

Optical device for motor vehicles, for detecting the condition of the road surface

Evaluation method of fouling, fouling evaluation apparatus, production method of optical member, optical layered body, and display product

Inspecting a workpiece using polarization of scattered light

Front quartersphere scattered light analysis

Photodetector and jig for sample holder

Process for generating bidirectional reflectance distribution functions of gonioapparent materials with limited measurement data

Method and apparatus for modelling and simulating optical properties of special effect paints and for determining illumination and measurement geometries for spectral photometers

Method and apparatus for the examination of an object

Method for measuring coating appearance and the use thereof

Method and apparatus for the analysis of materials

Systems and methods for detecting scratches on non-semiconductor wafer surfaces

Defect Inspection Method and Apparatus

Method for estimating reflectance

Spectrophotometer system with modular 45/0 head

Observing device

HIGH-THROUGHPUT SPECTRAL IMAGING AND SPECTROSCOPY APPARATUS AND METHODS

Optical analysis system for dynamic real-time detection and measurement

Method of high-speed monitoring based on the use of multivariate optical elements

Modeling and rendering of heterogeneous translucent materials using the diffusion equation

Device and Method for Spectrometric System

Method for determining color perception in multilayer systems

Light Measurement Method and Apparatus

Image capturing system, image capturing method, and computer readable medium

Light scattering property measurement method

Microporous materials, methods of making, using, and articles thereof

Apparatus and Method for Wafer Edge Exclusion Measurement

Apparatus and Method for Wafer Edge Defects Detection

Optical inspection of test surfaces

Thermal treatment apparatus, thermal treatment method and method of manufacturing semiconductor device

METHOD AND APPARATUS FOR CLEANING AN INTEGRATING SPHERE

Optical assay system for intraoperative assessment of tumor margins

Inspection apparatus and method

Microporous materials, methods of making, using, and articles thereof

Method and apparatus for establishing reflection properties of a surface

Body fluid constituents measurement device

Systems and methods for inspecting a specimen with light at varying power levels

System and method for controlling light scattered from a workpiece surface in a surface inspection system

Method, apparatus and system for measuring the transparency of film

Nanocomposite material for direct spectroscopic detection of chemical vapors

Apparatus for angular-resolved spectroscopic lithography characterization

Scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifacts

Integrated sensing module for handheld spectral measurements

Device of Analysing the Colour of a Unhomogeneous Material, Like Hair, and Method Thereof

System and method for acquiring and evaluating optical signals

Inspection device for inspecting container closures

Methods and apparatus for inspecting a plurality of dies

Image forming apparatus with a laser record medium detecting device

Method and its apparatus for inspecting particles or defects of a semiconductor device

Laser radar projection with object feature detection and ranging

Method and apparatus for the quantitative determination of surface properties

Method and apparatus for determination of surface properties of coatings by determining contrast of an evaluated image

Inspection device and inspection method of an object to be inspected

Assay devices and methods

Porous photonic crystal with light scattering domains and methods of synthesis and use thereof

Surface inspection method and surface inspection apparatus

Method of measurement, an inspection apparatus and a lithographic apparatus

Method, system and apparatus of inspection

Devices For Monitoring Particulate Accumulation On A Filter And Related Methods

Method for continuous, in situ evaluation of entire wafers for macroscopic features during epitaxial growth

Method and apparatus for examining surfaces containing effect pigments

Methods for using light reflection patterns to determine location of pith and curvature of the annual ring

Threshold determination in an inspection system

Apparatus for analysing surface properties with indirect illumination

Analysis system and method for analyzing a sample on an analytical test element

Test tape unit for blood tests

Automatic wafer edge inspection and review system

Surface inspection apparatus and surface inspection method

Particle removal tool with integrated defect detection/analysis capability

Defect inspection method and apparatus

Methods and systems for determining a characteristic of a wafer

Surface Inspection Method and Surface Inspection Apparatus

Determining surface properties with angle offset correction

Apparatus for angular-resolved spectroscopic lithography characterization and device manufacturing method

Enumeration Method of Analyte Detection

Enhancing selectivity and/or sensitivity of spectroscopic measurements in media

Determining Information about Defects or Binning Defects Detected on a Wafer after an Immersion Lithography Process is Performed on the Wafer

Method and Device for Measuring Coarseness of a Paint Film

Method and its apparatus for inspecting particles or defects of a semiconductor device

Inspection method and apparatus using same

Substrate illumination and inspection system

Method and apparatus for inspecting particles or defects of a semiconductor device

System and method for controlling a beam source in a workpiece surface inspection system

Signal analysis using multi-mode, common-path interferometry

Method and its apparatus for detecting defects

Device for measuring calories of food items based on near-infrared optical measurements using a plurality of light sources

Moisture detection device

Depth-resolved reflectance instrument and method for its use

Analysis element for use in method of testing specimen

Tri modal spectroscopic imaging

Method for measuring a color property of a liquid using a liquid measurement cell having a transparent partition therein

Liquid measurement cell having a transparent partition therein

System for measuring a color property of a liquid

Method of and device for detecting oil pollutions on water surfaces

Integrated sensing system approach for handheld spectral measurements having a disposable sample handling apparatus

Optical system for plant characterization

Method and system for in situ spectroscopic evaluation of an object

Systems and methods for providing illumination of a specimen for inspection

Method and apparatus for determining liquid absorption of aggregate

System and method for inspecting a workpiece surface by analyzing scattered light in a front quartersphere region above the workpiece

Methods, systems, and computer program products for optimization of probes for spectroscopic measurement in turbid media

Method of inspecting for defects and apparatus for performing the method

Method and its apparatus for inspecting particles or defects of a semiconductor device

Apparatus for measuring goniometric reflection property of sample

Method and apparatus for determining surface properties

System and method for inspection of a workpiece surface using multiple scattered light collectors

APPARATUS AND METHODS FOR SCATTEROMETRY OF OPTICAL DEVICES

Sensing light