METHOD AND DEVICE FOR MICROSCOPIC IMAGING BASED ON FREQUENCY-DOMAIN MODULATION

Microscope, slide reader and method for microscopy

Microscope, slide reader and microscopy method

OPTICAL SENSOR COMPRISING A WINDOW AND A WINDOW MONITORING UNIT AND A METHOD FOR MONITORING THE TRANSPARENCY OF THE WINDOW

DETECTION MODULE, DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD

IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTURING SYSTEMS

EUV MASK INSPECTION APPARATUS AND METHOD THROUGH ILLUMINATION CONTROL

SYSTEM, ROBOT AND METHOD FOR MEASURING THE COLOR OF AN AREA OF A SAMPLE OR OF A VEHICLE'S PART

SCHLIEREN SYSTEM FOR IN-SITU/ONLINE MONITORING OF SPATTER IN LARGE-AREA MELT POOL

SCANNING APPARATUS, SCANNING METHOD, AND STORAGE MEDIUM

FAST MULTIPHOTON MICROSCOPE

METHODS AND SYSTEMS FOR COUNTER SCAN AREA MODE IMAGING

SCANNING METHOD, SCANNING SYSTEM, AND POSITION INFORMATION ACQUISITION METHOD

METHOD AND DEVICE FOR REMOVING BACKGROUND NOISE IN MICROSCOPIC IMAGING BASED ON FREQUENCY-DOMAIN MODULATION

STIMULATED RAMAN PHOTOTHERMAL MICROSCOPE WITH OPTICAL PARAMETRIC AMPLIFIER SOURCE

STIMULATED RAMAN PHOTOTHERMAL MICROSCOPE WITH OPTICAL PARAMETRIC AMPLIFIER SOURCE

STIMULATED RAMAN PHOTOTHERMAL MICROSCOPE

OPEN-TOP TWO-PHOTON LIGHT SHEET MICROSCOPE AND OPERATING METHOD THEREOF

ILLUMINATION OPTICAL UNIT FOR A MASK INSPECTION SYSTEM

SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SEMICONDUCTOR MEASUREMENT APPARATUS

SINGLE-PIXEL MULTISPECTRAL IMAGER FOR FLARE AND BURNER COMBUSTION EFFICIENCY MEASUREMENT

APPARATUS FOR ILLUMINATING MATTER

APPARATUS FOR LOCALIZING SINGLE FLUORESCENT MOLECULES COMPRISED IN A SAMPLE USING SINGLE MOLECULE LOCALIZATION MICROSCOPY

HIGH SPEED DEEP TISSUE IMAGING SYSTEM USING MULTIPLEXED SCANNED TEMPORAL FOCUSING

Three-dimensional fluorescence imaging system comprising single-objective light-sheet microscopy

Stimulated Raman photothermal microscope

Fast multiphoton microscope

IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTURING SYSTEMS

SYSTEM, ROBOT AND METHOD FOR MEASURING THE COLOR OF AN AREA OF A SAMPLE OR OF A VEHICLE'S PART

HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS

SPECTROSCOPIC MEASUREMENT DEVICE

MULTI-SPOT CONFOCAL IMAGING SYSTEM WITH SPECTRAL MULTIPLEXING

Surface Sensing Systems and Methods for Imaging a Scanned Surface of a Sample Via Sum-Frequency Vibrational Spectroscopy

SYSTEMS AND METHODS FOR LIVE PROJECTION IMAGING FOR FLUORESCENCE MICROSCOPY

CAT'S-EYE SWEPT SOURCE LASER FOR OCT AND SPECTROSCOPY

LINE FIELD SWEPT SOURCE OCT SYSTEM AND SPECTROSCOPY SYSTEM

Method, apparatus and computer program for localizing an emitter in a sample

Inspection apparatus and focal position adjustment method

Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

Scanning infrared measurement system

Affinity Reagent and Catalyst Discovery Through Fiber-Optic Array Scanning Technology

Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

System and method for mobile device display and housing diagnostics

MULTI-FOCAL STRUCTURED ILLUMINATION MICROSCOPY SYSTEMS AND METHODS

OPTOCHEMICAL SENSOR, SENSOR CAP, USE OF THE OPTOCHEMICAL SENSOR, AND METHOD FOR PRODUCING AN ANALYTE-SENSITIVE LAYER OF AN OPTOCHEMICAL SENSOR

PROCESS AND SYSTEM FOR MEASURING MORPHOLOGICAL CHARACTERISTICS OF FIBER LASER ANNEALED POLYCRYSTALLINE SILICON FILMS FOR FLAT PANEL DISPLAY

Scanning infrared measurement system

Multiplexed Single Molecule Analyzer

High speed deep tissue imaging system using multiplexed scanned temporal focusing

Systems and methods for instant total internal reflection fluorescence/ structured illumination microscopy

Multifocal photoacoustic microscopy through an ergodic relay

Fluorescence lifetime sensor module and method of determining a fluorescence lifetime using a sensor module

EUV mask inspection apparatus and method, and EUV mask manufacturing method including EUV mask inspection method

Multi-focal structured illumination microscopy systems and methods

Fluorescence observation device

Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

Scanning infrared measurement system

Systems and methods for instant total internal reflection fluorescence/ structured illumination microscopy

HANDHELD ANALYZER AND METHOD FOR MEASURING ELEMENTAL CONCENTRATION

Multi-focal structured illumination microscopy systems and methods

Uniform and scalable light-sheets generated by extended focusing

High speed spectroscopy using temporal positioned optical fibers with an optical scanner mirror

Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

Nondestructive inspection method for coatings and ceramic matrix composites

Scanning system and method for scanning an object

Method and apparatus for optical detection of bio-contaminants within a lumen

Apparatus for optical detection of bio-contaminants by comparing intensities of filtered light at two predetermined wavelengths

Apparatus for optical detection of bio-contaminants based upon measurement of saturation of light intensities at fluorescence wavelength relative to light intensities at a predetermined wavelength

Multi-surface specular reflection inspector

Method of detecting defect location using multi-surface specular reflection

Inspection system and method for inspecting a sample by using a plurality of spaced apart beams

Optical analysis device and biomolecular analysis device

Detection device, detection method, and non-transitory computer-readable recording medium storing detection program

Method for 2D/3D inspection of an object such as a wafer

Light-field microscope

Fixed optics photo-thermal spectroscopy reader and method of use

Affinity Reagent and Catalyst Discovery Though Fiber-Optic Array Scanning Technology

Pulsed light synchronizer and microscope system

MACHINE FOR DETECTING TINY PARTICLES

System and method for inducing and detecting multi-photon processes in a sample

Inspection method of vitreous silica crucible

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

Method and device for detecting the surface structure and properties of a probe

Scanning infrared measurement system

Front quartersphere scattered light analysis

Method and apparatus for determining a density of fluorescent markers in a sample

Apparatus for optical detection of bio-contaminants

Systems for custom coloration

System and method for oblique incidence scanning with 2D array of spots

Laser scanning microscope apparatus

Method and apparatus for inspecting laminated iron core

Multi-path interferometeric sensor

Light-emitting device including photoluminescent layer

Method for optical detection of bio-contaminants

Monitoring method and apparatus for control of excimer laser annealing

Method and device for inspecting packaging welds

Inspection method of vitreous silica crucible

Method for detecting defects in a rod-shaped transparent object

An image forming method of a fluorescent sample

Sensor Array for Verifying the Condition of an Electronic Device

Delta die and delta database inspection

Variable image field curvature for object inspection

Fluorescence detection device

Apparatus for inspecting edge of substrate

Method and apparatus for detecting a trench created in a thin film solar cell

Optical detection apparatus and method of compensating detection error

Distribution of refractive index measurement by synthetic aperture tomography

Metrology optimized inspection

Detecting IC Reliability Defects

Systems for custom coloration

Methods and apparatus to obtain suspended particle information

Multi-Spectral Defect Inspection for 3D Wafers

Measurement of treatment agent in a process stream using ultraviolet-visible (UV-vis) spectroscopy, and related systems and processes

Sensor apparatus and image forming apparatus incorporating same

Method and device for evaluating a wooden board

Particulate contamination measurement method and apparatus

Sample holding carrier, and fluorescence detection system and fluorescence detection device that use same

Front quartersphere scattered light analysis

Front quartersphere scattered light analysis

High resolution object inspection apparatus using terahertz wave

Metrology systems and methods

System for determining a composition of a sample using wavelength dependent variability measurement with multiple time intervals

Device for optically scanning and measuring an environment

Optical unit, fluorescence detection device, and fluorescence detection method

Display analysis using scanned images

Apparatus, system and method for detecting matter

DETECTION OF H2S IN NATURAL GAS AND HYDROCARBON STREAMS USING A DUAL-PATH NEAR-IR SPECTROSCOPY SYSTEM

LASER SCANNING METHOD FOR MEASURING IN VIVO SUBSTANCES

Illumination system for detecting the defect in a transparent substrate and a detection system including the same

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

Multiplexing EUV sources in reticle inspection

Scattered light measurement system

System with multiple scattered light collectors

Motion control systems and methods for biosensor scanning

Apparatus for high-throughput suspension measurements

Extended range optical imaging system for use in turbid media

Inspecting a workpiece using scattered light

Methods and apparatus to obtain suspended particle information

Metrology systems and methods

Optical scanning systems and methods for measuring a sealed container with a layer for reducing diffusive scattering

Back quartersphere scattered light analysis

Surface plasmon resonance sensor using rotating mirror

System and method for controlling a beam source in a workpiece surface inspection system

Inspecting a workpiece using polarization of scattered light

Front quartersphere scattered light analysis

Systems for measuring backscattered light using rotating mirror

Tomographic phase microscopy

System and method for controlling light scattered from a workpiece surface in a surface inspection system

System and method for controlling a beam source in a workpiece surface inspection system

Scanning apparatus for optically scanning surfaces

Optical detection apparatus and method thereof

System and method for inspecting a workpiece surface by analyzing scattered light in a front quartersphere region above the workpiece

System and method for inspection of a workpiece surface using multiple scattered light collectors

System and method for inspecting a workpiece surface using surface structure spatial frequencies

System and method for inspecting a workpiece surface using combinations of light collectors

System and method for inspecting a workpiece surface by analyzing scattered light in a back quartersphere region above the workpiece

System and method for inspecting a workpiece surface using polarization of scattered light

System and method for controlling light scattered from a workpiece surface in a surface inspection system

Photothermal conversion measurement apparatus, photothermal conversion measurement method, and sample cell

System and method for signal processing for a workpiece surface inspection system

Dark-field confocal microscopy measurement apparatus and method based on differential fractional vortex beam

Scattered radiation optical scanner

Automated scanning path planner with path calibration for high frame rate multi photon laser scanning microscope with wide field of view