ClassID:

169965

G01N2223/20 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation Sources of radiation

Sub-classes:
Recent Application in this class:
#1
20260079120
2026-03-19

APPARATUS AND METHOD FOR INSPECTING X-RAY

#2
20260002892
2026-01-01

METHODS AND APPARATUS FOR RADIOGRAPHIC SOURCE EXPOSURE

#3
20240369502
2024-11-07

INSPECTION APPARATUS AND INSPECTION METHOD

#4
20240369499
2024-11-07

RAY SCANNING APPARATUS

#5
20240312753
2024-09-19

RADIATION INSPECTION SYSTEM AND METHOD

#6
20240310306
2024-09-19

X-RAY LINE SCAN FOR FOREIGN OBJECT DEBRIS DETECTION

#7
20240302299
2024-09-12

INSPECTION SYSTEM AND METHOD

#8
20240288385
2024-08-29

RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM

#9
20240142393
2024-05-02

METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNTING DETECTORS OF IMAGING DEVICES

#10
20240102949
2024-03-28

System and method for inspecting defects of structure by using X-ray

#11
20240085352
2024-03-14

Thin film damage detection function and charged particle beam device

#12
20240035990
2024-02-01

Polarized, energy dispersive x-ray fluorescence system and method

#13
20240006145
2024-01-04

X-RAY GENERATION DEVICE AND X-RAY IMAGING SYSTEM

#14
20240003833
2024-01-04

METHODS AND APPARATUS FOR RADIOGRAPHIC SOURCE EXPOSURE

#15
20230393085
2023-12-07

METHOD OF EVALUATING PRIMARY OPTICAL SYSTEM OF ELECTRON BEAM OBSERVATION DEVICE, EVALUATION DEVICE USED THEREFOR, AND METHOD OF MANUFACTURING SAME

#16
20230349846
2023-11-02

Inspection apparatus and inspection method

#17
20230349845
2023-11-02

Inspection apparatus and inspection method

#18
20230349844
2023-11-02

Inspection apparatus and inspection method

#19
20230349843
2023-11-02

Inspection apparatus and inspection method

#20
20230349841
2023-11-02

Inspection apparatus and inspection method

#21
20230253178
2023-08-10

Method and apparatus for Schottky TFE inspection

#22
20230213461
2023-07-06

System and method for inspecting defects of structure by using X-ray

#23
20230197397
2023-06-22

X-ray tube cathode focusing element

#24
20230184704
2023-06-15

SCINTILLATOR AND CHARGED PARTICLE RADIATION APPARATUS

#25
20230135352
2023-05-04

SYSTEM AND METHOD FOR ELECTRON CRYOMICROSCOPY

#26
20230080062
2023-03-16

MULTI-ELECTRON BEAM INSPECTION APPARATUS AND ADJUSTMENT METHOD FOR THE SAME

#27
20230076175
2023-03-09

Shielding strategy for mitigation of stray field for permanent magnet array

#28
20230066283
2023-03-02

System and method for inspecting defects of structure by using x-ray

#29
20230046280
2023-02-16

Detection system for X-ray inspection of an object

#30
20220415603
2022-12-29

Electron Source, Electron Beam Device, and Method for Manufacturing Electron Source

#31
20220412901
2022-12-29

Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection

#32
20220367145
2022-11-17

Method and apparatus for Schottky TFE inspection

#33
20220357290
2022-11-10

Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets

#34
20220334072
2022-10-20

Imaging systems and methods of operating the same

#35
20220328899
2022-10-13

Battery Module Comprising Metal Particle-Dispersed Thermal Conductive Resin and Method and System for Inspecting Same

#36
20220128488
2022-04-28

Two-step material decomposition calibration method for a full size photon counting computed tomography system

#37
20220057343
2022-02-24

Energy-dispersive X-ray diffraction analyser comprising a substantially X-ray transparent member having an improved reflection geometry

#38
20210404975
2021-12-30

Two-step material decomposition calibration method for a full size photon counting computed tomography system

#39
20210396688
2021-12-23

Non-destructive inspection system comprising neutron radiation source and neutron radiation method

#40
20210318255
2021-10-14

X-ray instrument with ambient temperature detector

#41
20210212188
2021-07-08

X-ray generation apparatus and X-ray imaging apparatus

#42
20210208087
2021-07-08

Rapid ore analysis to enable bulk sorting using gamma-activation analysis

#43
20210118710
2021-04-22

Wafer inspection apparatus and wafer inspection method

#44
20210109043
2021-04-15

Device, system and method for X-ray diffraction analysis of an electrode of an electrochemical cell, at operating temperature and under current

#45
20210066029
2021-03-04

Charged particle beam device

#46
20210041378
2021-02-11

Systems and Methods for Using Three-Dimensional X-Ray Imaging in Meat Production and Processing Applications

#47
20190346381
2019-11-14

X-RAY SCANNING SYSTEM AND METHOD

#48
20190265174
2019-08-29

Method and system for reconstructing 3-dimensional images from spatially and temporally overlapping x-rays

#49
20190094407
2019-03-28

Scanning imaging system for security inspection of an object and imaging method thereof

#50
20180172606
2018-06-21

Image acquisition device, image acquisition method, and image correction program

#51
20180038807
2018-02-08

METHOD AND SYSTEM FOR RECONSTRUCTING 3-DIMENSIONAL IMAGES FROM SPATIALLY AND TEMPORALLY OVERLAPPING X-RAYS

#52
20170169909
2017-06-15

X-ray generator output regulation

#53
20140185743
2014-07-03

Stationary CT apparatus

#54
18633142
2026-05-12

X-ray scanner with blanking

#55
18406851
2024-12-31

Secondary image removal using high resolution x-ray transmission sources

#56
16901371
2021-11-16

Scatter X-ray imaging with adaptive scanning beam intensity