ClassID:

170063

G01N2223/606 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Specific applications or type of materials texture

Recent Application in this class:
#1
20260043784
2026-02-12

PETROPHYSICAL MODEL GENERATION AND USES THEREOF

#2
20260002896
2026-01-01

SYSTEMS AND METHODS FOR FRAME CONTROL IN TEXTURE ANALYSIS

#3
20240219328
2024-07-04

Laboratory crystallographic x-ray diffraction analysis system

#4
20230194445
2023-06-22

System and method for in-situ X-ray diffraction-based real-time monitoring of microstructure properties of printing objects

#5
20220412901
2022-12-29

Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection

#6
20220357290
2022-11-10

Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets

#7
20220163466
2022-05-26

X-ray beam shaping apparatus and method

#8
20200158667
2020-05-21

X-ray diffraction and X-ray spectroscopy method and related apparatus

#9
20190353602
2019-11-21

Macrotexture map visualizing texture heterogeneity in polycrystalline parts

#10
20190292624
2019-09-26

Device and method for determining the microstructure of a metal product, and metallurgical installation

#11
20190170667
2019-06-06

Apparatus and method for calculating a recording trajectory

#12
20190086343
2019-03-21

Systems and methods for materials analysis

#13
20190079032
2019-03-14

X-ray multigrain crystallography

#14
20180080884
2018-03-22

Macrotexture map visualizing texture heterogeneity in polycrystalline parts

#15
20170343492
2017-11-30

Crystalline phase identification method, crystalline phase identification device, and X-ray diffraction measurement system

#16
20170212053
2017-07-27

Characterization of trace crystallinity by second harmonic generation microscopy

#17
20170038317
2017-02-09

X-ray multigrain crystallography

#18
20170011518
2017-01-12

Method for mapping crystal orientations in a sample made of a polycrystalline material

#19
20160209340
2016-07-21

Systems and methods for materials analysis

#20
20150316493
2015-11-05

Laboratory X-ray micro-tomography system with crystallographic grain orientation mapping capabilities

#21
20150185167
2015-07-02

Method for evaluating degree of crystalline orientation of polycrystalline silicon, method for selecting polycrystalline silicon rod, polycrystalline silicon rod, polycrystalline silicon ingot, and method for manufacturing monocrystalline silicon

#22
20140307854
2014-10-16

X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus

#23
20140254763
2014-09-11

X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus

#24
20140112433
2014-04-24

Laboratory x-ray micro-tomography system with crystallographic grain orientation mapping capabilities

#25
20130253691
2013-09-26

Methods for determining a recovery state of a metal alloy

#26
20120089349
2012-04-12

Method for Measuring the Orientation and the Elastic Strain of Grains in Polycrystalline Materials