169965 ⎘
Investigating materials by wave or particle radiation Sources of radiation
Sub-classes:APPARATUS AND METHOD FOR INSPECTING X-RAY
#2METHODS AND APPARATUS FOR RADIOGRAPHIC SOURCE EXPOSURE
#3INSPECTION APPARATUS AND INSPECTION METHOD
#4RAY SCANNING APPARATUS
#5RADIATION INSPECTION SYSTEM AND METHOD
#6X-RAY LINE SCAN FOR FOREIGN OBJECT DEBRIS DETECTION
#7INSPECTION SYSTEM AND METHOD
#8RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM
#9METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNTING DETECTORS OF IMAGING DEVICES
#10System and method for inspecting defects of structure by using X-ray
#11Thin film damage detection function and charged particle beam device
#12Polarized, energy dispersive x-ray fluorescence system and method
#13X-RAY GENERATION DEVICE AND X-RAY IMAGING SYSTEM
#14METHODS AND APPARATUS FOR RADIOGRAPHIC SOURCE EXPOSURE
#15METHOD OF EVALUATING PRIMARY OPTICAL SYSTEM OF ELECTRON BEAM OBSERVATION DEVICE, EVALUATION DEVICE USED THEREFOR, AND METHOD OF MANUFACTURING SAME
#16Inspection apparatus and inspection method
#17Inspection apparatus and inspection method
#18Inspection apparatus and inspection method
#19Inspection apparatus and inspection method
#20Inspection apparatus and inspection method
#21Method and apparatus for Schottky TFE inspection
#22System and method for inspecting defects of structure by using X-ray
#23X-ray tube cathode focusing element
#24SCINTILLATOR AND CHARGED PARTICLE RADIATION APPARATUS
#25SYSTEM AND METHOD FOR ELECTRON CRYOMICROSCOPY
#26MULTI-ELECTRON BEAM INSPECTION APPARATUS AND ADJUSTMENT METHOD FOR THE SAME
#27Shielding strategy for mitigation of stray field for permanent magnet array
#28System and method for inspecting defects of structure by using x-ray
#29Detection system for X-ray inspection of an object
#30Electron Source, Electron Beam Device, and Method for Manufacturing Electron Source
#31Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection
#32Method and apparatus for Schottky TFE inspection
#33Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets
#34Imaging systems and methods of operating the same
#35Battery Module Comprising Metal Particle-Dispersed Thermal Conductive Resin and Method and System for Inspecting Same
#36Two-step material decomposition calibration method for a full size photon counting computed tomography system
#37Energy-dispersive X-ray diffraction analyser comprising a substantially X-ray transparent member having an improved reflection geometry
#38Two-step material decomposition calibration method for a full size photon counting computed tomography system
#39Non-destructive inspection system comprising neutron radiation source and neutron radiation method
#40X-ray instrument with ambient temperature detector
#41X-ray generation apparatus and X-ray imaging apparatus
#42Rapid ore analysis to enable bulk sorting using gamma-activation analysis
#43Wafer inspection apparatus and wafer inspection method
#44Device, system and method for X-ray diffraction analysis of an electrode of an electrochemical cell, at operating temperature and under current
#45Charged particle beam device
#46Systems and Methods for Using Three-Dimensional X-Ray Imaging in Meat Production and Processing Applications
#47X-RAY SCANNING SYSTEM AND METHOD
#48Method and system for reconstructing 3-dimensional images from spatially and temporally overlapping x-rays
#49Scanning imaging system for security inspection of an object and imaging method thereof
#50Image acquisition device, image acquisition method, and image correction program
#51METHOD AND SYSTEM FOR RECONSTRUCTING 3-DIMENSIONAL IMAGES FROM SPATIALLY AND TEMPORALLY OVERLAPPING X-RAYS
#52X-ray generator output regulation
#53Stationary CT apparatus
#54X-ray scanner with blanking
#55Secondary image removal using high resolution x-ray transmission sources
#56Scatter X-ray imaging with adaptive scanning beam intensity