170057 ⎘
Investigating materials by wave or particle radiation Specific applications or type of materials
Sub-classes:X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
#2METHOD OF MANUFACTURING A COMPONENT TO REDUCE RISK OF COLD DWELL FATIGUE FAILURE
#3METHOD FOR DISLOCATION ANALYSIS
#4METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALLOYS BASED THEREON
#5DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLINITY MEASUREMENT METHOD, AND INFORMATION STORAGE MEDIUM
#6Method for identifying foil position in power storage device and method for calculating inter-foil distance in power storage device
#7METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS
#8DYNAMIC STATE OBSERVATION SYSTEM
#9Sulfate corrosion-resistant concrete and method thereof for optimizing proportion and application
#10Small angle x-ray scattering methods for characterizing the iron core of iron carbohydrate colloid drug products
#11Mineralogical Analysis System of Copper Concentrate
#12INTELLIGENT SYSTEM FOR CONTROLLING OPERATIONAL PARAMETERS OF A SMELTING FURNACE
#13Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium
#14Quantitative analysis method of carbon based hybrid negative electrode
#15METHOD OF ANALYZING STRUCTURE OF RESIN MATERIAL
#16Methods and apparatus for measuring fastener concentricity
#17A SYSTEM AND METHOD FOR DIFFRACTION-BASED STRUCTURE DETERMINATION WITH SIMULTANEOUS PROCESSING MODULES
#18Mesh holder for serial crystallography
#19Method and system for high speed detection of diamonds
#20Crosslinked fluoropolymer resin and control method for same
#21Non-destructive inspection method
#22Device, system and method for X-ray diffraction analysis of an electrode of an electrochemical cell, at operating temperature and under current
#23Nondestructive inspection method and apparatus comprising a neutron source and a gamma-ray detection device for determining a depth of a target component in an inspection target
#24X-ray fluorescence analysis method, X-ray fluorescence analysis program, and X-ray fluorescence spectrometer
#25Single-shot method for edge illumination X-ray phase-contrast tomography
#26Analysis apparatus interlocking in-situ x-ray diffraction and potentiostat and analyzing methods using the same
#27Method and apparatus for discriminating resin
#28System and method for authenticating an additively manufactured component
#29X-ray inspection method and X-ray inspection device
#30Deterioration analysis method
#31Deterioration analysis method
#32SURFACE TEMPERATURE CALCULATION METHOD AND CONTROL METHOD FOR POLYCRYSTALLINE SILICON ROD, METHOD FOR PRODUCTION OF POLYCRYSTALLINE SILICON ROD, POLYCRYSTALLINE SILICON ROD, AND POLYCRYSTALLINE SILICON INGOT
#33Method of preparing sample for crystal structure analysis, method of determining absolute configuration of chiral compound, and polynuclear metal complex monocrystal
#34Detection method and device for low carrier mobility of insulating material
#35Trace detection method of heavy metals and application thereof