INSPECTION DEVICE FOR SIDE SURFACE OF CYLINDRICAL BATTERY

WAFER DEFECT INSPECTION SYSTEM

APPARATUS AND METHOD FOR MEASURING WAFERS

DEVICE FOR INSPECTING LATERAL SURFACE OF CYLINDRICAL BATTERY

Digital mirror device based code-division multiplexed Raman optical mapping system for wide field imaging

Line scanning mechanical streak systems and methods for phosphorescence lifetime imaging

Mirror device, mirror drive method, light irradiation device, and image acquisition device

IMAGE GENERATION DEVICE

Fast two-photon imaging by diffracted swept-laser excitation

Mirror device, mirror drive method, light irradiation device, and image acquisition device

Method, apparatus and software for detection and localization of hidden defects in optically diffuse media

Welding monitoring system and welding monitoring method

Welding monitoring system and welding monitoring method

SURFACE SHAPE MEASURING APPARATUS AND DEFECT DETERMINING APPARATUS

Microscope and microscopy method

Optoelectronic sensor and method for the transmission monitoring of a front screen

Optical metrology system for spectral imaging of a sample

OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE

Fluorescence imaging autofocus systems and methods

Image acquisition device and image acquisition method

Non-destructive inspection system for display panel and method, and non-destructive inspection apparatus thereof

Multi-channel fluorescence detecting module and nucleic acid analysis system having the same

Optical illumination apparatus and method having a reflective arrangement with moveable components for adjusting incident light

Non-ionizing imager

MICROSCOPE

System and method for carrying out fibre-type multiphoton microscopic imaging of a sample

DYNAMIC WAFER STRESS MANAGEMENT SYSTEM

Mapping-measurement apparatus