ClassID:

167910

G01N21/4738 - page 3 - CPC Classification

Classification description:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which incident light is modified in accordance with the properties of the material investigated; Scattering, i.e. diffuse reflection Diffuse reflection , e.g. also for testing fluids, fibrous materials

Recent Application in this class:
#601
20060238744
2006-10-26

Evaporative light scattering detector

#602
20060234386
2006-10-19

Method and system for measuring lactate levels in vivo

#603
20060227329
2006-10-12

Light scatter measurement apparatus and method

#604
20060217601
2006-09-28

Terahertz system for detecting the burn degree of skin

#605
20060209315
2006-09-21

Device and method for identifying image forming print medium

#606
20060207325
2006-09-21

Window fog detecting apparatus

#607
20060197945
2006-09-07

System and method for inspecting a workpiece surface using surface structure spatial frequencies

#608
20060192957
2006-08-31

Colour measurement device with associated measurement head

#609
20060192950
2006-08-31

System and method for inspecting a workpiece surface using combinations of light collectors

#610
20060192949
2006-08-31

System and method for inspecting a workpiece surface by analyzing scattered light in a back quartersphere region above the workpiece

#611
20060192948
2006-08-31

System and method for inspecting a workpiece surface using polarization of scattered light

#612
20060189860
2006-08-24

Near infrared spectroscopy device with reusable portion

#613
20060186407
2006-08-24

Device for measuring the reflection factor

#614
20060186406
2006-08-24

Method and system for qualifying a semiconductor etch process

#615
20060186362
2006-08-24

System and method for controlling light scattered from a workpiece surface in a surface inspection system

#616
20060181700
2006-08-17

System and method for signal processing for a workpiece surface inspection system

#617
20060170870
2006-08-03

Laser projection with object feature detection

#618
20060167348
2006-07-27

Method for generating a net analyte signal calibration model and uses thereof

#619
20060139649
2006-06-29

Light source wavelength correction

#620
20060124511
2006-06-15

Optical paper sorting method device and apparatus

#621
20060103837
2006-05-18

Glare-directed imaging

#622
20060091332
2006-05-04

Method and its apparatus for inspecting particles or defects of a semiconductor device

#623
20060082767
2006-04-20

Darkfield inspection system having a programmable light selection array

#624
20060078929
2006-04-13

Device for the amplification and detection of nucleic acids

#625
20060076523
2006-04-13

Light sensor, and detecting mechanism and light-measuring mechanism in analyzing device

#626
20060033909
2006-02-16

Reticle particle calibration standards

#627
20060017676
2006-01-26

Large substrate flat panel inspection system

#628
20050273011
2005-12-08

Multispectral imaging for quantitative contrast of functional and structural features of layers inside optically dense media such as tissue

#629
20050264798
2005-12-01

Method and its apparatus for inspecting particles or defects of a semiconductor device

#630
20050174567
2005-08-11

Crack detection system

#631
20050163364
2005-07-28

Process for checking a laser weld seam

#632
20050146725
2005-07-07

Method and apparatus for measuring light reflections of an object

#633
20050135967
2005-06-23

Automatic analyzer

#634
20050107707
2005-05-19

Subcutaneous fat thickness measuring method, subcutaneous fat thickness measuring apparatus, program and recording medium

#635
20050105103
2005-05-19

Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers

#636
20050037511
2005-02-17

Flow sensing for determination of assay results

#637
20050037510
2005-02-17

Early determination of assay results

#638
20050037499
2005-02-17

Apparatus and method for determining temperatures at which properties of materials change

#639
20050036148
2005-02-17

Optical arrangement for assay reading device

#640
20050036135
2005-02-17

Methods and apparatus for detecting and quantifying surface characteristics and material conditions using light scattering

#641
20050024633
2005-02-03

Method and its apparatus for inspecting particles or defects of a semiconductor device

#642
20050018188
2005-01-27

Method for monitoring particle size

#643
20050018179
2005-01-27

Darkfield inspection system having a programmable light selection array

#644
20050014282
2005-01-20

Method and device for analysing blushing in dispersion films

#645
20050002038
2005-01-06

Optical measuring apparatus and optical measuring method

#646
18770243
2025-08-26

System and method for imaging an astronomical object from space

#647
17147713
2022-11-01

Integrated detection scheme for fast blood flow measurement

#648
15705731
2018-11-06

Metal chalcogenide quantum dots for the detection of nitroaromatic chemicals

#649
15615774
2019-08-13

Coupling of thin layer chromatography (TLC) to quantum cascade laser spectroscopy (QCLS) for qualitative and quantitative field analyses of explosives and other pollutants

#650
15233720
2023-01-10

Hydration monitor and methods of use

#651
14684542
2018-01-02

Air quality sensor

#652
14581802
2016-01-19

Aircraft light device

#653
14309888
2017-02-07

Methods and devices for sample analysis

#654
14308278
2016-09-27

Test model for wearable devices