Patents-Review.com
ClassID:

170068 ⎘

G01N2223/6113 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Specific applications or type of materials patterned objects; electronic devices printed circuit board [PCB]

Recent Application in this class:
#1
20260002890
2026-01-01

SOLDER MATERIAL WITH CONTRAST AGENT

 #2
20250244266
2025-07-31

MEASURING METHOD AND MEASURING DEVICE

 #3
20250111497
2025-04-03

Component authentication using x-ray detectable unique features

 #4
20230366836
2023-11-16

X-RAY RADIOSCOPE

 #5
20230039471
2023-02-09

Anti-vibration fixturing system for nondestructive testing

 #6
20220291147
2022-09-15

Inspection position identification method, three-dimensional image generation method, and inspection device

 #7
20210404977
2021-12-30

Sample holder, system and method

 #8
20210116399
2021-04-22

Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors and an X-ray irradiation unit including a multi-wavelength mirror

 #9
20210080411
2021-03-18

METHOD OF GENERATING LOCAL ELECTRIC FIELDS

 #10
20210055235
2021-02-25

Method to Automatically Inspect Parts Using X-Rays

 #11
20200264113
2020-08-20

Inspection position identification method, three-dimensional image generation method, and inspection device

 #12
20200041426
2020-02-06

Determining tilt angle in patterned arrays of high aspect-ratio structures by small-angle x-ray scattering

 #13
20190219525
2019-07-18

Method and system to automatically inspect parts using x-rays

 #14
20190206652
2019-07-04

Nanoscale X-ray tomosynthesis for rapid analysis of integrated circuit (IC) dies

 #15
20190137422
2019-05-09

X-ray fluorescence spectrometer

 #16
20180252656
2018-09-06

X-ray inspection apparatus

 #17
20180247400
2018-08-30

Pattern-measuring apparatus and semiconductor-measuring system

 #18
20180136145
2018-05-17

Method for checking an electronic component

 #19
20170122886
2017-05-04

Radiation image acquisition system

 #20
20170122883
2017-05-04

X-ray inspection apparatus for inspecting semiconductor wafers

 #21
20170043970
2017-02-16

Fixture to support reel-to-reel inspection of semiconductor devices or other components

 #22
20170025317
2017-01-26

X-ray inspection apparatus

 #23
20170011973
2017-01-12

X-ray inspection apparatus for inspecting semiconductor wafers

 #24
20160267646
2016-09-15

Void evaluation apparatus and void evaluation method in the solder

 #25
20160189368
2016-06-30

Pattern shape evaluation device and method

 #26
20160161428
2016-06-09

X-ray fluorescence analyzer

 #27
20160005157
2016-01-07

Pattern-measuring apparatus and semiconductor-measuring system

 #28
20150247812
2015-09-03

Method for the measurement of a measurement object by means of X-ray fluorescence

 #29
20150243012
2015-08-27

X-ray inspection method and device

 #30
20150212217
2015-07-30

Masks that selectively attentuate radiation for inspection of printed circuit boards

 #31
20150204801
2015-07-23

Complex inspection device for printed-substrate

 #32
20150185165
2015-07-02

Radiation image acquisition system

 #33
20150136976
2015-05-21

Overlay error measuring device and computer program

 #34
20140334605
2014-11-13

X-ray inspection device

 #35
20140264015
2014-09-18

Dynamic peak tracking in X-ray photoelectron spectroscopy measurement tool

 #36
20140205058
2014-07-24

Radiographic apparatus and an image processing method therefore

 #37
20140161224
2014-06-12

Method and a system for recognizing voids in a bump

 #38
20130272497
2013-10-17

X-ray detection apparatus for X-ray fluorescence analysis

 #39
20130068948
2013-03-21

Method of planar imaging on semiconductor chips using focused ion beam

 #40
20110255660
2011-10-20

X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS

 #41
20110249795
2011-10-13

X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS

 #42
20110222655
2011-09-15

X-RAY INSPECTION APPARATUS, X-RAY INSPECTION METHOD, X-RAY INSPECTION PROGRAM, AND X-RAY INSPECTION SYSTEM

 #43
20100329532
2010-12-30

X-ray inspecting apparatus and X-ray inspecting method

 #44
20050074088
2005-04-07

X-ray inspection apparatus and X-ray inspection method