170064 ā
Investigating materials by wave or particle radiation; Specific applications or type of materials strain
X-RAY DIFFRACTION INSPECTION SYSTEM AND METHOD FOR OPERATING SAME
#2Component residual stress testing platform based on neutron diffraction and experimental method thereof
#3MEASUREMENT SYSTEM AND MEASUREMENT METHOD
#4Method for measuring residual stress
#5METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF RESIDUAL STRESS AND REFERENCE PIECE FOR X-RAY MEASUREMENT OF RESIDUAL STRESS
#6Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection
#7Method for determining structure of substance in multicomponent sample
#8Method for improving an EBSD/TKD map
#9Method and system for evaluating rotor-mast fatigue damage
#10X-ray beam shaping apparatus and method
#11Apparatus for inspecting semiconductor device and method for inspecting semiconductor device
#12Ball-mapping system comprising a sample stage and a sample holder for receiving ball-shaped sample, and method of operating ball-mapping system for collecting x-ray diffraction data at measurement points located on ball-shaped sample
#13Thin film analyzing device and thin film analyzing method
#14System and method for computed laminography x-ray fluorescence imaging
#15FATIGUE LEVEL ESTIMATION METHOD AND CREATING METHOD FOR DATABASE FOR FATIGUE LEVEL ESTIMATION
#16METHOD FOR MEASURING RESIDUAL STRESS
#17Method for measuring stress
#18Situ monitoring of stress for additively manufactured components
#19Method for measuring stress
#20Measuring and analyzing residual stresses and their gradients in materials using high resolution grazing incidence X-ray diffraction
#21Measuring and analyzing residual stresses and their gradients in materials using high resolution grazing incidence X-ray diffraction
#22Measuring and analyzing residual stresses and their gradients in materials using high resolution grazing incidence X-ray diffraction
#23System and method for performing nano beam diffraction analysis
#24X-ray diffraction device and method to measure stress with 2D detector and single sample tilt
#25X-ray based fatigue inspection of downhole component
#26Method and apparatus for determining lattice parameters of a strained III-V semiconductor layer
#27ā4Dā dynamic tomography system
#28X-ray stress analysis apparatus, method, and program
#29Method of measuring depth of damage of wafer
#30Method and system for determining strain distribution in a sample
#31Strain mapping in TEM using precession electron diffraction
#32X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
#33X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
#34High-temperature strain cell for tomographic imaging
#35Nondestructive examination of structures having embedded particles
#36Evaluation System and Evaluation Method of Plastic Strain
#37METHOD FOR ANALYZING RUBBER COMPOUND WITH FILLER PARTICLES
#38X-ray stress measurement apparatus
#39Measurement of CMOS device channel strain by X-ray diffraction
#40Method for measuring an amount of strain of a bonded strained wafer
#41Method of producing an un-distorted dark field strain map at high spatial resolution through dark field electron holography