G01N2223/08 - CPC Classification Index

ClassID:

169940 ⎘

G01N2223/08 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring cathode luminescence (U.V.)

SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE

Method for improving an EBSD/TKD map

Dislocation type and density discrimination in semiconductor materials using cathodoluminescence measurements

Method of examining a sample using a charged particle microscope

Three-dimensional imaging in charged-particle microscopy

Method and device for measuring unoccupied states of solid

Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment