169932 ⎘
Investigating materials by wave or particle radiation secondary emission combination of measurements, 2 kinds of secondary emission
PATTERNED X-RAY EMITTING TARGET
#2SYSTEM AND METHOD FOR DETERMINING MASS FRACTIONS IN A TEST SAMPLE WITH WAVE-LENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETERS
#3Method and system for determining sample composition from spectral data
#4Patterned x-ray emitting target
#5Charged particle beam irradiation apparatus and control method
#6Analyzer
#7Method and system for stress testing of materials using laser accelerated particles
#8Method of examining a sample using a charged particle microscope
#9Method for rapid analysis of gold
#10Method for determining the performance of a photolithographic mask