169969 ⎘
Investigating materials by wave or particle radiation; Sources of radiation source created from radiated target
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE
#2X-RAY IMAGING DEVICE AND METHOD FOR EXTENDING IMAGE PARAMETERS
#3X-RAY IMAGING APPARATUS AND X-RAY TUBE
#4X-RAY MEASURMENT SYSTEM AND COMPOSITE SEMICONDUCTOR INSPECTION SYSTEM
#5WELDING SYSTEM FOR X-RAY MONITORING OF ELECTRON BEAM WELDS
#6Analysis of Low-energy X-ray Fluorescence Emitted from Sample in Atmospheric Environment
#7X-RAY GENERATION APPARATUS AND X-RAY IMAGING APPARATUS
#8X-RAY GENERATION APPARATUS AND X-RAY IMAGING APPARATUS
#9X-RAY GENERATION APPARATUS AND X-RAY IMAGING APPARATUS
#10X-RAY GENERATION APPARATUS AND X-RAY IMAGING APPARATUS
#11X-RAY MEASUREMENT SYSTEM AND X-RAY MEASUREMENT METHOD
#12SECONDARY EMISSION COMPENSATION IN X-RAY SOURCES
#13X-RAY SOURCE AND OPERATING METHOD THEREFOR
#14X-RAY ANALYSIS SYSTEM WITH FOCUSED X-RAY BEAM AND NON-X-RAY MICROSCOPE
#15X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
#16X-Ray Fluorescence Spectrometer and Power Supply Apparatus
#17X-RAY INSPECTION SYSTEM FOR INSPECTION OF AN OBJECT
#18X-RAY INSPECTION APPARATUS
#19X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
#20SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF PARTS
#21X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
#22INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE
#23SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURITY INSPECTION METHOD
#24HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE
#25PATTERNED X-RAY EMITTING TARGET
#26X-RAY IMAGING APPARATUS
#27HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE
#28X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER
#29INSPECTION APPARATUS AND INSPECTION METHOD
#30INSPECTION SYSTEM AND INSPECTION METHOD
#31INSPECTION SYSTEM AND METHOD
#32INSPECTION SYSTEM AND METHOD
#33INSPECTION SYSTEM AND METHOD
#34NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SYSTEM
#35SYSTEM AND METHOD FOR PROVIDING A DIGITALLY SWITCHABLE X-RAY SOURCES
#36NONDESTRUCTIVE INSPECTING DEVICE
#37X-RAY SOURCE FOR X-RAY DIFFRACTION APPARATUS, RELATED APPARATUS AND METHOD
#38Re-entrant cones for moderator chamber of a neutron imaging system
#39High throughput 3D x-ray imaging system using a transmission x-ray source
#40Inspection apparatus and inspection method
#41Inspection apparatus and inspection method
#42Inspection apparatus and inspection method
#43Inspection apparatus and inspection method
#44Inspection apparatus and inspection method
#45Re-entrant cones for moderator chamber of a neutron imaging system
#46X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULATIVE TARGET MATERIAL
#47A Detection System and Method for Investigating a Content of an Item
#48X-RAY IMAGING SYSTEM
#49Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection
#50Patterned x-ray emitting target
#51Apparatus and method for x-ray fluorescence analysis
#52System, method, and apparatus for x-ray backscatter inspection of parts
#53Static CT detection device
#54Method for imaging a sample
#55High-energy x-ray imaging system
#56Non-destructive detection of surface and near surface abnormalities in a metallic product
#57Radiation source for nondestructive inspection, and method and apparatus for manufacturing same
#58High throughput 3D x-ray imaging system using a transmission x-ray source
#59X-ray collimator and related X-ray inspection apparatus
#60Multi-channel static CT device
#61System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
#62Non-destructive inspection system comprising neutron radiation source and neutron radiation method
#63X-ray analysis apparatus and x-ray generation unit
#64System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
#65Shielded X-ray radiation apparatus
#66Semiconductor metrology and inspection based on an x-ray source with an electron emitter array
#67X-ray generation device and X-ray image capture system
#68Electron gun, X-ray generation apparatus, and X-ray imaging apparatus
#69System with a spatially expansive X-ray source for X-ray imaging
#70Talbot-lau x-ray source and interferometric system
#71X-ray inspection device and method for determining degree of consumption of target of X-ray tube in X-ray inspection device
#72Portable neutron imaging based non-destructive evaluation
#73Devices having an electron emitting structure
#74X-ray fluorescence spectrometer
#75Talbot X-ray microscope
#76High aspect ratio X-ray targets and uses of same
#77Energy radiation generator with bi-polar voltage ladder
#78High aspect ratio x-ray targets and uses of same
#79Devices having an electron emitting structure
#80Energy radiation generator with uni-polar voltage ladder
#81Energy radiation generator with bi-polar voltage ladder
#82Stereo X-ray generating device
#83Debris protection system for reflective optic utilizing gas flow
#84Multi-radiation unit and radiation imaging system including the unit
#85X-ray irradiation device and analysis device
#86Ultrafast electron diffraction device
#87Prompt gamma-ray detection apparatus for analyzing chemical materials using femtosecond pulse laser-induced neutrons
#88Apparatus and method for pulsed neutron generation including a high voltage power supply
#89Apparatus and method for pulsed neutron generation including a high voltage power supply
#90Device and method for performing X-ray analysis
#91Methods, systems, and computer program products for multiplexing computed tomography
#92Method and system for detecting nitrogenous materials via gamma-resonance absorption (GRA)
#93Device and method for performing X-ray analysis
#94X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof
#95X-ray imaging systems and methods using temporal digital signal processing for reducing noise and for obtaining multiple images simultaneously
#96X-ray CT apparatus
#97Multiple-position x-ray tube for diffractometer
#98X-ray dark-field in-line inspection for semiconductor samples