170061 ⎘
Investigating materials by wave or particle radiation; Specific applications or type of materials monocrystal
CRYSTAL EVALUATION METHOD, CRYSTAL EVALUATION DEVICE, SiC SUBSTRATE, SiC DEVICE, AND SiC EPITAXIAL WAFER
#2METHOD, X-RAY DIFFRACTION SYSTEM, AND PROGRAM FOR CALCULATING MISCUT ANGLE OF SINGLE-CRYSTAL SOLID SAMPLE
#3METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETECTOR ARRAY
#4SOLVATED CRYSTALLINE POLYNUCLEAR METAL COMPLEX SOLVATED WITH A MIXTURE OF NON-POLAR AND POLAR SOLVENTS, SUCH SOLVATED CRYSTALLINE POLYNUCLEAR METAL COMPLEX INCLUDING A GUEST COMPOUND ANALYTE AND ITS USE IN A METHOD FOR DETERMINING MOLECULAR STRUCTURE OF THE GUEST COMPOUND ANALYTE
#5Method and system for sorting of diamonds
#6Single piece droplet generation and injection device for serial crystallography
#7SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE, AND SAMPLE HOLDER HANDLING SYSTEM
#8Method of determining the three-dimensional structure of molecules in crystalline inclusion complexes
#9Method and system to determine crystal structure
#10Single-crystal X-ray structure analysis system
#11Method for non-destructive testing of a turbomachine part
#12Single piece droplet generation and injection device for serial crystallography
#13Method of detecting an anomaly in a single crystal structure
#14Methods and compositions for micro-electron diffraction
#15Crystal structure analysis system and crystal structure analysis method
#16Cryogenic cooling positioning apparatus, methods and applications
#17Intelligent machines and process for production of monocrystalline products with goniometer continual feedback
#18Intelligent machines and process for production of monocrystalline products with goniometer continual feedback