170106 ⎘
Investigating materials by wave or particle radiation; Specific applications or type of materials quality control
X-RAY SYSTEM AND CT SYSTEM
#2DETECTION APPARATUS AND BATTERY PRODUCTION DEVICE
#3METHOD OF CALCULATING INDICATOR OF THIN WIRE, METHOD OF EVALUATING QUALITY OF OPTICAL CABLE, AND OPTICAL CABLE
#4CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE MEASUREMENTS
#5ELECTRIC WIRE FIXING JIG, CRIMPING DETERMINATION DEVICE, AND CRIMPING DETERMINATION METHOD
#6METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER
#7METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER
#8SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF PARTS
#9HARDWARE FOR AUTOMATION OF COMPUTER TOMOGRAPHY SAMPLE CHANGING
#10Characterizing and measuring in small boxes using XPS with multiple measurements
#11CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
#12Characterizing and measuring in small boxes using XPS with multiple measurements
#13Portable XRF data screening method for heavy metal contaminated soil
#14System and method for in-situ X-ray diffraction-based real-time monitoring of microstructure properties of printing objects
#15Method and system for inspecting a structure across a cover layer covering the structure
#16Method to use artificial intelligence to enhance visual inspection of oxygen sensors
#17System, method, and apparatus for x-ray backscatter inspection of parts
#18X-ray automated calibration and monitoring
#19Apparatus to operate a quality control in industrial production lines, corresponding method and computer program product
#20Line for inspecting empty glass containers
#21X-ray collimator and related X-ray inspection apparatus
#22In-Situ 3D printing and Non-Destructive Testing with Computer Tomography Using X-ray Flexible Detector
#23System and method using x-rays for depth-resolving metrology and analysis
#24Item inspection by dynamic selection of projection angle
#25X-ray and metal detectable thermoset composites for use in food and pharmaceutical manufacturing
#26Quality inspection method
#27Methods and systems for semiconductor metrology based on wavelength resolved soft X-ray reflectometry
#28Inline x-ray measurement apparatus and method
#29Apparatus and method for inspecting battery cells for automation of total inspection
#30Method acquiring projection image, control apparatus, control program, processing apparatus, and processing program
#31Inspection device, inspection method, and method for producing object to be inspected
#32Super-resolution x-ray imaging method and apparatus
#33FOOD PRODUCT PROCESSING DEVICE, FOOD PRODUCT PROCESSING DEVICE MANAGEMENT SYSTEM, AND FOOD PRODUCT PROCESSING DEVICE MANAGEMENT METHOD
#34X-ray filter
#35Dual scan method for detecting a fibre misalignment in an elongated structure
#36Method for producing a layer structure for thin-film solar cells using etching or laser ablation to produce rear-electrode-layer-free region
#37X-ray inspection device
#38Methods and systems for real time measurement control
#39X-ray and metal detectable thermoset composites for use in food and pharmaceutical manufacturing
#40Method for monitoring the functional state of a system for computer-tomographic examination of workpieces
#41Nanoscale X-ray tomosynthesis for rapid analysis of integrated circuit (IC) dies
#42Tracking system and method for tracking wood products in a production line
#43Methods for detecting a fibre misalignment in an elongated structure, related apparatuses
#44Method and apparatus for non-destructive inspection of a log to identify inner zones that are free of bluestain
#45Method for characterising a part
#46Inline x-ray measurement apparatus and method
#47X-ray inspection device
#48X-ray inspection apparatus and control method
#49IDENTIFYING A CHARACTERISTIC OF A MATERIAL FOR ADDITIVE MANUFACTURING
#50Phantom intended for use in quality control of tomographic images
#51Apparatuses and methods for high-precision measurement
#52Nano deposition and ablation for the repair and fabrication of integrated circuits
#53X-ray product quality automatic inspection device
#54System and method for measuring an object using X-ray projections
#55System and method for the automated testing and/or measuring of a plurality of substantially identical components by X-radiation
#56Scatterometry-based imaging and critical dimension metrology
#57Nano deposition and ablation for the repair and fabrication of integrated circuits
#58X-ray device, method, manufacturing method for structure, program, and recording medium on which program is recorded
#59SYSTEM AND METHOD FOR DETERMINING LINE EDGE ROUGHNESS
#60Solid material characterization with X-ray spectra in both transmission and fluoresence modes
#61Apparatus for materials testing of test objects using X-rays
#62Method and apparatus for providing image data
#63Inspection apparatus
#64X-ray inspection device and production system
#65Orifice formation control system
#66INSPECTING METHOD AND INSPECTING SYSTEM OF ASSEMBLY
#67Method of representing the internal conditions in computed tomography